US4490193A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for making diffusions into a substrate and electrical connections thereto using rare earth boride materials
Assignee: International Business Machines Corp
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Filing: 1983-09-29
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Granted: 1984-12-25
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Expires: 2003-09-29
Abstract
Abstract A method for diffusing a conductively determining impurity in a semiconductor substrate and making electrical contact thereto by depositing a layer of a rare earth boride material over a predetermined surface portion of the substrate and heating the substrate for a predetermined period of time at a predetermined temperature which is sufficient to cause boron from the boride material to diffuse into the adjoining portion of the substrate to modify its conductive characteristics. At the same time a good electrical ohmic contact is established between the boride material and the adjoining substrate portion while the boride material retains its conductivity even after the outdiffusion of some of its boron into the substrate during the heat treatment.
Inventors
- 👤 Mousa H. Ishaq
- 👤 Stanley Roberts
- 👤 James G. Ryan
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 14:37
CPC Classifications
H; H10; H10P; H10P32/00; H10P32/10; H10P32/17; H10P32/171; H10D; H10D64/00; H10D64/01; H10D64/011; H10D64/0111; H10P32/14; H10P32/1408
Claims Analysis
Total Claims: 21
Claim 1
Independent Claim
87 words
A method for diffusing a conductivity determining impurity into a semiconductor substrate and making electrical contact thereto comprising: depositing a conductive layer of a rare earth boride material over a predetermined surface portion of said substrate; heating said substrate for a predetermined period of time at a predetermined temperature sufficient to cause boron from said boride material to diffuse into said portion of said substrate so as to modify its conduction characteristics and to establish an electrical ohmic contact between said substrate portion and said conductive layer.
Claim 2
Independent Claim
87 words
A method for diffusing a conductivity determining impurity into a semiconductor substrate and making electrical contact thereto comprising: depositing a conductive layer of a rare earth boride material over a predetermined surface portion of said substrate; heating said substrate for a predetermined period of time at a predetermined temperature sufficient to cause boron from said boride material to diffuse into said portion of said substrate so as to modify its conduction characteristics and to establish an electrical ohmic contact between said substrate portion and said conductive layer.
Claim 3
Dependent Claim
24 words
A method as set forth in claim 1, wherein said rare earth boride material is deposited over said substrate portion in a predetermined pattern.
Claim 4
Dependent Claim
52 words
A method as set forth in claim 2 wherein said predetermined pattern is established by forming a layer of an electrically insulating material on a surface of said substrate and then etching away portions of said insulating material to expose portions of said substrate wherein said exposed portions comprise said predetermined pattern.
Claim 5
Dependent Claim
35 words
A method as set forth in claim 1 wherein said rare earth boride is a material selected from the group consisting of: YB 4 , YB 6 , LaB 4 , and LaB 6 .
Claim 6
Dependent Claim
20 words
A method as set forth in claim 1 wherein said rare earth boride material is a rare earth hexaboride material.
Claim 7
Dependent Claim
28 words
A method as set forth in claim 5 wherein said rare earth hexaboride is a hexaboride selected from the group consisting of YB 6 and LaB 6 .
Claim 8
Dependent Claim
20 words
A method as set forth in claim 1 which further includes depositing a oxidation protection layer over said conductive layer.
Claim 9
Independent Claim
77 words
A method for making semiconductor devices wherein a conductive layer makes electrical contact with a predetermined region formed in a semiconductor substrate, characterized in that said conductive layer is made of a rare earth boride material and in that boron from said conductive layer outdiffuses during a heating cycle into said predetermined region so as to modify the conduction characteristics of said region and to establish an ohmic contact between said conductive layer and said substrate region.
Claim 10
Independent Claim
77 words
A method for making semiconductor devices wherein a conductive layer makes electrical contact with a predetermined region formed in a semiconductor substrate, characterized in that said conductive layer is made of a rare earth boride material and in that boron from said conductive layer outdiffuses during a heating cycle into said predetermined region so as to modify the conduction characteristics of said region and to establish an ohmic contact between said conductive layer and said substrate region.
Claim 11
Dependent Claim
20 words
A method as set forth in claim 8 wherein said rare earth boride material is a rare earth hexaboride material.
Claim 12
Dependent Claim
31 words
A method as set forth in claim 8 wherein said rare earth boride is a rare earth hexaboride material selected from the group consisting of LaB 6 and YB 6 .
Claim 13
Dependent Claim
27 words
A method as set forth in claim 8 which is further characterized by depositing a layer of silicon over said conductive layer prior to said heating cycle.
Claim 14
Dependent Claim
34 words
A method as set forth in claim 11 which is further characterized by oxidizing said silicon layer during said heating cycle to convert it at least in part into a layer of silicon dioxide.
Claim 15
Independent Claim
102 words
A method for forming a conductive structure on a semiconductor substrate making electrical contact with surface-adjacent regions of said substrate, characterized in that said conductive structure comprises a layer of a rare earth hexaboride material disposed over and in direct contact with said surface-adjacent regions and in that boron from said rare earth hexaboride material outdiffuses during a heating cycle of predetermined time and temperature, from said conductive structure into said substrate regions to thereby modify the conductive characteristics of said substrate regions through the addition of boron and to establish ohmic electrical contacts between said conductive structure and said substrate regions.
Claim 16
Independent Claim
102 words
A method for forming a conductive structure on a semiconductor substrate making electrical contact with surface-adjacent regions of said substrate, characterized in that said conductive structure comprises a layer of a rare earth hexaboride material disposed over and in direct contact with said surface-adjacent regions and in that boron from said rare earth hexaboride material outdiffuses during a heating cycle of predetermined time and temperature, from said conductive structure into said substrate regions to thereby modify the conductive characteristics of said substrate regions through the addition of boron and to establish ohmic electrical contacts between said conductive structure and said substrate regions.
Claim 17
Independent Claim
37 words
A method for making a semiconductor device wherein a conductive layer is patterned to make electrical contact with predetermined regions of said device characterized in that said conductive layer is made of a rare earth boride material.
Claim 18
Independent Claim
37 words
A method for making a semiconductor device wherein a conductive layer is patterned to make electrical contact with predetermined regions of said device characterized in that said conductive layer is made of a rare earth boride material.
Claim 19
Dependent Claim
22 words
A method as set forth in claim 14 which is further characterized by forming an oxidation protection layer over said conductive layer.
Claim 20
Dependent Claim
17 words
A method as set forth in claim 15 wherein said oxidation protection layer is made of silicon.
Claim 21
Dependent Claim
24 words
A method as set forth in claim 15 wherein said oxidation protection layer comprises of a layer of silicon covered by a phospho-silicate glass.
References Cited (Backward Citations)
US3340108A
Cited
US3601888A
Cited
US3887993A
Cited
US4180596A
Cited
US4329706A
Cited
US4364166A
Cited
US4227944A
Cited
JPS5633336A
Cited
US4389255A
Cited
US4285761A
Cited
US4378628A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1987-12-25 | 1988-06-25 | 1988-12-25 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1991-12-25 | 1992-06-25 | 1992-12-25 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1995-12-25 | 1996-06-25 | 1996-12-25 | $7700.00 | Window Closed / Lapsed |