US4414057A
Expired / Lapsed
US
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Anisotropic silicide etching process
Assignee: Inmos Corp
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Filing: 1982-12-03
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Granted: 1983-11-08
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Expires: 2002-12-03
Abstract
Abstract A process is described for anisotropically etching semiconductor products which include a lower dielectric layer, an intermediate polysilicon layer, and an upper silicide layer such as titanium silicide. A pattern-defining layer will normally overlie the silicide layer to define target areas to be etched. In a first step, the silicide is etched through using Freon 115 chloro, pentafluoroethane (C2ClF5) in a plasma etching chamber conditioned to provide a reactive ion etch. The etch is completed in the same chamber using a second gas which includes an amount of Cl2 selected to etch anisotropically through the polysilicon layer without substantially etching the dielectric layer. Preferably, both etches occur after covering inner surfaces of the etching chamber with a material which releases molecules of the character included in the pattern-defining layer, such as Kapton, a polymide, in the disclosed example.
Inventors
- 👤 Ronald R. Bourassa
- 👤 Michael R. Reeder
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 22:14
CPC Classifications
H; H10; H10P; H10P50/00; H10P50/20; H10P50/26; H10P50/264; H10P50/266; H10P50/267; H10P50/268
Claims Analysis
Total Claims: 19
Claim 1
Independent Claim
90 words
A process for etching selected materials in a layered semiconductor product having a lower layer, an intermediate layer, and an upper silicide layer, the process comprising the steps of: exposing the semiconductor product to a first gas consisting essentially of C 2 ClF 5 at reduced pressure for a time sufficient for said first gas to etch through the silicide layer; and exposing the semiconductor product to a second gas comprising Cl 2 at reduced pressure for a time sufficient for said second gas to etch through the intermediate layer.
Claim 2
Dependent Claim
90 words
A process for etching selected materials in a layered semiconductor product having a lower layer, an intermediate layer, and an upper silicide layer, the process comprising the steps of: exposing the semiconductor product to a first gas consisting essentially of C 2 ClF 5 at reduced pressure for a time sufficient for said first gas to etch through the silicide layer; and exposing the semiconductor product to a second gas comprising Cl 2 at reduced pressure for a time sufficient for said second gas to etch through the intermediate layer.
Claim 3
Dependent Claim
130 words
A process for etching selected portions of silicide and underlying polysilicon in a layered semiconductor product having a lower layer, an intermediate polysilicon layer, and a silicide layer thereover, the process comprising the steps of: defining a pattern of silicide to be etched by developing a patterned material on the silicide layer; placing the semiconductor product in a reaction vessel; exposing the semiconductor product to a first gas including gaseous C 2 ClF 5 ; controlling the environment of said reaction vessel to promote reactive ion etching by said first gas; etching through the silicide layer exposed by said pattern; then exposing the semiconductor product to a second gas including Cl 2 ; etching through the polysilicon layer exposed by the pattern, whereby the lower layer is not substantially etched.
Claim 4
Dependent Claim
130 words
A process for etching selected portions of silicide and underlying polysilicon in a layered semiconductor product having a lower layer, an intermediate polysilicon layer, and a silicide layer thereover, the process comprising the steps of: defining a pattern of silicide to be etched by developing a patterned material on the silicide layer; placing the semiconductor product in a reaction vessel; exposing the semiconductor product to a first gas including gaseous C 2 ClF 5 ; controlling the environment of said reaction vessel to promote reactive ion etching by said first gas; etching through the silicide layer exposed by said pattern; then exposing the semiconductor product to a second gas including Cl 2 ; etching through the polysilicon layer exposed by the pattern, whereby the lower layer is not substantially etched.
Claim 5
Dependent Claim
30 words
The process of claim 2 wherein said exposing steps occur in a plasma etching chamber, and wherein said controlling the environment steps include controlling the electrical power and gas pressure.
Claim 6
Dependent Claim
24 words
The process of claim 2 wherein said second gas comprises a minor amount of Cl 2 and a major amount of a fluorine--carbon compound.
Claim 7
Dependent Claim
29 words
The process as set forth in claim 2 wherein the amount of Cl 2 in said second gas is in a range from about 8 to about 35 percent.
Claim 8
Dependent Claim
19 words
The process of claim 2 wherein the amount of Cl 2 in said second gas is about 16 percent.
Claim 9
Dependent Claim
18 words
The process as set forth in claim 2 wherein said second gas includes C 2 F 6 .
Claim 10
Dependent Claim
18 words
The process of claim 2 wherein said first gas is maintained at a pressure of about 12 millitorr.
Claim 11
Dependent Claim
27 words
The process as set forth in claim 2 wherein said first gas is maintained at a pressure in a range from about 1 to about 40 millitorr.
Claim 12
Dependent Claim
23 words
The process as set forth in claim 2 wherein said first gas is maintained at a pressure of up to about 300 millitorr.
Claim 13
Dependent Claim
27 words
The process as set forth in claim 2 wherein said second gas is maintained at a pressure in a range of about 50 to about 350 millitorr.
Claim 14
Dependent Claim
50 words
A process as set forth in claim 2 wherein an aperture-defining layer covers said upper silicide layer; said process further comprising the step of covering the surface of said plates, prior to the etching steps, with a material which releases predominantly molecules of the character included in the aperture--defining layer.
Claim 15
Dependent Claim
15 words
The process as set forth in claim 11 wherein said material is a polyimide film.
Claim 16
Dependent Claim
29 words
The process as set forth in claim 12 wherein said second gas includes about 25 percent of Cl 2 and about 75 percent of C 2 F 6 .
Claim 17
Dependent Claim
18 words
The process of claim 14 wherein said second gas is maintained at a pressure of about 100 millitorr.
Claim 18
Dependent Claim
149 words
For a semiconductor product which includes a lower layer of silicon dioxide, an intermediate polysilicon layer, and an upper layer of titanium silicide, a process for etching target areas from the polysilicon and titanium silicide, comprising the steps of: covering inner surfaces of a plasma etching chamber with a polyimide film; placing the product and a first gas comprising C 2 ClF 5 in the plasma etching chamber at a pressure and a power selected to provide a reactive ion etch; etching with said first gas through the silicide layer at least to the polysilicon layer; then replacing said first gas with a second gas comprising C 2 F 6 and Cl 2 , the amount of Cl 2 being selected to provide a highly anisotropic etch and an etch selectivity which inhibits substantial etch of silicon dioxide; and then etching with said second gas through the polysilicon layer.
Claim 19
Dependent Claim
149 words
For a semiconductor product which includes a lower layer of silicon dioxide, an intermediate polysilicon layer, and an upper layer of titanium silicide, a process for etching target areas from the polysilicon and titanium silicide, comprising the steps of: covering inner surfaces of a plasma etching chamber with a polyimide film; placing the product and a first gas comprising C 2 ClF 5 in the plasma etching chamber at a pressure and a power selected to provide a reactive ion etch; etching with said first gas through the silicide layer at least to the polysilicon layer; then replacing said first gas with a second gas comprising C 2 F 6 and Cl 2 , the amount of Cl 2 being selected to provide a highly anisotropic etch and an etch selectivity which inhibits substantial etch of silicon dioxide; and then etching with said second gas through the polysilicon layer.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1986-11-07 | 1987-05-09 | 1987-11-08 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1990-11-07 | 1991-05-09 | 1991-11-08 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1994-11-07 | 1995-05-09 | 1995-11-08 | $7700.00 | Window Closed / Lapsed |