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Method of manufacturing an integrated circuit including an analog circuit and an I2 L circuit utilizing staged diffusion techniques

Assignee: Licentia Patent Verwaltungs GmbH
•
Filing: 1978-04-04
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Granted: 1980-04-08
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Expires: 1998-04-04
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Abstract

Abstract A method of manufacturing an integrated circuit including an analog circuit and an I2L circuit which both contain NPN transistors on a P-type semiconductor chip in which the method includes an N+ diffusion step for producing a flat diffusion for certain NPN transistors having smaller penetration depth than N+ regions of the other NPN transistors for connection of an emitter electrode to the said certain NPN transistors.

Inventors

  • 👤 Gunther Bergmann
  • 👤 Hermann Clauss

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-30 16:36
CPC Classifications
H; H10; H10D; H10D62/00; H10D62/10; H10D62/13; H10D62/133; H10D84/00; H10D84/01; H10D84/0112; H10D84/0116; H10D84/02; H10D84/03; H10D84/038; H10D89/00; H10D89/211; Y; Y10; Y10S; Y10S148/00; Y10S148/087

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 277 words
In a method of manufacturing a monolithic integrated circuit having at least one analog circuit portion, including a linear vertical NPN transistor, and at least one I 2 L circuit portion, including vertical NPN switching transistors, on a common semiconductor substrate wafer of P-type conductivity including the steps of diffusing N + -type conductivity regions into selected portions of the surface of a P-type conductivity substrate, which regions form buried layers in the finished integrated circuit; depositing an epitaxial layer of N-type conductivity on said surface of said substrate; forming deep P + -type conductivity regions which extend from the surface of said epitaxial layer down to said surface of said substrate to electrically isolate the individual circuit portions from one another; simultaneously diffusing P-type conductivity regions into selected portions of the surface of said epitaxial layer to form the injectors and the transistor base regions of the I 2 L circuits and the base regions of the linear transistors of the analog circuits; and producing N + -type conductivity regions in said base regions of the I 2 L circuit portions to form the collectors of the NPN switching transistors of the I 2 L circuits, and in the base regions of the analog circuit portions to form the emitters of the NPN linear transistors of the analog circuits; the improvement wherein said step of producing N + -type conductivity regions includes forming the N + -type conductivity emitter regions of at least one of the linear transistors of an analog circuit so that it is flat relative to the penetration depth of the N + -type conductivity collector regions of the I 2 L circuits.
Claim 2
Dependent Claim 277 words
In a method of manufacturing a monolithic integrated circuit having at least one analog circuit portion, including a linear vertical NPN transistor, and at least one I 2 L circuit portion, including vertical NPN switching transistors, on a common semiconductor substrate wafer of P-type conductivity including the steps of diffusing N + -type conductivity regions into selected portions of the surface of a P-type conductivity substrate, which regions form buried layers in the finished integrated circuit; depositing an epitaxial layer of N-type conductivity on said surface of said substrate; forming deep P + -type conductivity regions which extend from the surface of said epitaxial layer down to said surface of said substrate to electrically isolate the individual circuit portions from one another; simultaneously diffusing P-type conductivity regions into selected portions of the surface of said epitaxial layer to form the injectors and the transistor base regions of the I 2 L circuits and the base regions of the linear transistors of the analog circuits; and producing N + -type conductivity regions in said base regions of the I 2 L circuit portions to form the collectors of the NPN switching transistors of the I 2 L circuits, and in the base regions of the analog circuit portions to form the emitters of the NPN linear transistors of the analog circuits; the improvement wherein said step of producing N + -type conductivity regions includes forming the N + -type conductivity emitter regions of at least one of the linear transistors of an analog circuit so that it is flat relative to the penetration depth of the N + -type conductivity collector regions of the I 2 L circuits.
Claim 3
Dependent Claim 111 words
The method defined in claim 1 wherein said step of producing N + -type conductivity regions comprises simultaneously diffusing the N + -type conductivity regions for the collectors of the I 2 L circuits and for the emitter regions of only those linear transistors of the analog circuits which are to have an emitter penetration depth at least equal to that of the penetration depth of said collectors of the I 2 L circuit; and thereafter producing N + -type conductivity emitter regions which are flat relative to said penetration depth of said collector of the I 2 L circuits for the remainder of the linear transistors of said analog circuits.
Claim 4
Dependent Claim 41 words
The method defined in claim 2 wherein said step of producing N + -type conductivity regions which are flat is carried out by an additional diffusion step wherein an N-type impurity is diffused into a portion of the associated base region.
Claim 5
Dependent Claim 52 words
The method defined in claim 3 wherein during said additional diffusion step said N-type impurity is additionally diffused into only some of the previously formed collector regions for the I 2 L circuits and emitter regions for the linear transistors of the analog circuits whereby the penetration depth of same is increased.
Claim 6
Dependent Claim 35 words
The method defined in claim 3 wherein said N-type impurity is diffused into a portion of the associated base region of only those linear transistors which had not previously been provided with an emitter region.

References Cited (Backward Citations)

US3566218A Cited
US3770519A Cited
US3810123A Cited
US3969748A Cited
US4043849A Cited
US4087900A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1983-04-08 1983-10-08 1984-04-08 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1987-04-08 1987-10-08 1988-04-08 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1991-04-08 1991-10-08 1992-04-08 $7700.00 Window Closed / Lapsed

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