← Back to Patent Explorer
US4415851A Expired / Lapsed US ⏱️ 0.0 years remaining

System for contactless testing of multi-layer ceramics

Assignee: International Business Machines Corp
•
Filing: 1981-05-26
•
Granted: 1983-11-15
•
Expires: 2001-05-26
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract A system of testing the continuity of electrical conductors extending through an insulating layer without contact. A flood gun irradiates one side of the body to charge the exposed conductors to a given potential. A steerable electron beam scans the front side to generate secondary electron emission from those conductors. The secondary emission is enhanced from conductors with conductivity between front side and back side as a result of the surface potential established by the rear flood beam. The secondary emission varies depending on the state of continuity in the three dimensional network of conductors and produces signals at the detector which allow clear discrimination between uninterrupted and interrupted conductors. The system is applicable for unfired ceramics where contact destroys the specimen.

Inventors

  • 👤 Guenther O. Langner
  • 👤 Hans C. Pfeiffer

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-29 21:37
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/302; G01R31/305

Claims Analysis

Total Claims: 21
Claim 1
Independent Claim 78 words
A method of testing electrical connections disposed through an insulating material without physical contact comprising the steps of: irradiating one side of said insulating material with a first electron beam to charge said material and said electrical connections to a given potential; generating a second electron beam on an opposite side of said material to cause secondary electron emission from connections which are at said given potential; and detecting the presence of connections not at a given potential.
Claim 2
Independent Claim 78 words
A method of testing electrical connections disposed through an insulating material without physical contact comprising the steps of: irradiating one side of said insulating material with a first electron beam to charge said material and said electrical connections to a given potential; generating a second electron beam on an opposite side of said material to cause secondary electron emission from connections which are at said given potential; and detecting the presence of connections not at a given potential.
Claim 3
Independent Claim 70 words
A method of testing for continuity and open circuit conditions in electrical connections placed through an insulative material comprising the steps of: flooding one side of said material with a broad angle, first electron beam; scanning the opposite side of said material with a steerable second electron beam; and detecting the emission of secondary electrons emitted from said opposite surface to determine electrical conduction or interruption through said electrical connections.
Claim 4
Independent Claim 70 words
A method of testing for continuity and open circuit conditions in electrical connections placed through an insulative material comprising the steps of: flooding one side of said material with a broad angle, first electron beam; scanning the opposite side of said material with a steerable second electron beam; and detecting the emission of secondary electrons emitted from said opposite surface to determine electrical conduction or interruption through said electrical connections.
Claim 5
Independent Claim 87 words
A method of determining the status of electrical connections in an insulative layer without contacting said connections comprising the steps of: charging without contacting one side of said insulative layer and said connections to a given potential using a first electron beam; directing without contacting the opposite side of said layer a second electron beam to generate secondary electron emissions; and discriminating by detecting the variation in energy level of secondary electrons and their intensity to determine whether said electrical connections have electrical continuity or are open.
Claim 6
Independent Claim 87 words
A method of determining the status of electrical connections in an insulative layer without contacting said connections comprising the steps of: charging without contacting one side of said insulative layer and said connections to a given potential using a first electron beam; directing without contacting the opposite side of said layer a second electron beam to generate secondary electron emissions; and discriminating by detecting the variation in energy level of secondary electrons and their intensity to determine whether said electrical connections have electrical continuity or are open.
Claim 7
Dependent Claim 36 words
The method of claim 3 wherein the step of directing said second electron beam, without contacting, comprises stepping said second electron beam from a first predetermined point to a second predetermined point on said opposite side.
Claim 8
Dependent Claim 21 words
The method of claim 4 wherein said first and second predetermined points are locations of electrical connections in said insulative layer.
Claim 9
Independent Claim 47 words
The method of claims 1, 2 or 3, further comprising the steps of providing a secondary electron detector outside the scan field of said second electron beam but at a position where it can be reached by secondary electrons generated from every position on said opposite side.
Claim 10
Independent Claim 28 words
The method of claims 1, 2 or 3, wherein the energy level of said second electron beam is different from the energy level of said first electron beam.
Claim 11
Dependent Claim 25 words
The method of claim 7 wherein the energy level of said second electron beam is lower than the energy level of said first electron beam.
Claim 12
Dependent Claim 31 words
The method of claim 8 further comprising the step of producing voltage contrast by positioning a retarding electrode relative to said secondary electron detector to discriminate between electrons having different energies.
Claim 13
Dependent Claim 48 words
The method of claim 8 further comprising the steps of adjusting the currents of said first and second electron beams and the scanning speed of said second beam so that the output of a secondary electron detector is a continuous function of the resistance of said electrical connections.
Claim 14
Dependent Claim 71 words
Apparatus for testing electrical connections disposed through an insulating material specimen without physical contact, comprising: means for generating a first electron beam to irradiate one surface of said specimen; means for generating a second electron beam for irradiating a selected portion of an opposite surface of said specimen; and means for detecting the emission of secondary electrons at said selected portion to determine whether electrical continuity exists through said electrical connections.
Claim 15
Dependent Claim 71 words
Apparatus for testing electrical connections disposed through an insulating material specimen without physical contact, comprising: means for generating a first electron beam to irradiate one surface of said specimen; means for generating a second electron beam for irradiating a selected portion of an opposite surface of said specimen; and means for detecting the emission of secondary electrons at said selected portion to determine whether electrical continuity exists through said electrical connections.
Claim 16
Dependent Claim 22 words
The apparatus of claim 11 further comprising means to steer said second electron beam to different selected portions on said opposite surface.
Claim 17
Dependent Claim 35 words
The apparatus of claim 11 further comprising a holder for said specimen, said holder having a window to expose said one surface, and said first electron beam being a flood beam irradiating said one surface.
Claim 18
Dependent Claim 46 words
The apparatus of claim 11 wherein said means for detecting the emission of secondary electrons comprises a secondary electron detector positioned outside the field of said second beam but where it can be reached by secondary electrons generated at every selected position on said opposite surface.
Claim 19
Dependent Claim 30 words
The apparatus of claim 14 further comprising a retarding electrode positioned relative to said secondary electron detector to discriminate between electrons of different energies and produce a voltage contrast output.
Claim 20
Independent Claim 26 words
The apparatus of claims 11 or 12, wherein said first electron beam is a flood beam having a different energy level than said second electron beam.
Claim 21
Dependent Claim 19 words
The apparatus of claim 16 wherein said flood beam has an energy level higher than said second electron beam.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1986-11-14 1987-05-16 1987-11-15 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1990-11-14 1991-05-16 1991-11-15 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1994-11-14 1995-05-16 1995-11-15 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag