US7129548B2
Expired / Lapsed
US
⏱️ 0.0 years remaining
MOSFET structure with multiple self-aligned silicide contacts
Assignee: GlobalFoundries US Inc
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Filing: 2004-08-11
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Granted: 2006-10-31
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Expires: 2024-08-11
Abstract
Abstract A metal oxide semiconductor field effect transistor (MOSFET) structure that includes multiple and distinct self-aligned silicide contacts and methods of fabricating the same are provided. The MOSFET structure includes at least one metal oxide semiconductor field effect transistor having a gate conductor including a gate edge located on a surface of a Si-containing substrate; a first inner silicide having an edge that is substantially aligned to the gate edge of the at least one metal oxide semiconductor field effect transistor; and a second outer silicide located adjacent to the first inner silicide. In accordance with the present invention, the second outer silicide has second thickness is greater than the first thickness of the first inner silicide. Moreover, the second outer silicide has a resistivity that is lower than the resistivity of the first inner silicide.
Inventors
- 👤 Kevin K. Chan
- 👤 Christian Lavoie
- 👤 Kern Rim
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 13:44
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/01; H10D30/021; H10D30/0212; H10D30/0213; H10D30/60; H10D30/601; H10D64/00; H10D64/01; H10D64/015
Claims Analysis
Total Claims: 15
Claim 1
Independent Claim
153 words
A metal oxide semiconductor field effect transistor (MOSFET) structure that comprises: at least one metal oxide semiconductor field effect transistor located on a surface of a Si-containing substrate, said at least one metal oxide semiconductor field effect transistor comprises at least a gate conductor having a gate edge; a first inner silicide contact having an edge that is substantially aligned to the gate edge of the at least one metal oxide semiconductor field effect transistor, said first inner silicide contact having a first thickness and a first resistivity, wherein said inner silicide contact is not offset from said gate edge by a width of any overlying spacer; and a second outer silicide contact located adjacent to said first inner silicide contact, said second outer silicide contact having a second thickness and a second resistivity, wherein said second thickness is greater than the first thickness and second resistivity is lower than the first resistivity.
Claim 2
Dependent Claim
153 words
A metal oxide semiconductor field effect transistor (MOSFET) structure that comprises: at least one metal oxide semiconductor field effect transistor located on a surface of a Si-containing substrate, said at least one metal oxide semiconductor field effect transistor comprises at least a gate conductor having a gate edge; a first inner silicide contact having an edge that is substantially aligned to the gate edge of the at least one metal oxide semiconductor field effect transistor, said first inner silicide contact having a first thickness and a first resistivity, wherein said inner silicide contact is not offset from said gate edge by a width of any overlying spacer; and a second outer silicide contact located adjacent to said first inner silicide contact, said second outer silicide contact having a second thickness and a second resistivity, wherein said second thickness is greater than the first thickness and second resistivity is lower than the first resistivity.
Claim 3
Dependent Claim
20 words
The MOSFET of claim 1 wherein said Si-containing substrate is replaced with another semiconductor material besides a Si-containing semiconductor material.
Claim 4
Dependent Claim
26 words
The MOSFET of claim 1 wherein said at least one metal oxide semiconductor field effect transistor further comprises a gate dielectric located beneath said gate conductor.
Claim 5
Dependent Claim
27 words
The MOSFET of claim 1 wherein said at least one metal oxide semiconductor field effect transistor further comprises at least one spacer on a vertical sidewall thereof.
Claim 6
Dependent Claim
30 words
The MOSFET of claim 4 wherein said at least one spacer comprises a single wide spacer or a spacer pair including a narrow inner spacer and a wide outer spacer.
Claim 7
Dependent Claim
31 words
The MOSFET of claim 1 wherein said first inner silicide contact comprises a silicide of Ti, Ta, W, Co, Ni, Pt, Pd or alloys thereof including alloys with an alloying additive.
Claim 8
Dependent Claim
19 words
The MOSFET of claim 6 wherein said first inner silicide contact comprises a silicide of Ni, Co or Pt.
Claim 9
Dependent Claim
23 words
The MOSFET of claim 1 wherein said first thickness of said first inner silicide contact is from about 3 to about 20 nm.
Claim 10
Dependent Claim
31 words
The MOSFET of claim 1 wherein said second outer silicide contact comprises a silicide of Ti, Ta, W, Co, Ni, Pt, Pd or alloys thereof including alloys with an alloying additive.
Claim 11
Dependent Claim
19 words
The MOSFET of claim 9 wherein said second outer silicide contact comprises a silicide of Ni, Co or Pt.
Claim 12
Dependent Claim
23 words
The MOSFET of claim 1 wherein said second thickness of said second outer silicide contact is from about 10 to about 40 nm.
Claim 13
Dependent Claim
21 words
The MOSFET of claim 1 wherein said second resistivity of said second outer silicide contact is about 20 ohm/square or less.
Claim 14
Dependent Claim
14 words
The MOFET of claim 1 wherein said Si-containing substrate is a bulk semiconductor material.
Claim 15
Dependent Claim
13 words
The MOSFET of claim 1 wherein said Si-containing substrate is a silicon-on-insulator material.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 2009-10-30 | 2010-05-01 | 2010-10-31 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2013-10-30 | 2014-05-01 | 2014-10-31 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2017-10-30 | 2018-05-01 | 2018-10-31 | $7700.00 | Window Closed / Lapsed |