US4288776A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Passivated thin-film hybrid circuits
Assignee: Tektronix Inc
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Filing: 1980-01-09
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Granted: 1981-09-08
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Expires: 2000-01-09
Abstract
Abstract Thin-film microcircuit structures passivated with silicon nitride are provided in which included electrical components containing nickel, chromium or other nitride-forming metals are encapsulated in an oxide material, preferably silicon oxide. The metal-containing components are thus prevented from reacting with the silicon nitride passivation coating during through-passivation laser trimming of the components.
Inventors
- 👤 Robert E. Holmes
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 07:54
CPC Classifications
H; H01; H01C; H01C7/00; H01C7/006; H01C1/00; H01C1/02; H01C1/034; H01C17/00; H01C17/22; H01C17/26; H01C17/265; Y; Y10; Y10T; Y10T29/00; Y10T29/49; Y10T29/49002; Y10T29/49082; Y10T29/49099; Y10T29/49117; Y10T29/49124; Y10T29/49155; Y10T29/49156
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
160 words
A method for manufacturing a thin-film electrical microcircuit structure containing a laser-trimmed circuit element, which structure includes an unfractured silicon nitride passivation layer, comprising the subsequential steps of: (a) forming a first layer of an insulating oxide on a substrate, (b) forming a thin-film electrical circuit element on the first oxide layer, said element being formed from a material containing a metal capable of reacting with silicon nitride at the temperature produced by laser trimming of the element to form a metal nitride having a dissociation temperature no higher than the first-mentioned temperature, (c) forming a second layer of an insulating oxide over the circuit element and adjacent portions of the first oxide layer, (d) depositing a layer of silicon nitride over the exposed surface of said second layer, and (e) trimming the thin-film circuit element to a desired value by removing portions of the element with a laser beam directed through said silicon nitride layer and second oxide layer.
Claim 2
Independent Claim
160 words
A method for manufacturing a thin-film electrical microcircuit structure containing a laser-trimmed circuit element, which structure includes an unfractured silicon nitride passivation layer, comprising the subsequential steps of: (a) forming a first layer of an insulating oxide on a substrate, (b) forming a thin-film electrical circuit element on the first oxide layer, said element being formed from a material containing a metal capable of reacting with silicon nitride at the temperature produced by laser trimming of the element to form a metal nitride having a dissociation temperature no higher than the first-mentioned temperature, (c) forming a second layer of an insulating oxide over the circuit element and adjacent portions of the first oxide layer, (d) depositing a layer of silicon nitride over the exposed surface of said second layer, and (e) trimming the thin-film circuit element to a desired value by removing portions of the element with a laser beam directed through said silicon nitride layer and second oxide layer.
Claim 3
Dependent Claim
30 words
The method of claim 1, wherein said oxide layers are of an oxide selected from the group consisting of aluminum oxides, silicon oxides, tantalum oxides, titanium oxides and zirconium oxides.
Claim 4
Dependent Claim
15 words
The method of claim 2, wherein said oxide layers are formed of a silicon oxide.
Claim 5
Dependent Claim
18 words
The method of claim 1, wherein said oxide layers have a minimum average thickness of about 1,000 angstroms.
Claim 6
Dependent Claim
34 words
The method of claim 1, wherein said circuit element is formed of a material selected from the group consisting of nickel, chromium, nickel-chromium alloys, chromium-silicon alloys and cermets composed of chromium and silicon oxide.
Claim 7
Dependent Claim
182 words
A microcircuit structure comprising a substrate having a first layer of an insulating oxide on a surface thereof, said layer having a minimum average thickness of about 1,000 angstroms, a thin-film electrical component disposed on said first oxide layer, said component being formed from a material containing a metal capable of reacting with silicon nitride at the temperature produced by laser trimming of the component to form a metal nitride having a dissociation temperature no higher than the first-mentioned temperature, and an unfractured protective coating covering said component and adjoining surface areas of the first oxide layer, said coating including a second layer of an oxide deposited to a minimum average thickness of about 1,000 angstroms on said component's and the first oxide layer's surface areas, and an overlying layer of silicon nitride, said structure including a relatively high resistance region within the portions of said oxide layers that adjoin said component, said region being formed by laser trimming of the component through said protective coating and containing a stable reaction product of said metal with the material forming said oxide layers.
Claim 8
Dependent Claim
182 words
A microcircuit structure comprising a substrate having a first layer of an insulating oxide on a surface thereof, said layer having a minimum average thickness of about 1,000 angstroms, a thin-film electrical component disposed on said first oxide layer, said component being formed from a material containing a metal capable of reacting with silicon nitride at the temperature produced by laser trimming of the component to form a metal nitride having a dissociation temperature no higher than the first-mentioned temperature, and an unfractured protective coating covering said component and adjoining surface areas of the first oxide layer, said coating including a second layer of an oxide deposited to a minimum average thickness of about 1,000 angstroms on said component's and the first oxide layer's surface areas, and an overlying layer of silicon nitride, said structure including a relatively high resistance region within the portions of said oxide layers that adjoin said component, said region being formed by laser trimming of the component through said protective coating and containing a stable reaction product of said metal with the material forming said oxide layers.
Claim 9
Dependent Claim
30 words
The microcircuit structure of claim 6, wherein said metal-containing material is selected from the group consisting of chromium, nickel-chromium alloys, chromium-silicon alloys and cermets composed of chromium and silicon oxide.
Claim 10
Dependent Claim
31 words
The microcircuit structure of claim 6, wherein said oxide layers are of an oxide selected from the group consisting of aluminum oxides, silicon oxides, tantalum oxides, titanium oxides and zirconium oxides.
Claim 11
Dependent Claim
14 words
The structure of claim 8, wherein said layers both are formed of silicon oxide.
Claim 12
Dependent Claim
27 words
The microcircuit structure of claim 6, wherein said reaction product comprises a metal oxide selected from the group consisting of chromium oxides, nickel oxides and mixtures thereof.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1984-09-07 | 1985-03-09 | 1985-09-08 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1988-09-07 | 1989-03-09 | 1989-09-08 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1992-09-07 | 1993-03-09 | 1993-09-08 | $7700.00 | Window Closed / Lapsed |