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US4419808A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of producing redundant ROM cells

Assignee: Conexant Systems LLC
•
Filing: 1982-09-23
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Granted: 1983-12-13
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Expires: 2002-09-23
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Abstract

Abstract The present invention comprises a unique FET with resistor in its drain lead of undoped polysilicon which may be characterized by high resistance in the absence of the application of a biasing voltage across the FET and the resistor when the FET is conducting, which biasing voltage irreversibly changes the resistor to a high state of conductivity thereby selectively providing the two logic states. This device may comprise a redundant cell for a ROM memory and may be uniquely fabricated utilizing VLSI MOS processing steps to provide a new manufacturing process.

Inventors

  • 👤 Matthias L. Tam
  • 👤 Frank Z. Custode

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-30 14:15
CPC Classifications
H; H10; H10D; H10D62/00; H10D62/10; H10D62/13; H10D62/149; H10D62/151; G; G11; G11C; G11C17/00; G11C17/14; G11C17/16; H10B; H10B20/00; H10D62/80; H10D62/83; H10D64/00; H10D64/60; H10D64/62; H10D88/00

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 103 words
A method for producing an electrically programmable very large scale integrated circuit having at least one redundant read only memory cell comprising the steps of: forming a gate oxide; growing field oxide around active regions of a substrate including the region of gate oxide; forming the gate, source and drain conductors of doped polysilicon; forming source and drain regions on opposite sides of the gate; forming a layer of undoped polysilicon on the doped polysilicon drain; and, forming contacts to the gate, source and drain whereby the layer of undoped polysilicon on the drain comprises a resistor connected in series with the drain.
Claim 2
Independent Claim 103 words
A method for producing an electrically programmable very large scale integrated circuit having at least one redundant read only memory cell comprising the steps of: forming a gate oxide; growing field oxide around active regions of a substrate including the region of gate oxide; forming the gate, source and drain conductors of doped polysilicon; forming source and drain regions on opposite sides of the gate; forming a layer of undoped polysilicon on the doped polysilicon drain; and, forming contacts to the gate, source and drain whereby the layer of undoped polysilicon on the drain comprises a resistor connected in series with the drain.

References Cited (Backward Citations)

US4041518A Cited
US4072545A Cited
US4187602A Cited
US4214917A Cited
US4178674A Cited
JPS54128295A Cited
US4231051A Cited
US4297721A Cited
US4265685A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1986-12-12 1987-06-13 1987-12-13 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1990-12-12 1991-06-13 1991-12-13 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1994-12-12 1995-06-13 1995-12-13 $7700.00 Window Closed / Lapsed

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