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US4430185A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of producing photoelectric transducers

Assignee: Hitachi Ltd
•
Filing: 1981-03-20
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Granted: 1984-02-07
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Expires: 2001-03-20
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Abstract

Abstract In the method of producing photoelectric transducers having processes for forming a photoconductive layer on a predetermined substrate with an irregular surface by a method of depositing the photoconductive layer in the atmosphere including at least plasma, the predetermined substrate with irregular surface is disposed above a first electrode to which an electrode is opposed, and said photoconductive layer is formed while a negative potential is being applied to the first electrode. This enables the photoconductive layer to be formed without breaks at steps, pinholes and so on due to the irregular surface, and therefore, it is possible to provide good photoelectric transducers with small dark current.

Inventors

  • 👤 Yasuharu Shimomoto
  • 👤 Toshihisa Tsukada
  • 👤 Akira Sasano
  • 👤 Yasuo Tanaka
  • 👤 Hideaki Yamamoto
  • 👤 Yukio Takasaki

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-26 22:33
CPC Classifications
C; C23; C23C; C23C14/00; C23C14/0021; C23C14/0036; C23C16/00; C23C16/44; C23C16/50; C23C16/505; C23C16/509; C23C16/5096; H; H10; H10F; H10F39/00; H10F39/10; H10F39/12; H10F39/191; H10F71/00; H10F71/10; H10F71/103; Y; Y02; Y02E; Y02E10/00; Y02E10/50; Y02P; Y02P70/00; Y02P70/50

Claims Analysis

Total Claims: 23
Claim 1
Independent Claim 223 words
A method of producing a photoelectric transducer including depositing a photoconductive layer of amorphous hydrogenated silicon on a predetermined substrate having an irregular surface including non-flat portions, said predetermined substrate being a semiconductor substrate comprising at least an impurity-doped region, an electrode contacting at least part of said impurity-doped region, and a predetermined insulating material layer thereby constituting semiconductor switch elements and interconnections therebetween for a photoelectric transducer, in an atmosphere containing a plasma, comprising the steps of: placing said predetermined substrate with an irregular surface on a first electrode such that said irregular surface is exposed, said first electrode constituting a holder for said predetermined substrate; providing a second electrode as a target to oppose said first electrode; and perforning at least part of said depositing a photoconductive layer of amorphous hydrogenated silicon on the predetermined substrate with a negative bias potential of -5 V to -300 V being applied to said first electrode, and a ratio of power to be supplied to the substrate and the target being in the range of between 1/1 and 1/10, wherein the application of said negative bias voltage to said first electrode acts to sputter-etch a film deposited on said non-flat surface differentially from that on the flat surface to thereby produce a crack-free and pinhole-free photoconductive film of amorphous hydrogenated silicon on the substrate.
Claim 2
Independent Claim 223 words
A method of producing a photoelectric transducer including depositing a photoconductive layer of amorphous hydrogenated silicon on a predetermined substrate having an irregular surface including non-flat portions, said predetermined substrate being a semiconductor substrate comprising at least an impurity-doped region, an electrode contacting at least part of said impurity-doped region, and a predetermined insulating material layer thereby constituting semiconductor switch elements and interconnections therebetween for a photoelectric transducer, in an atmosphere containing a plasma, comprising the steps of: placing said predetermined substrate with an irregular surface on a first electrode such that said irregular surface is exposed, said first electrode constituting a holder for said predetermined substrate; providing a second electrode as a target to oppose said first electrode; and perforning at least part of said depositing a photoconductive layer of amorphous hydrogenated silicon on the predetermined substrate with a negative bias potential of -5 V to -300 V being applied to said first electrode, and a ratio of power to be supplied to the substrate and the target being in the range of between 1/1 and 1/10, wherein the application of said negative bias voltage to said first electrode acts to sputter-etch a film deposited on said non-flat surface differentially from that on the flat surface to thereby produce a crack-free and pinhole-free photoconductive film of amorphous hydrogenated silicon on the substrate.
Claim 3
Dependent Claim 44 words
A method of producing a photoelectric transducer according to claim 1, wherein the photoconductive layer is deposited on the predetermined substrate by a sputtering method and a target is placed on the second electrode so that the photoconductive layer is deposited on the substrate.
Claim 4
Dependent Claim 16 words
A method of producing photoelectric transducer according to claim 2, wherein said sputtering is reactive sputtering.
Claim 5
Dependent Claim 44 words
A method of producing a photoelectric transducer according to claim 1, wherein the photoconductive layer is deposited on the predetermined substrate by fabricating the photoconductive layer by glow discharge in an atmosphere including a gas of a raw material for forming the photoconductive layer.
Claim 6
Dependent Claim 32 words
A method of producing a photoelectric transducer according to claim 1, wherein said photoconductive layer is formed on the predetermined substrate with a negative bias potential being applied to said first electrode.
Claim 7
Dependent Claim 34 words
A method of producing a photoelectric transducer according to claim 1, 2, 3, 4 or 5, wherein said irregular surface of the predetermined substrate includes substantially flat portions and a stepped portion contiguous thereto.
Claim 8
Dependent Claim 39 words
A method of producing a photoelectric transducer according to claim 1, 2, 3, 4 or 5, wherein said negative bias potential applied to the first electrode is smaller in magnitude than a bias potential applied to said second electrode.
Claim 9
Dependent Claim 23 words
A method of producing a photoelectric transducer according to claim 1, wherein the thickness of the photoconductive film is 0.5 to 4 μm.
Claim 10
Dependent Claim 23 words
A method of producing a photoelectric transducer according to claim 8, wherein the thickness of the photoconductive film is 1.5 to 3.0 μm.
Claim 11
Dependent Claim 36 words
A method of producing a photoelectric transducer according to claim 1 or 8, wherein the thickness of the photoconductive film deposited while applying a negative bias potential to the first electrode is 0.5 to 2.0 μm.
Claim 12
Dependent Claim 26 words
A method of producing a photoelectric transducer according to claim 1, wherein the substrate comprises a semiconductor substrate having switching circuits and scanning circuits formed therein.
Claim 13
Independent Claim 208 words
A method of producing a photoconductive layer for a photoelectric transducer on a substrate with surface irregularities including nonflat portions, comprising the steps of: (a) preparing, as said substrate, a semiconductor substrate including substantially flat surfaces and non-flat surfaces, said substrate being a semiconductor substrate comprising at least an impurity-doped region, an electrode contacting at least part of said impurity-doped region, and a predetermined insulating material layer thereby constituting semiconductor switch elements and interconnections therebetween for a photoelectric transducer; (b) placing the semiconductor substrate thus prepared on a first electrode serving as a substrate holder; (c) disposing a second electrode as a target in opposition to said first electrode; and (d) depositing a photoconductive layer on said semiconductor substrate in an atmosphere containing a plasma, with a negative bias voltage of -5 V to -300 V being applied to said first electrode, and a ratio of power to be supplied to the substrate and the target being in the range of 1/1 to 1/10, wherein the application of said negative bias voltage to said first electrode acts to sputter-etch a film deposited on said non-flat surface differentially from that on the flat surface to thereby produce a crack- and/or pinhole-free photoconductive film on said flat and non-flat surfaces.
Claim 14
Independent Claim 208 words
A method of producing a photoconductive layer for a photoelectric transducer on a substrate with surface irregularities including nonflat portions, comprising the steps of: (a) preparing, as said substrate, a semiconductor substrate including substantially flat surfaces and non-flat surfaces, said substrate being a semiconductor substrate comprising at least an impurity-doped region, an electrode contacting at least part of said impurity-doped region, and a predetermined insulating material layer thereby constituting semiconductor switch elements and interconnections therebetween for a photoelectric transducer; (b) placing the semiconductor substrate thus prepared on a first electrode serving as a substrate holder; (c) disposing a second electrode as a target in opposition to said first electrode; and (d) depositing a photoconductive layer on said semiconductor substrate in an atmosphere containing a plasma, with a negative bias voltage of -5 V to -300 V being applied to said first electrode, and a ratio of power to be supplied to the substrate and the target being in the range of 1/1 to 1/10, wherein the application of said negative bias voltage to said first electrode acts to sputter-etch a film deposited on said non-flat surface differentially from that on the flat surface to thereby produce a crack- and/or pinhole-free photoconductive film on said flat and non-flat surfaces.
Claim 15
Dependent Claim 42 words
The method according to claim 12, wherein a bias voltage is applied to said second electrode, with the magnitude of the bias voltage applied to said second electrode being greater than the magnitude of the bias voltage applied to said first electrode.
Claim 16
Dependent Claim 58 words
The method according to claim 12, wherein a bias voltage is applied to said second electrode, with the bias voltage ratio between the bias voltages applied to said first and second electrodes selected to be in the range of from 1/6 to 1/10, whereby the photoconductive film is formed with a more uniform thickness over the substrate surface.
Claim 17
Dependent Claim 33 words
The method according to claim 14, wherein said bias voltage ratio between the bias voltages applied to said first and second electrodes is selected to be in the range of 1/6 to 1/8.
Claim 18
Dependent Claim 51 words
The method according to claim 12, wherein a bias voltage is applied to said second electrode, with the bias voltage ratio between the bias voltages applied to said first and second electrodes being selected to approach 1/1, whereby the photoconductive film is formed with a flat surface over the substrate surface.
Claim 19
Dependent Claim 22 words
The method according to claim 12, 13, 14 or 15, wherein said photoconductive film is formed of essentially an amorphous semiconductor material.
Claim 20
Dependent Claim 14 words
The method according to claim 17, wherein said amorphous semiconductor material is amorphous silicon.
Claim 21
Dependent Claim 14 words
The method according to claim 18, wherein the amorphous silicon is hydrogenated amorphous silicon.
Claim 22
Dependent Claim 15 words
The method according to claim 12, wherein said substrate includes switching circuits and scanning circuits.
Claim 23
Dependent Claim 30 words
The method according to claim 12, wherein the thickness of said photoconductive layer deposited while a negative bias voltage is applied to said first electrode is 0.5 to 2.0 μm.

References Cited (Backward Citations)

GB1209408A Cited
US4065600A Cited
US3983022A Cited
US4025339A Cited
US4064521A Cited
US4116791A Cited
US4086555A Cited
US4173661A Cited
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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1987-02-06 1987-08-08 1988-02-07 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1991-02-06 1991-08-08 1992-02-07 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1995-02-06 1995-08-08 1996-02-07 $7700.00 Window Closed / Lapsed

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