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US3753803A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of dividing semiconductor layer into a plurality of isolated regions

Assignee: Hitachi Ltd
•
Filing: 1969-12-04
•
Granted: 1973-08-21
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Expires: 1989-12-04
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Abstract

Abstract A method of isolation, comprising forming a semiconductor epitaxial layer on one surface of a semiconductor substrate, said epitaxial layer having a conductivity tape opposite to that of said semiconductor substrate, forming at least one groove in said epitaxial layer so that the groove extends to the surface of said semiconductor substrate to divide said epitaxial layer into a plurality of regions, and employing an epitaxial growth process to fill the groove with a semiconductor layer of the same conductivity type as the substrate thereby to divide said epitaxial layer into a plurality of electrically isolated regions.

Inventors

  • 👤 Y Shimura
  • 👤 H Sano
  • 👤 M Nomura
  • 👤 H Saida
  • 👤 Y Ono

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-24 17:40
CPC Classifications
H; H10; H10W; H10W15/00; H10D; H10D62/00; H10D62/10; H10D62/13; H10D62/137; H10P; H10P50/00; H10P50/20; H10P50/24; H10P50/242; H10W10/00; H10W10/01; H10W10/031; H10W10/30; H10W15/01; Y; Y10; Y10S; Y10S148/00; Y10S148/037; Y10S148/05; Y10S148/085; Y10S148/151

Claims Analysis

Total Claims: 5
Claim 1
Independent Claim 55 words
A method according to claim 1, wherein the first conductivity type is P type and the second conductivity type is N type, and wherein said first opening has a width of from 50 Mu m to 500 Mu m and said second opening has a width of from 20 Mu m to 50 Mu m.
Claim 2
Dependent Claim 22 words
A method according to claim 1, wherein the insulator film is selected from the group consisting of silicon dioxide and silicon nitride.
Claim 3
Dependent Claim 44 words
A method according to claim 1, wherein the step of growing a semiconductor layer in the groove and the recess comprises heat treating the semiconductor substrate at a desired temperature and wherein said gas mixture consists of a semiconductor halide, hydrogen and hydrogen chloride.
Claim 4
Dependent Claim 38 words
A method according to claim 1, wherein the step of forming the opening in the insulator film comprises forming a plurality of first openings therein and a second opening surrounding all the first openings in the insulator film.
Claim 5
Dependent Claim 43 words
A method according to claim 1, wherein the step of forming the openings in the insulator film comprises forming a plurality of first openings and a plurality of second openings each of the sEcond openings surrounding a predetermined number of the first openings.

References Cited (Backward Citations)

US3210620A Cited
US3210677A Cited
US3243323A Cited
US3394037A Cited
US3426254A Cited
US3456169A Cited
US3370995A Cited
US3425879A Cited
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US3566220A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1976-08-20 1977-02-19 1977-08-21 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1980-08-20 1981-02-19 1981-08-21 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1984-08-20 1985-02-19 1985-08-21 $7700.00 Window Closed / Lapsed

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