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US3855583A Expired / Lapsed US ⏱️ 0.0 years remaining

Conductor-insulator-junction (cij) optical memory device and a memory system dependent thereon

Assignee: Boeing North American Inc
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Filing: 1973-06-04
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Granted: 1974-12-17
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Expires: 1993-06-04
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Abstract

Abstract An optically activated (write and read) semiconductor memory employing a conductor-insulator-junction (CIJ) structure is disclosed. The layered memory structure comprises a front transparent conductive layer; insulator means containing a storage interface capable of trapping charges thereat, said insulator means being susceptible to tunneling between the storage interface and a back surface of the insulator means; semiconductor means having a front surface and a rectifying junction, said semiconductor means having an inversion stop grid means associated with the front surface thereof, and contact means for connecting external voltages to both sides of the rectifying junction for biasing the junction. The insulator means preferably comprises a relatively thick silicon nitride layer and a relatively thin silicon oxide layer, where the storage interface is the interface between the nitride and the oxide. The semiconductor means preferably comprises successive n-type and ptype regions with a pn junction therebetween. The inversion stop grid is preferably a grid of more heavily doped semiconductor of the same conductivity type as the front surface of the semiconductor. The grid divides the memory device into individual memory cells. The contact means preferably comprises an ohmic contact to the edge of the front semiconductor region and a back electrode making ohmic contact with the other semiconductor region. To write information into the memory device, a write voltage on the order of eighty volts is established between the transparent conductor and the front semiconductor region. This establishes individual inversion regions along the front surface of the semiconductor, the individual regions being isolated by the high conductivity grid. A light beam for which h 3/4 >Egap of the semiconductor is focused on the individual regions in which a charge (binary one) is to be stored. The light beam generates holeelectron pairs within the front semiconductor region. Because of the inversion region, the carriers which would be minority carriers in the first semiconductor region drift to the semiconductorinsulator interface. These charges cause a tunneling electric field to be established between the storage interface and the insulator back surface. This field induces a tunneling current which neutralizes part of the collected charge and establishes trapped storage charges at the storage interface. No significant tunneling occurs where the writing beam does not impinge. Information is read out by back biasing the pn-junction and establishing a voltage on the order of 3 volts between the transparent conductor and the front semiconductor region. The resulting electric field establishes individual inversion regions in the front semiconductor region behind those storage sites (memory cells) which do not have any significant charge stored at the storage interface. No inversion regions are established under the storage sites which store significant charge. A reading light beam having h 3/4 >Egap is scanned across the structure to read the stored data. The minority carriers generated by the light beam drift in opposite directions in accordance with the existence or nonexistence of an inversion region. Where there is an inversion region, the minority carriers diffuse to the semiconductor-insulator interface and there is a minimum pnjunction current and a minimum output current from the back electrode. Where there is no inversion region the minority carriers drift to the pn-junction and produce a maximum pnjunction current and a maximum output current from the back electrode. This system provides long term storage of data and nondestructive readout. Data is erased by applying an erase voltage of opposite polarity to the write voltage across the insulation means. The opposite polarity of the voltage causes electrons to collect at the semiconductor insulator interface and tunnel to the storage interface so that the charge stored at the storage interface is neutralized, thus erasing the stored data. This process produces block erasing. If it is desired to preserve some of the data within a memory block which is to be erased, then that data must be read out, stored, and rewritten after the memory block has been erased. In the memory system employing the CIJ device the writing beam is digitally controlled to write desired data into the memory structure. Light emitting diodes (LED''s) are the preferred light source, with Ga1-xAlxAs the preferred diode material because of its high energy output. The memory structure is preferably mounted on a rotatable disc so that a limited number of light sources can be used for writing into and reading out of a much greater number of storage cells. A 20 inch diameter disc, having memory units over 350* can store 9.24 X 1010 bits of data using the CIJ memory device.

Inventors

  • 👤 R Gudmundsen

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-28 01:24
CPC Classifications
H; H10; H10F; H10F39/00; H10F39/10; H10F39/12; H10F39/18; G; G11; G11C; G11C13/00; G11C13/04; G11C13/048

Claims Analysis

Total Claims: 29
Claim 1
Independent Claim 105 words
A long-term-storage CIJ optical memory device comprising: transparent conductor means forming a front surface of the device; insulation means contiguous to the back of the transparend conductor means for storing charges, said insulation means containing a storage interface capable of trapping charges thereat, said insulation means being susceptible to tunneling between storage interface and a back surface of the insulation means; semiconductor means having a front surface and rectifying junction; said semiconductor means having an inversion stop grid means associated with the front surface thereof; and contact means for connecting external voltages to first and second sides of the rectfying junction for biasing the junction.
Claim 2
Dependent Claim 105 words
A long-term-storage CIJ optical memory device comprising: transparent conductor means forming a front surface of the device; insulation means contiguous to the back of the transparend conductor means for storing charges, said insulation means containing a storage interface capable of trapping charges thereat, said insulation means being susceptible to tunneling between storage interface and a back surface of the insulation means; semiconductor means having a front surface and rectifying junction; said semiconductor means having an inversion stop grid means associated with the front surface thereof; and contact means for connecting external voltages to first and second sides of the rectfying junction for biasing the junction.
Claim 3
Dependent Claim 30 words
The apparatus of claim 1 wherein the insulation means comprises front and back insulating layers and wherein the storage interface is an interface between the front and back insulating layers.
Claim 4
Dependent Claim 31 words
The apparatus of claim 2 wherein: the front insulating layer is a relatively thick layer of silicon nitride; and the back insulating layer is a relatively thin layer of silicon oxide.
Claim 5
Dependent Claim 26 words
The apparatus of claim 3 wherein the silicon nitride is on the order of 500 A thick and the silicon oxide is about 20 A thick.
Claim 6
Dependent Claim 30 words
The apparatus of claim 1 wherein: the semiconductor means comprises a front semiconductor region of a first conductivity type; and the inversion-stop grid means defines a plurality of memory cells.
Claim 7
Dependent Claim 33 words
The apparatus of claim 5 wherein the inversion stop grid means comprises semiconductor material having the same conductivity type as the front semiconductor region, but being more heavily doped than said front region.
Claim 8
Dependent Claim 35 words
The apparatus of claim 5 wherein the semiconductor means further comprises a second semiconductor region of a second conductivity type; and wherein an interface between the front and second semiconductor regions constitutes the rectifying junction.
Claim 9
Dependent Claim 31 words
The apparatus of claim 7 wherein the contact means comprises: an ohmic contact to the front semiconductor region; and back conductor means forming an ohmic contact with the second semiconductor region.
Claim 10
Dependent Claim 37 words
The apparatus of claim 7 further comprising a third semiconductor region contiguous to the back of the second semiconductor region, said third region being of the second conductivity type but more heavily doped than the second region.
Claim 11
Dependent Claim 41 words
The apparatus of claim 9 wherein: an ohmic contact to the front semiconductor region comprises a contact to the first side of the rectifying junction; and the third semiconductor region constitutes a contact to the second side of the rectifying junction.
Claim 12
Dependent Claim 23 words
The apparatus of claim 10 wherein the front semiconductor region is n-type silicon and the second and third semiconductor regions are p-type silicon.
Claim 13
Dependent Claim 18 words
The apparatus of claim 5 wherein the inversion stop semiconductor grid is inlaid into the front semiconductor region.
Claim 14
Dependent Claim 127 words
An optical memory system comprising: a CIJ optical memory device as in claim 12; first d.c. voltage supply means connected across the contact means for maintaining the rectifying junction back biased; second variable d.c. voltage supply means connected between the transparent conductor and the front semiconductor region for establishing bias electric fields across the insulating means; light beam addressing means for delivering a light beam to a selected memory cell; light beam supply means for producing a light beam whose intensity is modulated by the information to be stored; and memory control means for coordinating the operation of the first and second voltage supply means and the light beam addressing means and light beam supply means to provide long term data storage in the CIJ memory device.
Claim 15
Dependent Claim 218 words
A long-term-storage CIJ memory device having a layered structure and comprising: transparent conductor means forming a front surface of the device; front insulating layer means adjacent the transparent conductor; a back insulating layer means adjacent the front insulating layer, for permitting a significant tunneling current to flow therethrough when an electric field across the insulating layer means is enhanced by the concentration of charges in the vicinity of the back surface of the back layer, but for preventing the flow of significant tunneling current when the field is applied without the presence of a concentration of charges in the vicinity of the back surface of the layer; a front semiconductor region of a first conductivity type adjacent to the back surface of the second insulating layer, and having an ohmic contact thereto; inversion stop grid means associated with the front surface of the front semiconductor region for preventing the formation of inversion regions at the front surface of the front semiconductor region which extend across lines of the grid means; a back semiconductor region of a second conductivity type adjacent the back edge of the front region for forming a rectifying junction with the first region; and back conductor means forming an ohmic contact to the back semiconductor region for collecting any current flowing across the rectifying junction.
Claim 16
Dependent Claim 218 words
A long-term-storage CIJ memory device having a layered structure and comprising: transparent conductor means forming a front surface of the device; front insulating layer means adjacent the transparent conductor; a back insulating layer means adjacent the front insulating layer, for permitting a significant tunneling current to flow therethrough when an electric field across the insulating layer means is enhanced by the concentration of charges in the vicinity of the back surface of the back layer, but for preventing the flow of significant tunneling current when the field is applied without the presence of a concentration of charges in the vicinity of the back surface of the layer; a front semiconductor region of a first conductivity type adjacent to the back surface of the second insulating layer, and having an ohmic contact thereto; inversion stop grid means associated with the front surface of the front semiconductor region for preventing the formation of inversion regions at the front surface of the front semiconductor region which extend across lines of the grid means; a back semiconductor region of a second conductivity type adjacent the back edge of the front region for forming a rectifying junction with the first region; and back conductor means forming an ohmic contact to the back semiconductor region for collecting any current flowing across the rectifying junction.
Claim 17
Dependent Claim 203 words
A CIJ optical memory system comprising: memory device support disc means for supporting a plurality of CIJ optical memory devices on at least one side thereof, each of said CIJ optical memory devices comprising: transparent conductor means forming a front surface of the device; insulation means contiguous to the back of the transparent conductor means for storing charges, said insulation means containing a storage interface capable of trapping charges thereat, said insulation means being susceptible to tunneling between the storage interface and a back surface of the insulation means; semiconductor means having a front surface and a rectifying junction; said semiconductor means having an inversion stop grid means associated with the front surface thereof; contact means for connecting external voltages to first and second sides of the rectifying junction for biasing the junction; disc suspension means for rotatably supporting the disc means to allow the disc means to be rotated to align a selected memory cell with an input-output position; disc drive means for rotating the disc to a selected position; light source means at the input-output position for providing a memory activating light beam; and said light source means being radially movable for aligning the light beam with a selected memory cell.
Claim 18
Dependent Claim 203 words
A CIJ optical memory system comprising: memory device support disc means for supporting a plurality of CIJ optical memory devices on at least one side thereof, each of said CIJ optical memory devices comprising: transparent conductor means forming a front surface of the device; insulation means contiguous to the back of the transparent conductor means for storing charges, said insulation means containing a storage interface capable of trapping charges thereat, said insulation means being susceptible to tunneling between the storage interface and a back surface of the insulation means; semiconductor means having a front surface and a rectifying junction; said semiconductor means having an inversion stop grid means associated with the front surface thereof; contact means for connecting external voltages to first and second sides of the rectifying junction for biasing the junction; disc suspension means for rotatably supporting the disc means to allow the disc means to be rotated to align a selected memory cell with an input-output position; disc drive means for rotating the disc to a selected position; light source means at the input-output position for providing a memory activating light beam; and said light source means being radially movable for aligning the light beam with a selected memory cell.
Claim 19
Independent Claim 245 words
A method of writing information into a selected cell of a CIJ optical memory device which device comprises transparent conductor means forming a front surface of the device, insulation means contiguous to the back of the traNsparent conductor means for storing charges, said insulation means containing a storage interface capable of trapping charges thereat, said insulation means being susceptible to tunneling between the storage interface and a back surface of the insulation means, semiconductor means having a front surface and a rectifying junction, said semiconductor means having an inversion stop grid means associated with the front surface thereof, contact means for connecting external voltages to first and second sides of the rectifying junction for biasing the junction; said method comprising the steps of: applying a write voltage across the CIJ insulation means to induce a depletion region in the semiconductor means adjacent the semiconductor-means/insulation-means interface, at least a portion of the depletion region being capable of being inverted; and illuminating the selected cell with a light beam which is intensely modulated by the information to be stored in the selected cell, in order to photogenerate hole-electron pairs to invert the invertable portion of the depletion region in accordance with the light intensity, the charge in said invertable region in combination with the write voltage inducing tunneling between the semiconductor-means/insulation-means interface and the storage interface in accordance with the light intensity to trap charge at the storage interface in accordance with the information to be stored.
Claim 20
Independent Claim 245 words
A method of writing information into a selected cell of a CIJ optical memory device which device comprises transparent conductor means forming a front surface of the device, insulation means contiguous to the back of the traNsparent conductor means for storing charges, said insulation means containing a storage interface capable of trapping charges thereat, said insulation means being susceptible to tunneling between the storage interface and a back surface of the insulation means, semiconductor means having a front surface and a rectifying junction, said semiconductor means having an inversion stop grid means associated with the front surface thereof, contact means for connecting external voltages to first and second sides of the rectifying junction for biasing the junction; said method comprising the steps of: applying a write voltage across the CIJ insulation means to induce a depletion region in the semiconductor means adjacent the semiconductor-means/insulation-means interface, at least a portion of the depletion region being capable of being inverted; and illuminating the selected cell with a light beam which is intensely modulated by the information to be stored in the selected cell, in order to photogenerate hole-electron pairs to invert the invertable portion of the depletion region in accordance with the light intensity, the charge in said invertable region in combination with the write voltage inducing tunneling between the semiconductor-means/insulation-means interface and the storage interface in accordance with the light intensity to trap charge at the storage interface in accordance with the information to be stored.
Claim 21
Independent Claim 218 words
A method of reading information out of a selected memory cell of a CIJ optical memory device, which device comprises transparent conductor means forming a front surface of the device, insulation means contiguous to the back of the transparent conductor means for storing charges, said insulation means containing a storage interface capable of trapping charges thereat, said insulation means being susceptible to tunneling between the storage interface and a back surface of the insulation means, semiconductor means having a front surface and a rectifying junction, said semiconductor means having an inversion stop grid means associated with the front surface thereof, contact means for connecting external voltages to first and second sides of the rectifying junction for biasing the junction, said method comprising the steps of: backbiasing the CIJ rectifying junction; applying a read voltage across the CIJ insulating means to induce a depletion region in the semiconductor means at each storage cell which is uncharged; illuminating with a reading light beam the selected memory cell, the extent of which is limited by the inversion stop grid means; and monitoring the current collected by the reverse biased rectifying junction to determine the extent of any depletion region in the semiconductor means at the semiconductor-means/insulation-means interface, thereby determining the charge and thus the information stored in the cell being read.
Claim 22
Independent Claim 218 words
A method of reading information out of a selected memory cell of a CIJ optical memory device, which device comprises transparent conductor means forming a front surface of the device, insulation means contiguous to the back of the transparent conductor means for storing charges, said insulation means containing a storage interface capable of trapping charges thereat, said insulation means being susceptible to tunneling between the storage interface and a back surface of the insulation means, semiconductor means having a front surface and a rectifying junction, said semiconductor means having an inversion stop grid means associated with the front surface thereof, contact means for connecting external voltages to first and second sides of the rectifying junction for biasing the junction, said method comprising the steps of: backbiasing the CIJ rectifying junction; applying a read voltage across the CIJ insulating means to induce a depletion region in the semiconductor means at each storage cell which is uncharged; illuminating with a reading light beam the selected memory cell, the extent of which is limited by the inversion stop grid means; and monitoring the current collected by the reverse biased rectifying junction to determine the extent of any depletion region in the semiconductor means at the semiconductor-means/insulation-means interface, thereby determining the charge and thus the information stored in the cell being read.
Claim 23
Independent Claim 189 words
A method of sensing information stored in a CIJ memory device, which device comprises transparent conductor means forming a front surface of the device, insulation means contiguous to the back of the transparent conductor means for storing charges, said insulation means containing a storage interface capable of trapping charges thereat, said insulation means being susceptible to tunneling between the storage interface and a back surface of the insulation means, semiconductor means having a front surface and a rectifying junction, said semiconductor means having an inversion stop grid means associated with the front surface thereof, contact means for connecting external voltages to first and second sides of the rectifying junction for biasing the junction, wherein the information is stored in the form of charges in the insulating layer overlying the semiconductor material, said method comprising the steps of: injecting minority carriers in the semiconductor material; and sensing the direction of flow of the carriers perpendicular to the interface between the insulating layer and the semIconductor material to determine the extent of any depletion region in the vicinity to the semiconductor-means/insulation-means interface to determine the charge trapped at the storage interface.
Claim 24
Independent Claim 189 words
A method of sensing information stored in a CIJ memory device, which device comprises transparent conductor means forming a front surface of the device, insulation means contiguous to the back of the transparent conductor means for storing charges, said insulation means containing a storage interface capable of trapping charges thereat, said insulation means being susceptible to tunneling between the storage interface and a back surface of the insulation means, semiconductor means having a front surface and a rectifying junction, said semiconductor means having an inversion stop grid means associated with the front surface thereof, contact means for connecting external voltages to first and second sides of the rectifying junction for biasing the junction, wherein the information is stored in the form of charges in the insulating layer overlying the semiconductor material, said method comprising the steps of: injecting minority carriers in the semiconductor material; and sensing the direction of flow of the carriers perpendicular to the interface between the insulating layer and the semIconductor material to determine the extent of any depletion region in the vicinity to the semiconductor-means/insulation-means interface to determine the charge trapped at the storage interface.
Claim 25
Independent Claim 182 words
A method of writing information into a CIJ memory comprising transparent conductor means forming a front surface of the device, insulation means contiguous to the back of the transparent conductor means for storing charges, said insulation means containing a storage interface capable of trapping charges thereat, said insulation means being susceptible to tunneling between the storage interface and a back surface of the insulation means, semiconductor means having a front surface and a rectifying junction, said semiconductor means having an inversion stop grid means associated with the front surface thereof, contact means for connecting external voltages to first and second sides of the rectifying junction for biasing the junction; said method comprising the steps: inducing an invertible depletion region in the semiconductor means adjacent to the insulation means; photogenerating whole-electron pairs behind the cells where the information is to be written; collecting carriers at the insulating means-semiconductor means interface until an electric field of sufficient strength to induce tunneling in the insulator means develops, whereby charges are trapped at the CIJ storage interface in the cell where information is to be written.
Claim 26
Independent Claim 182 words
A method of writing information into a CIJ memory comprising transparent conductor means forming a front surface of the device, insulation means contiguous to the back of the transparent conductor means for storing charges, said insulation means containing a storage interface capable of trapping charges thereat, said insulation means being susceptible to tunneling between the storage interface and a back surface of the insulation means, semiconductor means having a front surface and a rectifying junction, said semiconductor means having an inversion stop grid means associated with the front surface thereof, contact means for connecting external voltages to first and second sides of the rectifying junction for biasing the junction; said method comprising the steps: inducing an invertible depletion region in the semiconductor means adjacent to the insulation means; photogenerating whole-electron pairs behind the cells where the information is to be written; collecting carriers at the insulating means-semiconductor means interface until an electric field of sufficient strength to induce tunneling in the insulator means develops, whereby charges are trapped at the CIJ storage interface in the cell where information is to be written.
Claim 27
Dependent Claim 38 words
The method recited in claim 19 wherein the depth of said invertible region is such that the inversion stop grid means divides the invertible region into individual invertible regions which are limited by the inversion stop grid means.
Claim 28
Independent Claim 182 words
A method of reading information out of a selected CIJ memory cell of a CIJ memory comprising transparent conductor means forming a front surface of the device, insulation means contiguous to the back of the transparent conductor means for storing charges, said insulation means containing a storage interface capable of trapping charges thereat, said insulation means being susceptible to tunneling between the storage interface and a back surface of the insulation means, semiconductor means having a front surface and a rectifying junction, said semiconductor means having an inversion stop grid means associated with the front surface thereof, contact means for connecting external voltages to first and second sides of the rectifying junction for biasing the junction, said method comprising the steps: backbiasing the rectifying junction; inducing a depletion region in the semiconductor means behind the memory cells not storing charge; injecting minority carriers into the semiconductor region behind the memory cell to be read; collecting the current flowing across the backbias rectifying junction; and determining from the magnitude of the collected current whether there was charge stored at the selected memory cell.
Claim 29
Independent Claim 182 words
A method of reading information out of a selected CIJ memory cell of a CIJ memory comprising transparent conductor means forming a front surface of the device, insulation means contiguous to the back of the transparent conductor means for storing charges, said insulation means containing a storage interface capable of trapping charges thereat, said insulation means being susceptible to tunneling between the storage interface and a back surface of the insulation means, semiconductor means having a front surface and a rectifying junction, said semiconductor means having an inversion stop grid means associated with the front surface thereof, contact means for connecting external voltages to first and second sides of the rectifying junction for biasing the junction, said method comprising the steps: backbiasing the rectifying junction; inducing a depletion region in the semiconductor means behind the memory cells not storing charge; injecting minority carriers into the semiconductor region behind the memory cell to be read; collecting the current flowing across the backbias rectifying junction; and determining from the magnitude of the collected current whether there was charge stored at the selected memory cell.

References Cited (Backward Citations)

US3737877A Cited
US3746867A Cited
US3739353A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1977-12-16 1978-06-17 1978-12-17 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1981-12-16 1982-06-17 1982-12-17 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1985-12-16 1986-06-17 1986-12-17 $7700.00 Window Closed / Lapsed

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