US3986025A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Ion microanalyzer
Assignee: Hitachi Ltd
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Filing: 1974-06-07
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Granted: 1976-10-12
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Expires: 1994-06-07
Abstract
Abstract In an ion microanalyzer wherein the secondary ions emitted from a sample as a result of the bombardment of the sample by a primary ion beam are mass-analyzed and selected in accordance with their mass to electric charge ratios and the selected secondary ions are then detected by a detector, the image of the secondary ions emitted from the sample is formed through the converging action of a modified electrostatic lens on a slit disposed between the mass analyzing means and the detector or in front of the mass analyzing means.
Inventors
- 👤 Mitsuo Fujiwara
- 👤 Hifumi Tamura
- 👤 Toshio Kondo
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 11:09
CPC Classifications
H; H01; H01J; H01J49/00; H01J49/26; H01J49/28; H01J49/32; H01J49/324; H01J37/00; H01J37/252; H01J37/256; H01J49/30
Claims Analysis
Total Claims: 19
Claim 1
Independent Claim
107 words
An ion microanalyzer comprising means for emitting primary ions, means for bombarding a sample with the primary ions to thereby emit secondary ions from said sample, first means for dispersing the secondary ions in accordance with their mass to electric charge ratios, means for detecting the secondary ions dispersed by said first dispersing means, and means for focusing the secondary ions in a direction perpendicular to that of the dispersion of the secondary ions more than in other directions into a predetermined position between said sample and said detecting means to thereby form an image of the secondary ions emitted from said sample on the predetermined position.
Claim 2
Dependent Claim
107 words
An ion microanalyzer comprising means for emitting primary ions, means for bombarding a sample with the primary ions to thereby emit secondary ions from said sample, first means for dispersing the secondary ions in accordance with their mass to electric charge ratios, means for detecting the secondary ions dispersed by said first dispersing means, and means for focusing the secondary ions in a direction perpendicular to that of the dispersion of the secondary ions more than in other directions into a predetermined position between said sample and said detecting means to thereby form an image of the secondary ions emitted from said sample on the predetermined position.
Claim 3
Dependent Claim
15 words
An ion microanalyzer according to claim 1, wherein said focusing means comprises an electrostatic lens.
Claim 4
Dependent Claim
38 words
An ion microanalyzer according to claim 2, further comprising a slit disposed in the predetermined position between said first dispersing means and said detecting means, said electrostatic lens being disposed between said sample and said first dispersing means.
Claim 5
Dependent Claim
20 words
An ion microanalyzer according to claim 3, wherein said first dispersing means comprises means for producing a sector-shaped magnetic field.
Claim 6
Dependent Claim
48 words
An ion microanalyzer according to claim 3, wherein said electrostatic lens is provided with a rectangular aperture having a cross section which exhibits small and large dimensions, the large dimension thereof being coincident with that of the dispersion of the secondary ions due to said first dispersing means.
Claim 7
Dependent Claim
48 words
An ion microanalyzer according to claim 3, wherein said electrostatic lens is provided with a rectangular aperture having a cross section which exhibits horizontal and vertical directions, the vertical direction thereof being coincident with that of the dispersion of the secondary ions due to said first dispersing means.
Claim 8
Dependent Claim
16 words
An ion microanalyzer according to claim 6, wherein said slit has an aperture of circular shape.
Claim 9
Dependent Claim
17 words
An ion microanalyzer according to claim 6, wherein said slit has an aperture of regular polygonal shape.
Claim 10
Dependent Claim
59 words
An ion microanalyzer according to claim 2, further comprising second means disposed between said sample and said first dispersing means for dispersing the secondary ions in accordance with their energy levels, and a slit disposed in the predetermined position between said first and second dispersing means, said electrostatic lens being disposed between said sample and said second dispersing means.
Claim 11
Dependent Claim
48 words
An ion microanalyzer according to claim 9, wherein said electrostatic lens is provided with a rectangular aperture having a cross section which exhibits small and large dimensions, the large dimension thereof being coincident with that of the dispersion of the secondary ions due to the second dispersing means.
Claim 12
Dependent Claim
48 words
An ion microanalyzer according to claim 9, wherein said electrostatic lens is provided with a rectangular aperture having a cross section which exhibits horizontal and vertical directions, the vertical direction thereof being coincident with that of the dispersion of the secondary ions due to said second dispersing means.
Claim 13
Dependent Claim
16 words
An ion microanalyzer according to claim 11, wherein said slit has an aperture of circular shape.
Claim 14
Dependent Claim
17 words
An ion microanalyzer according to claim 11, wherein said slit has an aperture of regular polygonal shape.
Claim 15
Dependent Claim
20 words
An ion microanalyzer according to claim 9, wherein said first dispersing means comprises means for producing a sector-shaped magnetic field.
Claim 16
Dependent Claim
60 words
An ion microanalyzer according to claim 14, wherein said electrostatic lens is provided with a rectangular aperture having a cross section which exhibits horizontal and vertical directions, the vertical direction thereof being coincident with that of the dispersion of the secondary ions due to said second dispersing means, and wherein said slit is provided with an aperture of circular shape.
Claim 17
Dependent Claim
60 words
An ion microanalyzer according to claim 14, wherein said electrostatic lens is provided with a rectangular aperture having a cross section which exhibits small and large dimensions, the large dimension thereof being coincident with that of the dispersion of the secondary ions due to said second dispersing means, and wherein said slit is provided with an aperture of circular shape.
Claim 18
Dependent Claim
61 words
An ion microanalyzer according to claim 14, wherein said electrostatic lens is provided with a rectangular aperture having a cross section which exhibits horizontal and vertical directions, the vertical direction thereof being coincident with that of the dispersion of the secondary ions due to said second dispersing means, and wherein said slit is provided with an aperture of regular polygonal shape.
Claim 19
Dependent Claim
61 words
An ion microanalyzer according to claim 14, wherein said electrostatic lens is provided with a rectangular aperture having a cross section which exhibits small and large dimensions, the large dimension thereof being coincident with that of the dispersion of the secondary ions due to said second dispersing means, and wherein said slit is provided with an aperture of regular polygonal shape.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1979-10-12 | 1980-04-12 | 1980-10-12 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1983-10-12 | 1984-04-12 | 1984-10-12 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1987-10-12 | 1988-04-12 | 1988-10-12 | $7700.00 | Window Closed / Lapsed |