US4481705A
Expired / Lapsed
US
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Process for doping field isolation regions in CMOS integrated circuits
Assignee: Advanced Micro Devices Inc
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Filing: 1983-06-14
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Granted: 1984-11-13
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Expires: 2003-06-14
Abstract
Abstract A process for fabricating doped regions in a semiconductor substrate 10 beneath regions of oxidized silicon 21 includes the steps of fabricating a first mask 23 over the substrate 10 except where field regions 21 are desired, introducing p type impurity 30 in to the unmasked regions, oxidizing the silicon substrate 10 except where overlayed by the first mask 23 to form field regions 21, fabricating a second mask 28/23 over the semiconductor substrate 10 except for second field regions, introducing n conductivity type impurity 32 into the second field regions, and oxidizing the substrate to form second field regions 21.
Inventors
- 👤 Jacob D. Haskell
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 08:33
CPC Classifications
H; H10; H10D; H10D62/00; H10D62/10; H10D62/102; H10D62/112; H10D84/00; H10D84/01; H10D84/0123; H10D84/0126; H10D84/0165; H10D84/0188; H10D84/02; H10D84/03; H10D84/038; H10W; H10W10/00; H10W10/01; H10W10/011; H10W10/012; H10W10/0125; H10W10/0126; H10W10/0127; H10W10/10; H10W10/13
Claims Analysis
Total Claims: 18
Claim 1
Independent Claim
185 words
In a process for fabricating complementary transistors in a semiconductor substrate having a first conductivity type well region in an opposite conductivity type substrate, the improvement comprising introducing a field implant by a process comprising: fabricating a first mask over a semiconductor substrate except for a first field region straddling the junction of the first conductivity type well-region and the substrate; introducing first conductivity type impurity into the first field region; forming insulating material over the first field region; fabricating a second mask over the semiconductor substrate except for a second field region, said second mask at least partially including a portion of said insulating material formed over said first field region, so as to dispose said first field region and said second field region such that said second field region is self-aligned with, and does not overlap, said first field region and such that an edge of said first field region is adjacent to, and in contact with, an edge of said second field region; introducing opposite conductivity type impurity into the second field region; and forming insulating material over the second field region.
Claim 2
Dependent Claim
185 words
In a process for fabricating complementary transistors in a semiconductor substrate having a first conductivity type well region in an opposite conductivity type substrate, the improvement comprising introducing a field implant by a process comprising: fabricating a first mask over a semiconductor substrate except for a first field region straddling the junction of the first conductivity type well-region and the substrate; introducing first conductivity type impurity into the first field region; forming insulating material over the first field region; fabricating a second mask over the semiconductor substrate except for a second field region, said second mask at least partially including a portion of said insulating material formed over said first field region, so as to dispose said first field region and said second field region such that said second field region is self-aligned with, and does not overlap, said first field region and such that an edge of said first field region is adjacent to, and in contact with, an edge of said second field region; introducing opposite conductivity type impurity into the second field region; and forming insulating material over the second field region.
Claim 3
Dependent Claim
23 words
A process as in claim 1 wherein the step of forming insulating material over the first field region comprises oxidizing the semiconductor substrate.
Claim 4
Dependent Claim
23 words
A process as in claim 2 wherein the step of forming insulating material over the second field region comprises oxidizing the semiconductor substrate.
Claim 5
Dependent Claim
25 words
A process as in claim 1 wherein the step of fabricating a first mask comprises patterning a layer of oxidation resistant material over the substrate.
Claim 6
Dependent Claim
22 words
A process as in claim 4 wherein the step of introducing first conductivity type impurity comprises implanting those impurities using ion implantation.
Claim 7
Dependent Claim
25 words
A process as in claim 5 wherein the step of fabricating a second mask comprises patterning a layer of oxidation resistant material over the substrate.
Claim 8
Dependent Claim
22 words
A process as in claim 6 wherein the step of introducing opposite conductivity type impurity comprises implanting those impurities using ion implantation.
Claim 9
Dependent Claim
20 words
A process as in claim 7 wherein each of the steps of forming insulating material comprise oxidizing the semiconductor substrate.
Claim 10
Dependent Claim
25 words
A process as in claim 1 wherein the first conductivity type well region comprises a p conductivity type well in an n conductivity type substrate.
Claim 11
Dependent Claim
50 words
A process as in claim 9 wherein the step of fabricating a first mask comprises forming a layer of silicon nitride over a central region of the p conductivity type well, which central region is not adjacent to, or in contact with any portion of the n conductivity type substrate.
Claim 12
Dependent Claim
34 words
A process as in claim 10 further comprising fabricating portions of the first mask over regions of the n conductivity type substrate not adjacent to, or in contact with the p conductivity type well.
Claim 13
Dependent Claim
21 words
A process as in claim 11 wherein the step of introducing first conductivity type impurity comprises introducing p conductivity type impurity.
Claim 14
Dependent Claim
32 words
A process as in claim 12 wherein the step of forming insulating material over the first field region comprises oxidizing the p well and the substrate not overlayed by the silicon nitride.
Claim 15
Dependent Claim
85 words
A process as in claim 13 wherein the step of fabricating a second mask comprises etching the layer of silicon nitride to expose areas of said oxide region over said second field region so as to allow said introducing of said opposite conductivity type impurity into the second field region, while protecting the central region of the p conductivity type well and protecting said regions of the n conductivity type substrate which are not adjacent to, or in contact with the p conductivity type well.
Claim 16
Dependent Claim
21 words
A process as in claim 14 wherein the step of introducing opposite conductivity type impurity comprises introducing n conductivity type impurity.
Claim 17
Dependent Claim
24 words
A process as in claim 15 wherein the step of forming insulating material over the second field region comprises oxidizing the second field region.
Claim 18
Dependent Claim
20 words
A process as in claim 16 wherein the p conductivity type comprises boron and the n conductivity type comprises arsenic.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 1987-11-13 | 1988-05-14 | 1988-11-13 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1991-11-13 | 1992-05-14 | 1992-11-13 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1995-11-13 | 1996-05-14 | 1996-11-13 | $7700.00 | Window Closed / Lapsed |