Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
226 words
Apparatus for thermal processing of a semiconductor wafer comprising: a processing chamber; means for controlling the pressure in said processing chamber; wafer handling means for introducing and removing said semiconductor wafer from said processing chamber; and a heater assembly positioned in said processing chamber and adapted for rotation between a wafer-receiving position in which said wafer is received from said wafer handling means and a wafer-ejecting position in which said wafer is ejected to said wafer handling means, said heater assembly comprising: a housing including a slot for slidably receiving and ejecting said wafer and heat sink means for removal of thermal energy, a blackbody source having a constant planar energy flux characteristic; wafer support means in alignment with said slot for slidably receiving said wafer from said wafer handling means and including means for guiding said wafer to a processing position adjacent to but spaced apart from said source in substantially parallel planar alignment therewith, and radiation shield means positioned within said housing on opposite sides of a heater subassembly including said source and said wafer support means, said housing substantially enclosing and supporting said source, said wafer support means and said radiation shields means in fixed relative positions whereby said heater assembly prevents substantial radiation of thermal energy into said processing chamber and provides a mechanically stable relationship between said source and said wafer.
Claim 2
Dependent Claim
226 words
Apparatus for thermal processing of a semiconductor wafer comprising: a processing chamber; means for controlling the pressure in said processing chamber; wafer handling means for introducing and removing said semiconductor wafer from said processing chamber; and a heater assembly positioned in said processing chamber and adapted for rotation between a wafer-receiving position in which said wafer is received from said wafer handling means and a wafer-ejecting position in which said wafer is ejected to said wafer handling means, said heater assembly comprising: a housing including a slot for slidably receiving and ejecting said wafer and heat sink means for removal of thermal energy, a blackbody source having a constant planar energy flux characteristic; wafer support means in alignment with said slot for slidably receiving said wafer from said wafer handling means and including means for guiding said wafer to a processing position adjacent to but spaced apart from said source in substantially parallel planar alignment therewith, and radiation shield means positioned within said housing on opposite sides of a heater subassembly including said source and said wafer support means, said housing substantially enclosing and supporting said source, said wafer support means and said radiation shields means in fixed relative positions whereby said heater assembly prevents substantial radiation of thermal energy into said processing chamber and provides a mechanically stable relationship between said source and said wafer.
Claim 3
Dependent Claim
56 words
The apparatus as defined in claim 1 wherein said wafer support means includes lip portions for support of said wafer near its outer periphery and a stop against which the edge of said wafer rests in said wafer-processing position whereby said wafer is positioned in alignment with said blackbody source with a central area exposed thereto.
Claim 4
Dependent Claim
33 words
The apparatus as defined in claim 2 wherein said radiation shield means includes at least one thin metallic layer spaced apart from adjacent elements in substantially planar parallel alignment with said blackbody source.
Claim 5
Dependent Claim
34 words
The apparatus as defined in claim 3 wherein said blackbody source includes a planar layer of graphite cut into a serpentine pattern of connecting strips so as to provide a planar energy flux characteristic.
Claim 6
Dependent Claim
37 words
The apparatus as defined in claim 2 wherein said heat sink means includes a thermally conductive member in substantially planar parallel alignment with said blackbody source, said member having coolant tubes attached thereto for removal of heat.
Claim 7
Dependent Claim
44 words
The apparatus as defined in claim 5 wherein the pressure in said processing chamber is maintained during thermal processing by said control means such that the mean free path of gas molecules is much greater than the spacing between said source and said wafer.