Abstract This disclosure is directed to an integrated semiconductor structure with combined dielectric and PN junction isolation including the fabrication method therefor wherein a compensating P type channel is formed adjacent to the dielectric side isolation across one end portion of the electrically isolated N type collector region as well as around the bottom portion of the dielectric side isolation material or layer in order to overcome the N channel inversion (in P type semiconductor material) that is formed when the dielectric isolation material is silicon dioxide. The disclosed structure is an NPN transistor device having a buried sub-collector region of N+ type conductivity and further includes a P type substrate thereby providing a PN junction isolating substrate. The silicon dioxide material or layer is used to electrically isolate the side portions of the NPN transistor device from adjacent devices. The side dielectric isolation region is formed in a substantially V-shaped configuration with polycrystalline silicon forming the material located within the dielectric V-shaped member thereby providing a substantially planar surface for the integrated semiconductor structure.
A method for fabricating an integrated semiconductor structure comprising the steps of: forming a region of N+-type conductivity on a semiconductor substrate of P-type conductivity; epitaxially growing a region of N-type conductivity on said region of N+-type conductivity; etching at least one moat through said N+ and N-type regions into said P-type semiconductor substrate surrounding a region of semiconductor material containing said N+ and N-type regions; forming at least one region of P-type conductivity in said N-type conductivity region adjacent said moat; forming a second region of N+-type conductivity in said P-type conductivity region adjacent said moat; forming a P-type channel in said P-type substrate and said N-type region adjacent to said moat; and filling in said moat with material having a coefficient of thermal expansion similar to the coefficient of thermal expansion of said semiconductor substrate.
Claim 2
Independent Claim
137 words
A method for fabricating an integrated semiconductor structure comprising the steps of: forming a region of N+-type conductivity on a semiconductor substrate of P-type conductivity; epitaxially growing a region of N-type conductivity on said region of N+-type conductivity; etching at least one moat through said N+ and N-type regions into said P-type semiconductor substrate surrounding a region of semiconductor material containing said N+ and N-type regions; forming at least one region of P-type conductivity in said N-type conductivity region adjacent said moat; forming a second region of N+-type conductivity in said P-type conductivity region adjacent said moat; forming a P-type channel in said P-type substrate and said N-type region adjacent to said moat; and filling in said moat with material having a coefficient of thermal expansion similar to the coefficient of thermal expansion of said semiconductor substrate.
Claim 3
Dependent Claim
18 words
The method of claim 1, where the etching of said moat comprises anisotropic etching of a V-shaped moat.
Claim 4
Dependent Claim
15 words
The method of claim 1 including the step of filling the moat with polycrystalline silicon.
Claim 5
Dependent Claim
28 words
A method in accordance with claim 3 further including the step of forming a silicon dioxide layer in the moat prior to filling the moat with polycrystalline silicon.
Claim 6
Dependent Claim
24 words
The method of claim 1, including the step of diffusing or ion implanting said P-type channel prior to the step of filling said moat.