Scanning auger microprobe with variable axial aperture

Claim 2

In a single pass scanning Auger electron analyzer wherein Auger electrons emitted from an irradiated sample pass through a cylindrical mirror analyzer and are analyzed and focused at the axis of the cylindrical mirror analyzer to be detected, the improvement comprising a support member mounted transverse to and extending across the diameter of the inner cylinder of the cylindrical mirror analyzer adjacent to the focus point of said electrons, said support member defining a first opening therethrough along the axis of the cylindrical mirror analyzer for passage of analyzed electrons, a variably sizable exit aperture assembly mounted to said support member, said exit aperture assembly including plate means movable transversely with respect to said cylindrical mirror analyzer, said plate means by movement thereof relative to said support member defining a plurality of different size openigs therethrough in axial alignment with the openins in said support member, and control means external to said cylindrical mirror analyzer including linking means operatively joined to said plate means for moving said plate means relative to said support member.

Claim 3

The improvement in accordance with claim 1 wherein said exit aperture asembly plate means is a single plate member mounted to said support member for pivotal movement with respect thereto, said plate member defining a plurality of spaced different size openings therethrough.

Claim 4

The improvement in accordance with claim 2 wherein detent means are mounted to said support member in position to engage edge portions of said single plate member so that said openings in said plate member are selective alignable with said first opening.

Claim 5

The improvement in accordance with claim 3 wherein said detent means include stop members positioned on said support members at remote ends of the pivotal travel of said plate member to intercept and block motion of said plate member thereby to align different size openings in said plate member with said first opening.

Claim 6

The improvement in accordance with claim 2 wherein one of said openings in said plate members is larger than said first opening in said support member.

Claim 7

The improvement in accordance with claim 2 wherein the plate member is mounted on the internally facing side of said support member and said openings in said plate are in the shape of a truncated cone with the larger open face of said openings toward said analyzer.

Claim 8

The improvement in accordance with claim 4 wherein said detent means includes a pivotally mounted arm assembly mounted to said support member, bias means resiliently forcing a portion of said arm assembly into engagement with an edge portion of said plate member, said plate member defining at least one recess in the edge engaged by said arm assembly to thereby defined an opening alignment.

Claim 9

The improvement in accordance with claim 1 wherein said exit aperture assembly plate means includes first and second movable plate members mounted to said support member and in at least partial lapping arrangement with respect to one another, portions of said first and second plate members defining jointly an opening therethrough centered on the axis of the cylindrical mirror analyzer.

Claim 10

The improvement in accordance with claim 8 wherein each of said plate members defines an opening therethrough that overlap in part one another with the side of each opening in the first and second plate members that overlap defining the joint opening therethrough, the sides of the openings toward one another having a right angle configuration.

Claim 11

The improvement in accordance with claim 8 wherein the first plate member towards the interior of the cylindrical mirror analyzer has a chamfered edge opening towards the interior of the cylindrical mirror analyzer and the second plate member has a chamfered edge opening towards the exterior side of said cylindrical mirror analyzer.

Claim 12

The improvement in accordance with claim 8 wherein parrallel edges of said first and second plate members define respectively first and second racks and said control means includes first and second pinions mounted to said support member and engaging said first and second racks respectively, said first and second pinions linked to one another so that they rotate in opposite directions to one another thereby moving said first and second plate members in opposite directions to one another.

Claim 13

The improvement according to claim 11 wherein said pinions engage one another.

Claim 14

In a single pass scanning Auger electron analyzer wherein Auger electrons emitted from an irradiated sample pass through a cylindrical mirror analyzer and are analyzed and focused at the axis of the cylindrical mirror analyzer to be detected, the improvement comprising variable size exit aperture means adjacent the focus point of said electrons, said aperture means including a first plate member mounted in transverse relationship to the inner tube member of said cylindrical mirror analyzer, said first plate member defining an opening therethrough of a first predetermined size in alignment with the axis of said cylindrical mirror analyzer, shutter means, said shutter means compising a second plate member mounted for pivotal movement to a face of said first plate member, said second plate member defining first, second, and third openings therethrough, said first opening being greater in diameter than the opening in said first plate member and said second and third openings being smaller than said first plate opening and of a different size from one another, control means external to said cylindrical mirror analyzer and linked to said shutter plate for pivoting and indexing same selectively to align the openings in said shutter plate with said opening in said first plate.

Claim 15

In a single pass scanning Auger electron analyzer wherein Auger electrons emitted from an irradiated sample pass through a cylindrical mirror analyzer and are analyzed and focused at the axis of the cylindrical mirror analyzer to be detected, the improvement comprising variable size exit aperture means adjacent the focus point of said electrons, said aperture means including a first plate member mounted in transverse relationship to the inner tube member of said cylindrical mirror analyzer, said first plate member defining an opening therethrough of a first predetermined size in alignment with the axis of said cylindrical mirror analyzer, shutter means, said shutter means compising a second plate member mounted for pivotal movement to a face of said first plate member, said second plate member defining first, second, and third openings therethrough, said first opening being greater in diameter than the opening in said first plate member and said second and third openings being smaller than said first plate opening and of a different size from one another, control means external to said cylindrical mirror analyzer and linked to said shutter plate for pivoting and indexing same selectively to align the openings in said shutter plate with said opening in said first plate.

Claim 16

The improvement in accordance with claim 13 wherein said openings are in the shape of truncated cones with the narrow portions of the openings in said shutter means toward the opening in said first plate member.