US4352724A
Expired / Lapsed
US
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Method of manufacturing a semiconductor device
Assignee: Fujitsu Ltd
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Filing: 1980-11-19
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Granted: 1982-10-05
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Expires: 2000-11-19
Abstract
Abstract A method of manufacturing a semiconductor device having a multi-layer structure comprises the steps of patterning in accordance with a predetermined pattern a thin film of photoresist formed on a film to be etched which has been formed on a semiconductor substrate, etching the film to be etched partly by an isotropic etching using said patterned film as a mask, completing the etching by an anisotropic etching in the direction of its depth, resulting in tapered or inclined sides on the etched film. The isotropic and anisotropic etchings may be carried out in the same apparatus by changing the reactive gases used in these etchings and/or the conditions of each etching, such as the amount of gas, the gas pressure and the applied radio frequency power.
Inventors
- 👤 Kenji Sugishima
- 👤 Tadakazu Takada
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-24 12:27
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/01; H10W20/071; H10W20/081; H10W20/082; H10P; H10P50/00; H10P50/20; H10P50/24; H10P50/242; H10P50/26; H10P50/264; H10P50/266; H10P50/267; H10P50/268; H10P50/28; H10P50/282; H10P50/283; H10P50/60; H10P50/66; H10P50/663; H10P50/667; H10P76/00; H10P76/40; H10P76/405; H10P76/408; H10P76/4083; H10W20/031
Claims Analysis
Total Claims: 37
Claim 1
Independent Claim
172 words
A method of manufacturing a semiconductor device with a multi-layer structure on a semiconductor substrate to have a more uniform thickness of at least one of the layers, said method comprising the steps of forming a masking film with a predetermined pattern on a selected one of said layers that is to be etched in forming said multi-layer structure, isotropically etching each portion of said layer exposed by said pattern to a substantial depth of said selected layer with a respective etchant, leaving at least a lower part of each said exposed portion of said selected layer, said isotropic etching resulting in the removal of at least some of said selected layer underneath said masking film at the edges of said predetermined pattern, and completing removal of said selected layer in an area of each said lower part by anisotropic etching so that the lower surface of said selected layer has said predetermined pattern, wherein the combination of said etchings result in the selected layer having said predetermined pattern with tapered edges.
Claim 2
Independent Claim
172 words
A method of manufacturing a semiconductor device with a multi-layer structure on a semiconductor substrate to have a more uniform thickness of at least one of the layers, said method comprising the steps of forming a masking film with a predetermined pattern on a selected one of said layers that is to be etched in forming said multi-layer structure, isotropically etching each portion of said layer exposed by said pattern to a substantial depth of said selected layer with a respective etchant, leaving at least a lower part of each said exposed portion of said selected layer, said isotropic etching resulting in the removal of at least some of said selected layer underneath said masking film at the edges of said predetermined pattern, and completing removal of said selected layer in an area of each said lower part by anisotropic etching so that the lower surface of said selected layer has said predetermined pattern, wherein the combination of said etchings result in the selected layer having said predetermined pattern with tapered edges.
Claim 3
Dependent Claim
105 words
The method of claim 1, wherein said selected layer is aluminum or an aluminum alloy, said isotropic etching comprises a wet etching using a solution of H 3 PO 4 , and said anisotropic etching is a dry etching with a reactive gas chosen from a chloride compound gas, a mixture of at least any two of said chloride compound gases, a mixture of any of said chloride compound gases and mixtures mixed with O 2 or CF 4 , or any of said gases or mixtures mixed with an inactive gas, and said anisotropic etching is conducted in a planar type plasma etching apparatus.
Claim 4
Dependent Claim
22 words
The method of claim 2, said inactive gas comprising at least one gas selected from the group consisting of Ar and He.
Claim 5
Dependent Claim
36 words
The method of claim 1, said selected layer comprising at least two sub-layers, each sub-layer being of a different material, and each sub-layer having a higher etching rate in said reactive gas than the next-lowest sub-layer.
Claim 6
Dependent Claim
30 words
The method of claim 4, said selected layer consisting of two of said sub-layers, the upper sub-layer being Si 3 N 4 and the lower sub-layer being SiO 2 .
Claim 7
Dependent Claim
11 words
The method of claim 1, said isotropic etching comprising wet etching.
Claim 8
Dependent Claim
26 words
The method of claim 6, wherein said selected layer is single crystalline or polycrystalline silicon and said respective etchant is selected from the HF-HNO 3 family.
Claim 9
Dependent Claim
26 words
The method of claim 6, wherein said selected layer is SiO 2 or PSG, and said respective etchant is selected from the HF-H 2 O family.
Claim 10
Dependent Claim
26 words
The method of claim 6, wherein said selected layer comprises aluminum, and said respective etchant is selected from the H 3 PO 4 -HNO 3 family.
Claim 11
Dependent Claim
14 words
The method of claim 1, said isotropic etching comprising a barrel type plasma etching.
Claim 12
Dependent Claim
37 words
The method of claim 10, wherein said selected layer is single crystal silicon, polycrystalline silicon, or SiO 2 and said respective etchant is CF 4 , CF 4 +O 2 , or CF 3 Cl+O 2 .
Claim 13
Dependent Claim
31 words
The method of claim 10, said selected layer comprising Si 3 N 4 , and said respective etchant is CF 4 , CF 4 +O 2 , or SiF 4 .
Claim 14
Dependent Claim
29 words
The method of claim 10, said selected layer comprising PSG, and said respective etchant is CF 4 , CF 4 +O 2 , or CClF 3 +O 2 .
Claim 15
Dependent Claim
14 words
The method of claim 1, said isotropic etching comprising a planar type plasma etching.
Claim 16
Dependent Claim
62 words
The method of claim 14, wherein said selected layer is single crystal silicon, polycrystalline silicon, SiO 2 , Si 3 N 4 , or PSG and said respective etchant is C 2 F 5 Cl+CF 4 at a gas pressure of at least 1 Torr, or CF 4 or CF 4 +O 2 at a gas pressure of at least 0.1 Torr.
Claim 17
Dependent Claim
17 words
The method of claim 1, said isotropic etching selectively comprising reactive ion etching and reactive sputter etching.
Claim 18
Dependent Claim
62 words
The method of claim 16, wherein said selected layer is single crystal silicon, polycrystalline silicon, SiO 2 , Si 3 N 4 , or PSG and said respective etchant is C 2 F 5 Cl+CF 4 at a gas pressure of at least 0.1 Torr, or CF 4 or CF 4 +O 2 at a gas pressure of at least 0.01 Torr.
Claim 19
Dependent Claim
17 words
The method of claim 1, said anisotropic etching selectively comprising reactive ion etching and reactive sputter etching.
Claim 20
Dependent Claim
121 words
The method of claim 18, wherein said selected layer is Si 3 N 4 , single crystal silicon or polycrystalline silicon, and wherein said reactive gas is: a chloride compound gas; CF 4 or CF 4 +O 2 at a maximum gas pressure of 0.02 Torr; C 2 F 5 Cl or C 2 F 5 Cl+CF 4 at a maximum gas pressure of 0.1 Torr; a gas mixture of at least one chloride compound gas mixed with O 2 or CF 4 ; a gas mixture of any two chloride compound gases; a gas mixture of at least one of said chloride compound gases or mixtures mixed with O 2 or CF 4 ; or C 2 F 6 .
Claim 21
Dependent Claim
24 words
The method of claim 19, wherein each said chloride compound gas is CCl 4 , PCl 3 , BCl 3 or SiCl 4 .
Claim 22
Dependent Claim
67 words
The method of claim 18, wherein the material of said selected layer is PSG, Si 3 N 4 or SiO 2 , and wherein said reactive gas is: CF 4 or CF 4 +O 2 at a maximum gas pressure of 0.02 Torr; CF 4 +H 2 , CHF 3 , C 2 F 6 , C 3 F 8 , or C 4 F 8 .
Claim 23
Dependent Claim
73 words
The method of claim 18, wherein the material of said selected layer is aluminum or aluminum alloy, and wherein said reactive gas is: a chloride compound gas; a gas mixture of at least two of said chloride compound gases; a gas mixture of at least one of said chloride compound gases with O 2 or CF 4 ; or a gas mixture of any of said gases and mixtures with an inactive gas.
Claim 24
Dependent Claim
82 words
The method of claim 1, 10, 14, 16, or 18, both said isotropic and anisotropic etching comprising a dry etching process with a respective reactive gas, both said isotropic and anisotropic etchings comprising applying radio frequency power to said reactive gases, said method comprising performing said isotropic and anisotropic etchings in the same dry etching apparatus by selecting the respective reactive gases and the conditions of each said etching, including the amount and pressure of each said gas in each said etching.
Claim 25
Dependent Claim
109 words
The method of claim 23, wherein said selected layer is single crystal silicon, polycrystalline silicon, or Si 3 N 4 , said reactive gas of said isotropic etching is CF 4 , CF 4 +O 2 or C 2 F 5 Cl+CF 4 , and said reactive gas of said anisotropic etching is a chloride compound gas, CF 4 , CF 4 +O 2 , a mixture of at least one chloride compound gas with O 2 or CF 4 , a mixture of at least two chloride compound gases, any of said gas mixtures mixed with O 2 or CF 4 , or C 2 F 6 .
Claim 26
Dependent Claim
42 words
The method of claim 24, wherein said chloride compound gas is CCl 4 , PCl 3 , BCl 3 , SiCl 4 , or C 2 F 5 Cl, and said chloride compound mixture with O 2 comprises 5% O 2 .
Claim 27
Dependent Claim
98 words
The method of claim 23, wherein said apparatus comprises a planar type plasma etching apparatus, said selected layer is of phospho-silicate-glass, Si 3 N 4 or chemically vapor deposited or thermally grown SiO 2 , said reactive gas of said isotropic etching is C 2 F 5 Cl+CF 4 , CF 4 or CF 4 +O 2 , and the reactive gas for said anisotropic etching is CF 4 , CF 4 +O 2 , CF 4 +H 2 , CHF 3 , C 2 F 6 , C 3 F 8 or C 4 F 8 .
Claim 28
Dependent Claim
19 words
The method of claim 1, 6, 10, 14 or 16, said anisotropic etching comprising a planar type plasma etching.
Claim 29
Dependent Claim
117 words
The method of claim 27, wherein said selected layer is Si 3 N 4 , single crystal silicon, or polycrystalline silicon, and said reactive gas is: a chloride compound gas; CF 4 or CF 4 +O 2 at a maximum gas pressure of 0.2 Torr; C 2 F 5 Cl or C 2 F 5 Cl+CF 4 at a maximum gas pressure of 1 Torr; a gas mixture of any of said chloride compound gases with O 2 or CF 4 ; a gas mixture of at least two of said chloride compound gases; a gas mixture of any of said gases and mixtures with O 2 or CF 4 ; or C 2 F 6 .
Claim 30
Dependent Claim
25 words
The method of claim 28, wherein each said chloride compound gas is CCl 4 , PCl 3 , BCl 3 , or SiCl 4 .
Claim 31
Dependent Claim
65 words
The method of claim 27, wherein said selected layer is PSG, Si 3 N 4 or SiO 2 , and wherein said reactive gas is: CF 4 or CF 4 +O 2 at a gas pressure of at least 0.1 Torr; CF 4 +H 2 , CHF 3 , C 2 F 6 , C 3 F 8 , or C 4 F 8 .
Claim 32
Dependent Claim
70 words
The method of claim 27, wherein the material of said selected layer is aluminum or an aluminum alloy, and wherein said reactive gas is: a chloride compound gas; a gas mixture of at least two chloride compound gases; a gas mixture of any of said gases and mixtures with O 2 or CF 4 ; or a gas mixture of any of said gases and mixtures with an inactive gas.
Claim 33
Dependent Claim
21 words
The method of claim 31, wherein each said chloride compound gas is CCl 4 , PCl 3 or BCl 3 .
Claim 34
Dependent Claim
14 words
The method of claim 31, wherein said aluminum alloy is Al-Cu, Al-Si or Al-Cu-Si.
Claim 35
Dependent Claim
76 words
The method of claim 22, said isotropic and anisotropic etching comprising a dry etching process with a respective reactive gas, both said isotropic and anisotropic etchings comprising applying radio frequency power to said reactive gases, said method comprising performing said isotropic and anisotropic etchings in the same dry etching apparatus by selecting the respective reactive gases and the conditions of each said etching, including the amount and pressure of each said gas in each said etching.
Claim 36
Dependent Claim
23 words
The method of claim 2 or 22 wherein each said chloride compound gas is CCl 4 , PCl 3 or BCl 3 .
Claim 37
Dependent Claim
16 words
The method of claim 2 or 22 wherein said aluminum alloy is Al-Cu, Al-Si or Al-Cu-Si.
References Cited (Backward Citations)
No citation records indexed.
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| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 1985-10-04 | 1986-04-05 | 1986-10-05 | $2000.00 | Window Closed / Lapsed |
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