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Method for the epitaxial deposition of a semiconductor material by electrical polarization of a liquid phase at constant temperature

Assignee: US Philips Corp
•
Filing: 1977-07-01
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Granted: 1979-01-09
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Expires: 1997-07-01
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Abstract

Abstract A method for the epitaxial deposition of a semiconductor by electrical polarization of a liquid phase at constant temperature. Outside the growth time the polarization is applied in the direction of the cooling by the Peltier effect with a current density which is lower than the threshold which causes the growth and which lies near same.

Inventors

  • 👤 Elie Andre

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-30 08:25
CPC Classifications
C; C30; C30B; C30B19/00; C30B19/08; C30B19/10; C30B19/103; H; H10; H10P; H10P14/00; H10P14/20; H10P14/26; H10P14/263; H10P14/265; H10P14/29; H10P14/2901; H10P14/2907; H10P14/2911; H10P14/34; H10P14/3402; H10P14/3414; H10P14/3421

Claims Analysis

Total Claims: 9
Claim 1
Independent Claim 103 words
A method for the epitaxial deposition from a liquid phase, of a layer of semiconductor compound material on a substrate, comprising the steps of providing said substrate and said liquid phase in a space and applying electrical polarization between said solid and liquid in said space which is maintained at a constant and uniform temperature, said polarization being applied so that outside the growth time of said epitaxial deposit, the polarization is in the direction which causes a cooling by the Peltier effect and with a current density which is lower than the threshold level which causes the growth of said epitaxial deposit.
Claim 2
Independent Claim 103 words
A method for the epitaxial deposition from a liquid phase, of a layer of semiconductor compound material on a substrate, comprising the steps of providing said substrate and said liquid phase in a space and applying electrical polarization between said solid and liquid in said space which is maintained at a constant and uniform temperature, said polarization being applied so that outside the growth time of said epitaxial deposit, the polarization is in the direction which causes a cooling by the Peltier effect and with a current density which is lower than the threshold level which causes the growth of said epitaxial deposit.
Claim 3
Dependent Claim 33 words
A method for the epitaxial deposition as in claim 1, wherein said polarization that is lower than said threshold level, is applied prior to the growth of said epitaxial layer on said substrate.
Claim 4
Dependent Claim 58 words
A method for the epitaxial deposition as in claim 2, wherein, after applying said polarization which is lower than said threshold level, the growth of said layer of semiconductor material is obtained by current passage in the direction which produces a cooling by Peltier effect and with a current density which lies near, but above, said threshold level.
Claim 5
Dependent Claim 34 words
A method for the epitaxial deposition as in claim 2, wherein the voltage adjustment of said polarization applied between said solid and liquid on either side of said threshold level is carried out gradually.
Claim 6
Dependent Claim 50 words
A method for the epitaxial deposition as in claim 1, wherein said polarization lower than said threshold level is applied after the growth of a first said epitaxial layer and said solid and liquid used for said growth remain in contact with each other at a constant and uniform temperature.
Claim 7
Dependent Claim 40 words
A method for the epitaxial deposition as in claim 5, wherein doping elements are incorporated in said first layer and the polarization lower than the threshold is used to modify the doping of said first layer in the surface part.
Claim 8
Dependent Claim 58 words
The method for the epitaxial deposition as in claim 1, wherein the material of said substrate and that of said liquid phase from which a layer is deposited, comprise at least two components of which at least one element is of column III of the periodic table of elements and at least another element is of column V.
Claim 9
Dependent Claim 64 words
A method for the epitaxial deposition as in claim 7, wherein said substrate consists essentially of gallium arsenide and a layer of essentially gallium aluminum arsenide is deposited from a solution in liquid gallium, such deposit being achieved by current passage in the direction which produces a cooling by Peltier effect and with a current density which lies near, but above, said threshold level.

References Cited (Backward Citations)

US2842467A Cited
US2999776A Cited
US3086857A Cited
US3268301A Cited
US3378409A Cited
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US3993511A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1982-01-08 1982-07-10 1983-01-09 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1986-01-08 1986-07-10 1987-01-09 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1990-01-08 1990-07-10 1991-01-09 $7700.00 Window Closed / Lapsed

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