Method for forming a narrow channel length MOS field effect transistor

Claim 2

Method for making an MOSFET device having an electrically shorter appearing channel length than its physical length comprising: providing a P-type monocrystalline silicon body; implanting P-type ions into the area designated as the source of said device; heating the body to drive the P-type ion laterally into the channel region of said device; implanting N-type ions into the source and drain regions of said device to form the source and drain of said device wherein the P-type region within said channel region is unaffected by the said N-type ions in said source and drain regions and the said N-type ions are in excess of the said P-type ions in the source region so that no P-type region exists in the source region; and providing metallurgy to connect the structure so as to form said MOSFET device.

Claim 3

The method of claim 1 wherein a depletion load MOSFET device is simultaneously formed with the said device and which utilizes the drain of the said device as an element of the depletion load device.

Claim 4

The method of claim 1 wherein said metallurgy is formed of aluminum.

Claim 5

The method of claim 1 wherein the gate metallurgy is polysilicon.

Claim 6

The method of claim 1 wherein P-type ions are implanted over the entire said body after said implanting N-type ions for field protection.

Claim 7

The method of claim 1 wherein a masking layer of silicon dioxide, silicon nitride, silicon dioxide is provided on the surface of said body to aid in restricting said implanting ions to the desired areas of said silicon body.

Claim 8

Method for making an MOSFET device having an electrically shorter appearing channel length than its physical length comprising: providing a P-type monocrystalline silicon body; depositing an inorganic masking layer over one surface of said body; removing the said masking layer in the area designated to be the source of said device; implanting P-type ions into the said area designated as the source of said device; heating the body to drive the P-type ion laterally into the channel region of said device; providing opening to area designated as the drain of said device; implanting N-type ions into the said source and drain regions of said device to form the source and drain of said device wherein the P-type region within said channel region is unaffected by the said N-type ions in said source and drain regions and the said N-type ions are in excess of the said P-type ions in the source region so that no P-type region exists in the source region; and providing metallurgy to connect the structure so as to form said MOSFET device.

Claim 9

Method for making an MOSFET device having an electrically shorter appearing channel length than its physical length comprising: providing a P-type monocrystalline silicon body; depositing an inorganic masking layer over one surface of said body; removing the said masking layer in the area designated to be the source of said device; implanting P-type ions into the said area designated as the source of said device; heating the body to drive the P-type ion laterally into the channel region of said device; providing opening to area designated as the drain of said device; implanting N-type ions into the said source and drain regions of said device to form the source and drain of said device wherein the P-type region within said channel region is unaffected by the said N-type ions in said source and drain regions and the said N-type ions are in excess of the said P-type ions in the source region so that no P-type region exists in the source region; and providing metallurgy to connect the structure so as to form said MOSFET device.

Claim 10

The method of claim 7 wherein a depletion load MOSFET device is simultaneously formed with the said device and which utilizes the drain of the said device as an element of the depletion load device.

Claim 11

The method of claim 7 wherein the said masking layer is composed of sequentially formed layers of silicon dioxide, silicon nitride and silicon dioxide.

Claim 12

The method of claim 9 wherein the said masking layer is removed following said implanting N-type ion step in areas other than the channel of said device; growing a field silicon dioxide on the silicon body in said areas other than said channel of said device; removing said masking layer from over said channel; and regrowing the silicon dioxide gate insulator.

Claim 13

The method of claim 10 wherein a depletion load MOSFET device is simultaneously formed with said device and which utilizes the drain of said device as an element of the depletion load device.

Claim 14

The method of claim 10 wherein an N-type ion is implanted in the said channel after said regrown silicon dioxide gate insulator step for depletion threshold adjustment.

Claim 15

The method of claim 12 wherein a P-type ion is implanted over the entire body for field protection.

Claim 16

The method of claim 13 wherein said N-type ion is phosphorus and said P-type ion is boron.

Claim 17

The method of claim 10 wherein said metallurgy is formed of aluminum.

Claim 18

The method of claim 10 wherein gate metallurgy is formed of polysilicon.

Claim 19

Method for making an MOSFET device having an electrically shorter appearing channel length than its physical length comprising: providing an N-type monocrystalline silicon body; implanting N-type ions into the area designated as the source of said device; heating the body to drive the N-type ion laterally into the channel region of said device; implanting P-type ions into the source and drain regions of said device to form the source and drain of said device wherein the N-type region within said channel region is unaffected by the said P-type ions in said source and drain regions and P-type ions are in excess of the said N-type ions in the source region so that no N-type region exists in the source region; and providing metallurgy to connect the structure so as to form said MOSFET device.

Claim 20

Method for making an MOSFET device having an electrically shorter appearing channel length than its physical length comprising: providing an N-type monocrystalline silicon body; implanting N-type ions into the area designated as the source of said device; heating the body to drive the N-type ion laterally into the channel region of said device; implanting P-type ions into the source and drain regions of said device to form the source and drain of said device wherein the N-type region within said channel region is unaffected by the said P-type ions in said source and drain regions and P-type ions are in excess of the said N-type ions in the source region so that no N-type region exists in the source region; and providing metallurgy to connect the structure so as to form said MOSFET device.

Claim 21

Method for making a depletion mode MOSFET device having an electrically shorter appearing channel length than its physical length comprising: providing a P-type monocrystalline silicon body; implanting P-type ions into the area designated as the source of said device; heating the body to drive the P-type ion laterally into the channel region of said device; implanting N-type ions into the source and drain regions of said device to form the source and drain of said device wherein the P-type region within said channel region is unaffected by the said N-type ions in said source and drain regions; implanting N-type ions into the said channel for depletion threshold adjustment; and providing metallurgy to connect the structure so as to form said MOSFET device.

Claim 22

Method for making a depletion mode MOSFET device having an electrically shorter appearing channel length than its physical length comprising: providing a P-type monocrystalline silicon body; implanting P-type ions into the area designated as the source of said device; heating the body to drive the P-type ion laterally into the channel region of said device; implanting N-type ions into the source and drain regions of said device to form the source and drain of said device wherein the P-type region within said channel region is unaffected by the said N-type ions in said source and drain regions; implanting N-type ions into the said channel for depletion threshold adjustment; and providing metallurgy to connect the structure so as to form said MOSFET device.

Claim 23

The method of claim 18 wherein the dosage of said N-type ions into said channel is between about 10 10 to 10 12 /cm 2 at an energy of between about 50 to 300 KeV.

Claim 24

The method of claim 19 wherein the N-type ions were phosphorous and the structure was annealed to thermally drive in the threshold adjustment junction channel implant to a depth of about 0.5 micrometers.