Claims Analysis
Total Claims: 29
Claim 1
Independent Claim
105 words
A long-term-storage CIJ optical memory device comprising: transparent conductor means forming a front surface of the device; insulation means contiguous to the back of the transparend conductor means for storing charges, said insulation means containing a storage interface capable of trapping charges thereat, said insulation means being susceptible to tunneling between storage interface and a back surface of the insulation means; semiconductor means having a front surface and rectifying junction; said semiconductor means having an inversion stop grid means associated with the front surface thereof; and contact means for connecting external voltages to first and second sides of the rectfying junction for biasing the junction.
Claim 2
Dependent Claim
105 words
A long-term-storage CIJ optical memory device comprising: transparent conductor means forming a front surface of the device; insulation means contiguous to the back of the transparend conductor means for storing charges, said insulation means containing a storage interface capable of trapping charges thereat, said insulation means being susceptible to tunneling between storage interface and a back surface of the insulation means; semiconductor means having a front surface and rectifying junction; said semiconductor means having an inversion stop grid means associated with the front surface thereof; and contact means for connecting external voltages to first and second sides of the rectfying junction for biasing the junction.
Claim 3
Dependent Claim
30 words
The apparatus of claim 1 wherein the insulation means comprises front and back insulating layers and wherein the storage interface is an interface between the front and back insulating layers.
Claim 4
Dependent Claim
31 words
The apparatus of claim 2 wherein: the front insulating layer is a relatively thick layer of silicon nitride; and the back insulating layer is a relatively thin layer of silicon oxide.
Claim 5
Dependent Claim
26 words
The apparatus of claim 3 wherein the silicon nitride is on the order of 500 A thick and the silicon oxide is about 20 A thick.
Claim 6
Dependent Claim
30 words
The apparatus of claim 1 wherein: the semiconductor means comprises a front semiconductor region of a first conductivity type; and the inversion-stop grid means defines a plurality of memory cells.
Claim 7
Dependent Claim
33 words
The apparatus of claim 5 wherein the inversion stop grid means comprises semiconductor material having the same conductivity type as the front semiconductor region, but being more heavily doped than said front region.
Claim 8
Dependent Claim
35 words
The apparatus of claim 5 wherein the semiconductor means further comprises a second semiconductor region of a second conductivity type; and wherein an interface between the front and second semiconductor regions constitutes the rectifying junction.
Claim 9
Dependent Claim
31 words
The apparatus of claim 7 wherein the contact means comprises: an ohmic contact to the front semiconductor region; and back conductor means forming an ohmic contact with the second semiconductor region.
Claim 10
Dependent Claim
37 words
The apparatus of claim 7 further comprising a third semiconductor region contiguous to the back of the second semiconductor region, said third region being of the second conductivity type but more heavily doped than the second region.
Claim 11
Dependent Claim
41 words
The apparatus of claim 9 wherein: an ohmic contact to the front semiconductor region comprises a contact to the first side of the rectifying junction; and the third semiconductor region constitutes a contact to the second side of the rectifying junction.
Claim 12
Dependent Claim
23 words
The apparatus of claim 10 wherein the front semiconductor region is n-type silicon and the second and third semiconductor regions are p-type silicon.
Claim 13
Dependent Claim
18 words
The apparatus of claim 5 wherein the inversion stop semiconductor grid is inlaid into the front semiconductor region.
Claim 14
Dependent Claim
127 words
An optical memory system comprising: a CIJ optical memory device as in claim 12; first d.c. voltage supply means connected across the contact means for maintaining the rectifying junction back biased; second variable d.c. voltage supply means connected between the transparent conductor and the front semiconductor region for establishing bias electric fields across the insulating means; light beam addressing means for delivering a light beam to a selected memory cell; light beam supply means for producing a light beam whose intensity is modulated by the information to be stored; and memory control means for coordinating the operation of the first and second voltage supply means and the light beam addressing means and light beam supply means to provide long term data storage in the CIJ memory device.
Claim 15
Dependent Claim
218 words
A long-term-storage CIJ memory device having a layered structure and comprising: transparent conductor means forming a front surface of the device; front insulating layer means adjacent the transparent conductor; a back insulating layer means adjacent the front insulating layer, for permitting a significant tunneling current to flow therethrough when an electric field across the insulating layer means is enhanced by the concentration of charges in the vicinity of the back surface of the back layer, but for preventing the flow of significant tunneling current when the field is applied without the presence of a concentration of charges in the vicinity of the back surface of the layer; a front semiconductor region of a first conductivity type adjacent to the back surface of the second insulating layer, and having an ohmic contact thereto; inversion stop grid means associated with the front surface of the front semiconductor region for preventing the formation of inversion regions at the front surface of the front semiconductor region which extend across lines of the grid means; a back semiconductor region of a second conductivity type adjacent the back edge of the front region for forming a rectifying junction with the first region; and back conductor means forming an ohmic contact to the back semiconductor region for collecting any current flowing across the rectifying junction.
Claim 16
Dependent Claim
218 words
A long-term-storage CIJ memory device having a layered structure and comprising: transparent conductor means forming a front surface of the device; front insulating layer means adjacent the transparent conductor; a back insulating layer means adjacent the front insulating layer, for permitting a significant tunneling current to flow therethrough when an electric field across the insulating layer means is enhanced by the concentration of charges in the vicinity of the back surface of the back layer, but for preventing the flow of significant tunneling current when the field is applied without the presence of a concentration of charges in the vicinity of the back surface of the layer; a front semiconductor region of a first conductivity type adjacent to the back surface of the second insulating layer, and having an ohmic contact thereto; inversion stop grid means associated with the front surface of the front semiconductor region for preventing the formation of inversion regions at the front surface of the front semiconductor region which extend across lines of the grid means; a back semiconductor region of a second conductivity type adjacent the back edge of the front region for forming a rectifying junction with the first region; and back conductor means forming an ohmic contact to the back semiconductor region for collecting any current flowing across the rectifying junction.
Claim 17
Dependent Claim
203 words
A CIJ optical memory system comprising: memory device support disc means for supporting a plurality of CIJ optical memory devices on at least one side thereof, each of said CIJ optical memory devices comprising: transparent conductor means forming a front surface of the device; insulation means contiguous to the back of the transparent conductor means for storing charges, said insulation means containing a storage interface capable of trapping charges thereat, said insulation means being susceptible to tunneling between the storage interface and a back surface of the insulation means; semiconductor means having a front surface and a rectifying junction; said semiconductor means having an inversion stop grid means associated with the front surface thereof; contact means for connecting external voltages to first and second sides of the rectifying junction for biasing the junction; disc suspension means for rotatably supporting the disc means to allow the disc means to be rotated to align a selected memory cell with an input-output position; disc drive means for rotating the disc to a selected position; light source means at the input-output position for providing a memory activating light beam; and said light source means being radially movable for aligning the light beam with a selected memory cell.
Claim 18
Dependent Claim
203 words
A CIJ optical memory system comprising: memory device support disc means for supporting a plurality of CIJ optical memory devices on at least one side thereof, each of said CIJ optical memory devices comprising: transparent conductor means forming a front surface of the device; insulation means contiguous to the back of the transparent conductor means for storing charges, said insulation means containing a storage interface capable of trapping charges thereat, said insulation means being susceptible to tunneling between the storage interface and a back surface of the insulation means; semiconductor means having a front surface and a rectifying junction; said semiconductor means having an inversion stop grid means associated with the front surface thereof; contact means for connecting external voltages to first and second sides of the rectifying junction for biasing the junction; disc suspension means for rotatably supporting the disc means to allow the disc means to be rotated to align a selected memory cell with an input-output position; disc drive means for rotating the disc to a selected position; light source means at the input-output position for providing a memory activating light beam; and said light source means being radially movable for aligning the light beam with a selected memory cell.
Claim 19
Independent Claim
245 words
A method of writing information into a selected cell of a CIJ optical memory device which device comprises transparent conductor means forming a front surface of the device, insulation means contiguous to the back of the traNsparent conductor means for storing charges, said insulation means containing a storage interface capable of trapping charges thereat, said insulation means being susceptible to tunneling between the storage interface and a back surface of the insulation means, semiconductor means having a front surface and a rectifying junction, said semiconductor means having an inversion stop grid means associated with the front surface thereof, contact means for connecting external voltages to first and second sides of the rectifying junction for biasing the junction; said method comprising the steps of: applying a write voltage across the CIJ insulation means to induce a depletion region in the semiconductor means adjacent the semiconductor-means/insulation-means interface, at least a portion of the depletion region being capable of being inverted; and illuminating the selected cell with a light beam which is intensely modulated by the information to be stored in the selected cell, in order to photogenerate hole-electron pairs to invert the invertable portion of the depletion region in accordance with the light intensity, the charge in said invertable region in combination with the write voltage inducing tunneling between the semiconductor-means/insulation-means interface and the storage interface in accordance with the light intensity to trap charge at the storage interface in accordance with the information to be stored.
Claim 20
Independent Claim
245 words
A method of writing information into a selected cell of a CIJ optical memory device which device comprises transparent conductor means forming a front surface of the device, insulation means contiguous to the back of the traNsparent conductor means for storing charges, said insulation means containing a storage interface capable of trapping charges thereat, said insulation means being susceptible to tunneling between the storage interface and a back surface of the insulation means, semiconductor means having a front surface and a rectifying junction, said semiconductor means having an inversion stop grid means associated with the front surface thereof, contact means for connecting external voltages to first and second sides of the rectifying junction for biasing the junction; said method comprising the steps of: applying a write voltage across the CIJ insulation means to induce a depletion region in the semiconductor means adjacent the semiconductor-means/insulation-means interface, at least a portion of the depletion region being capable of being inverted; and illuminating the selected cell with a light beam which is intensely modulated by the information to be stored in the selected cell, in order to photogenerate hole-electron pairs to invert the invertable portion of the depletion region in accordance with the light intensity, the charge in said invertable region in combination with the write voltage inducing tunneling between the semiconductor-means/insulation-means interface and the storage interface in accordance with the light intensity to trap charge at the storage interface in accordance with the information to be stored.
Claim 21
Independent Claim
218 words
A method of reading information out of a selected memory cell of a CIJ optical memory device, which device comprises transparent conductor means forming a front surface of the device, insulation means contiguous to the back of the transparent conductor means for storing charges, said insulation means containing a storage interface capable of trapping charges thereat, said insulation means being susceptible to tunneling between the storage interface and a back surface of the insulation means, semiconductor means having a front surface and a rectifying junction, said semiconductor means having an inversion stop grid means associated with the front surface thereof, contact means for connecting external voltages to first and second sides of the rectifying junction for biasing the junction, said method comprising the steps of: backbiasing the CIJ rectifying junction; applying a read voltage across the CIJ insulating means to induce a depletion region in the semiconductor means at each storage cell which is uncharged; illuminating with a reading light beam the selected memory cell, the extent of which is limited by the inversion stop grid means; and monitoring the current collected by the reverse biased rectifying junction to determine the extent of any depletion region in the semiconductor means at the semiconductor-means/insulation-means interface, thereby determining the charge and thus the information stored in the cell being read.
Claim 22
Independent Claim
218 words
A method of reading information out of a selected memory cell of a CIJ optical memory device, which device comprises transparent conductor means forming a front surface of the device, insulation means contiguous to the back of the transparent conductor means for storing charges, said insulation means containing a storage interface capable of trapping charges thereat, said insulation means being susceptible to tunneling between the storage interface and a back surface of the insulation means, semiconductor means having a front surface and a rectifying junction, said semiconductor means having an inversion stop grid means associated with the front surface thereof, contact means for connecting external voltages to first and second sides of the rectifying junction for biasing the junction, said method comprising the steps of: backbiasing the CIJ rectifying junction; applying a read voltage across the CIJ insulating means to induce a depletion region in the semiconductor means at each storage cell which is uncharged; illuminating with a reading light beam the selected memory cell, the extent of which is limited by the inversion stop grid means; and monitoring the current collected by the reverse biased rectifying junction to determine the extent of any depletion region in the semiconductor means at the semiconductor-means/insulation-means interface, thereby determining the charge and thus the information stored in the cell being read.
Claim 23
Independent Claim
189 words
A method of sensing information stored in a CIJ memory device, which device comprises transparent conductor means forming a front surface of the device, insulation means contiguous to the back of the transparent conductor means for storing charges, said insulation means containing a storage interface capable of trapping charges thereat, said insulation means being susceptible to tunneling between the storage interface and a back surface of the insulation means, semiconductor means having a front surface and a rectifying junction, said semiconductor means having an inversion stop grid means associated with the front surface thereof, contact means for connecting external voltages to first and second sides of the rectifying junction for biasing the junction, wherein the information is stored in the form of charges in the insulating layer overlying the semiconductor material, said method comprising the steps of: injecting minority carriers in the semiconductor material; and sensing the direction of flow of the carriers perpendicular to the interface between the insulating layer and the semIconductor material to determine the extent of any depletion region in the vicinity to the semiconductor-means/insulation-means interface to determine the charge trapped at the storage interface.
Claim 24
Independent Claim
189 words
A method of sensing information stored in a CIJ memory device, which device comprises transparent conductor means forming a front surface of the device, insulation means contiguous to the back of the transparent conductor means for storing charges, said insulation means containing a storage interface capable of trapping charges thereat, said insulation means being susceptible to tunneling between the storage interface and a back surface of the insulation means, semiconductor means having a front surface and a rectifying junction, said semiconductor means having an inversion stop grid means associated with the front surface thereof, contact means for connecting external voltages to first and second sides of the rectifying junction for biasing the junction, wherein the information is stored in the form of charges in the insulating layer overlying the semiconductor material, said method comprising the steps of: injecting minority carriers in the semiconductor material; and sensing the direction of flow of the carriers perpendicular to the interface between the insulating layer and the semIconductor material to determine the extent of any depletion region in the vicinity to the semiconductor-means/insulation-means interface to determine the charge trapped at the storage interface.
Claim 25
Independent Claim
182 words
A method of writing information into a CIJ memory comprising transparent conductor means forming a front surface of the device, insulation means contiguous to the back of the transparent conductor means for storing charges, said insulation means containing a storage interface capable of trapping charges thereat, said insulation means being susceptible to tunneling between the storage interface and a back surface of the insulation means, semiconductor means having a front surface and a rectifying junction, said semiconductor means having an inversion stop grid means associated with the front surface thereof, contact means for connecting external voltages to first and second sides of the rectifying junction for biasing the junction; said method comprising the steps: inducing an invertible depletion region in the semiconductor means adjacent to the insulation means; photogenerating whole-electron pairs behind the cells where the information is to be written; collecting carriers at the insulating means-semiconductor means interface until an electric field of sufficient strength to induce tunneling in the insulator means develops, whereby charges are trapped at the CIJ storage interface in the cell where information is to be written.
Claim 26
Independent Claim
182 words
A method of writing information into a CIJ memory comprising transparent conductor means forming a front surface of the device, insulation means contiguous to the back of the transparent conductor means for storing charges, said insulation means containing a storage interface capable of trapping charges thereat, said insulation means being susceptible to tunneling between the storage interface and a back surface of the insulation means, semiconductor means having a front surface and a rectifying junction, said semiconductor means having an inversion stop grid means associated with the front surface thereof, contact means for connecting external voltages to first and second sides of the rectifying junction for biasing the junction; said method comprising the steps: inducing an invertible depletion region in the semiconductor means adjacent to the insulation means; photogenerating whole-electron pairs behind the cells where the information is to be written; collecting carriers at the insulating means-semiconductor means interface until an electric field of sufficient strength to induce tunneling in the insulator means develops, whereby charges are trapped at the CIJ storage interface in the cell where information is to be written.
Claim 27
Dependent Claim
38 words
The method recited in claim 19 wherein the depth of said invertible region is such that the inversion stop grid means divides the invertible region into individual invertible regions which are limited by the inversion stop grid means.
Claim 28
Independent Claim
182 words
A method of reading information out of a selected CIJ memory cell of a CIJ memory comprising transparent conductor means forming a front surface of the device, insulation means contiguous to the back of the transparent conductor means for storing charges, said insulation means containing a storage interface capable of trapping charges thereat, said insulation means being susceptible to tunneling between the storage interface and a back surface of the insulation means, semiconductor means having a front surface and a rectifying junction, said semiconductor means having an inversion stop grid means associated with the front surface thereof, contact means for connecting external voltages to first and second sides of the rectifying junction for biasing the junction, said method comprising the steps: backbiasing the rectifying junction; inducing a depletion region in the semiconductor means behind the memory cells not storing charge; injecting minority carriers into the semiconductor region behind the memory cell to be read; collecting the current flowing across the backbias rectifying junction; and determining from the magnitude of the collected current whether there was charge stored at the selected memory cell.
Claim 29
Independent Claim
182 words
A method of reading information out of a selected CIJ memory cell of a CIJ memory comprising transparent conductor means forming a front surface of the device, insulation means contiguous to the back of the transparent conductor means for storing charges, said insulation means containing a storage interface capable of trapping charges thereat, said insulation means being susceptible to tunneling between the storage interface and a back surface of the insulation means, semiconductor means having a front surface and a rectifying junction, said semiconductor means having an inversion stop grid means associated with the front surface thereof, contact means for connecting external voltages to first and second sides of the rectifying junction for biasing the junction, said method comprising the steps: backbiasing the rectifying junction; inducing a depletion region in the semiconductor means behind the memory cells not storing charge; injecting minority carriers into the semiconductor region behind the memory cell to be read; collecting the current flowing across the backbias rectifying junction; and determining from the magnitude of the collected current whether there was charge stored at the selected memory cell.