US4132892A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Raster scanning ion microscope with quadrupole mass filter
Assignee: Helmholtz Zentrum München
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Filing: 1976-07-01
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Granted: 1979-01-02
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Expires: 1996-07-01
Abstract
Abstract A raster scanning ion microscope for determining, with a large field of view, the lateral distribution of elements, isotopes and compounds at the surface and in the bulk of solid specimens and for displaying the surface topography of the sample. The scanning ion microscope consists of an ion gun to produce a primary ion beam, a means to focus and raster scan the primary ion beam over the surface of the specimen, a means to form a beam of secondary ions out of all particles sputtered from the specimen, an energy analyzer and a mass spectrometer for secondary ion analysis and a means for optimum transport of the secondary ions from the specimen to the mass spectrometer. Use of a quadrupole mass filter as a mass analyzer reduces restrictions usually faced with magnetic type mass analyzer and allows imaging of the specimen with a large field of view. Moreover non-normal secondary ion extraction and/or non-normal primary ion incidence in combination with low secondary ion extraction voltages result in the capability of the instrument of displaying the surface topography of the specimen.
Inventors
- 👤 Klaus Wittmaack
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 08:47
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/252; H01J37/256; H01J37/02; H01J37/04; H01J37/10; H01J37/12
Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
110 words
In a raster scanning microscope for determining the lateral distribution of elements, isotopes and compounds at the surface and in the body of a solid specimen and composed of means to produce a primary ion beam, means positioned in the path of the primary ion beam to focus and raster scan the primary ion beam over such a specimen for producing by emission therefrom a secondary ion beam, an energy analyzer positioned in the path of the secondary ion beam, and a mass spectrometer disposed behind the energy analyzer in the path of the secondary ion beam for analysis thereof, the improvement wherein said mass spectrometer comprises a quadrupole filter.
Claim 2
Dependent Claim
110 words
In a raster scanning microscope for determining the lateral distribution of elements, isotopes and compounds at the surface and in the body of a solid specimen and composed of means to produce a primary ion beam, means positioned in the path of the primary ion beam to focus and raster scan the primary ion beam over such a specimen for producing by emission therefrom a secondary ion beam, an energy analyzer positioned in the path of the secondary ion beam, and a mass spectrometer disposed behind the energy analyzer in the path of the secondary ion beam for analysis thereof, the improvement wherein said mass spectrometer comprises a quadrupole filter.
Claim 3
Dependent Claim
23 words
Raster scanning microscope as claimed in claim 1 wherein said secondary ion beam is extracted by a voltage of less than 1 kV.
Claim 4
Dependent Claim
32 words
Raster scanning microscope as claimed in claim 2 wherein said secondary ion beam is extracted at an angle of more than 10° with respect to the surface normal of such a specimen.
Claim 5
Dependent Claim
32 words
Raster scanning microscope as claimed in claim 2 wherein the angle of incidence of the primary ion beam with respect to the surface normal of such a specimen is larger than 10°.
Claim 6
Dependent Claim
198 words
Raster scanning ion microscope for determining the lateral distribution of elements, isotopes and compound at the surface and in the body of a solid specimen, and for displaying the surface topography of said specimen comprising: (a) an ion gun for producing a primary ion beam; (b) at least one electrostatic lens positioned in the path of said primary ion beam to focus said primary ion beam on such a specimen; (c) means to raster scan said primary ion beam over the surface of such a specimen, for producing the emission of a secondary ion distribution; (d) an accelerating electrostatic lens positioned in the path of said secondary ion distribution for acceleration and imaging of said secondary ion distribution immediately subsequent to emission; (e) an electrostatic energy analyzer having an entrance aperture therein positioned in the path of said secondary ion distribution for separating a secondary ion beam from said secondary ion distribution; (f) a decelerating electrostatic lens for deceleration and imaging of said secondary ion beam disposed behind said energy analyzer; and (g) a quadrupole filter for mass analysis of said decelerated secondary ion beam, disposed behind said decelerating lens in the path of said secondary ion beam.
Claim 7
Dependent Claim
198 words
Raster scanning ion microscope for determining the lateral distribution of elements, isotopes and compound at the surface and in the body of a solid specimen, and for displaying the surface topography of said specimen comprising: (a) an ion gun for producing a primary ion beam; (b) at least one electrostatic lens positioned in the path of said primary ion beam to focus said primary ion beam on such a specimen; (c) means to raster scan said primary ion beam over the surface of such a specimen, for producing the emission of a secondary ion distribution; (d) an accelerating electrostatic lens positioned in the path of said secondary ion distribution for acceleration and imaging of said secondary ion distribution immediately subsequent to emission; (e) an electrostatic energy analyzer having an entrance aperture therein positioned in the path of said secondary ion distribution for separating a secondary ion beam from said secondary ion distribution; (f) a decelerating electrostatic lens for deceleration and imaging of said secondary ion beam disposed behind said energy analyzer; and (g) a quadrupole filter for mass analysis of said decelerated secondary ion beam, disposed behind said decelerating lens in the path of said secondary ion beam.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1982-01-01 | 1982-07-03 | 1983-01-02 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1986-01-01 | 1986-07-03 | 1987-01-02 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1990-01-01 | 1990-07-03 | 1991-01-02 | $7700.00 | Window Closed / Lapsed |