← Back to Patent Explorer
US4115163A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of growing epitaxial semiconductor films utilizing radiant heating

Assignee: Individual
•
Filing: 1976-01-08
•
Granted: 1978-09-19
•
Expires: 1996-01-08
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract A method of growing epitaxial semiconductor films on substrates is proposed which consists in that a substrate is cleaned from damage layers and heated to a critical epitaxy temperature simultaneously by irradiating a substrate surface with an intensive luminous flux. A source material for growing a film is introduced to the substrate in a gaseous state. When producing multi-layer semiconductor structures, a substrate surface opposite to a surface exposed to the luminous flux is cooled to a temperature sufficient to prevent mutual diffusion between the film and the substrate materials. Versions of an apparatus for carrying this method into effect are also proposed. The apparatus includes a quartz chamber with a vaporizer for vaporizing the source material for film growing, a means for supporting the substrate and openings for introducing a neutral or reducing agent. The apparatus is provided with furnaces for heating the walls of the chamber. Each apparatus has a powerful light source disposed outside the chamber so as to face a working surface of the substrate support.

Inventors

  • 👤 Yulia Ivanovna Gorina
  • 👤 Galina Alexandrovna Kaljuzhnaya
  • 👤 Andrei Vasilievich Kuznetsov
  • 👤 Sergei Nikolaevich Maximovsky
  • 👤 Mikhail Borisovich Nikiforov
  • 👤 Bentsion Moiseevich Vul
  • 👤 Galina Evgenievna Ivannikova
  • 👤 Vintsentas Ionovich Denis
  • 👤 Mikolas Mikolo Yarmalis
  • 👤 Vitautas Ionovich Repshis

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-26 09:46
CPC Classifications
C; C30; C30B; C30B23/00; C30B23/02; C30B23/06; C30B23/063; C23; C23C; C23C14/00; C23C14/22; C23C14/54; C23C14/541; H; H10; H10P; H10P14/00; H10P14/20; H10P14/29; H10P14/2901; H10P14/2902; H10P14/2905; H10P14/2913; H10P14/2917; H10P14/2919; H10P14/2921; H10P14/34; H10P14/3402; H10P14/3404; H10P14/3411; H10P14/3424; H10P14/3432; H10P14/3436; H10P14/3438; H10P14/3441; H10P14/3442; H10P14/3444; Y; Y10; Y10S; Y10S148/00; Y10S148/048; Y10S148/071

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 163 words
A vapor phase method for growing epitaxial semiconductor films, in an enclosed chamber, of silicon and the type selected from the group consisting of monocrystalline, A 2 B 6 and A 4 B 6 on a substrate with a support which does not absorb radiant heat comprising: heating a working surface of said substrate in an inert atmosphere to a critical epitaxy temperature by means of radiant light having a luminous flux intensity from about 10 1 to 10 4 watts per square centimeter of substrate surface, said critical temperature sufficient to enable epitaxial growth on the working surface of said substrate; introducing a gaseous source material capable of forming a film on the working surface of said substrate exposed to the radiant light, while simultaneously force cooling the opposite side of the working surface of the substrate to a temperature gradient sufficient to prevent mutual diffusion between the film being deposited on the working surface of the substrate, and the substrate components.
Claim 2
Dependent Claim 163 words
A vapor phase method for growing epitaxial semiconductor films, in an enclosed chamber, of silicon and the type selected from the group consisting of monocrystalline, A 2 B 6 and A 4 B 6 on a substrate with a support which does not absorb radiant heat comprising: heating a working surface of said substrate in an inert atmosphere to a critical epitaxy temperature by means of radiant light having a luminous flux intensity from about 10 1 to 10 4 watts per square centimeter of substrate surface, said critical temperature sufficient to enable epitaxial growth on the working surface of said substrate; introducing a gaseous source material capable of forming a film on the working surface of said substrate exposed to the radiant light, while simultaneously force cooling the opposite side of the working surface of the substrate to a temperature gradient sufficient to prevent mutual diffusion between the film being deposited on the working surface of the substrate, and the substrate components.
Claim 3
Dependent Claim 21 words
The method of claim 1, wherein said semiconductor films are selected from the group consisting of HgCdTe, CdTe, PbTe, and PbSnTe.
Claim 4
Dependent Claim 11 words
The method of claim 1, wherein said semiconductor film is Si.
Claim 5
Dependent Claim 11 words
The method of claim 2, wherein said semiconductor film is CdTe.
Claim 6
Dependent Claim 19 words
The method of claim 2, wherein said semiconductor film is selected from the groups consisting of PbSnTe and PbTe.

References Cited (Backward Citations)

US3047438A Cited
US3208888A Cited
US3218204A Cited
US3392066A Cited
US3369989A Cited
US3619283A Cited
US3619282A Cited
US3627590A Cited
US3661637A Cited
US3862397A Cited
US3873341A Cited
US3877418A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1981-09-18 1982-03-20 1982-09-19 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1985-09-18 1986-03-20 1986-09-19 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1989-09-18 1990-03-20 1990-09-19 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag