Claims Analysis
Total Claims: 9
Claim 1
Independent Claim
95 words
A manufacturing method of a semiconductor device, comprising: a step of forming an electrically conductive material film on a base board; a redistribution board forming step of forming a redistribution board on the base board, wherein the redistribution board forming step includes the step of applying copper plating on the electrically conductive material film; a base board separating step of separating the base board from the redistribution board; a semiconductor element mounting step of mounting at least one semiconductor element on the redistribution board via electrode pads formed on a surface of the redistribution board.
Claim 2
Dependent Claim
95 words
A manufacturing method of a semiconductor device, comprising: a step of forming an electrically conductive material film on a base board; a redistribution board forming step of forming a redistribution board on the base board, wherein the redistribution board forming step includes the step of applying copper plating on the electrically conductive material film; a base board separating step of separating the base board from the redistribution board; a semiconductor element mounting step of mounting at least one semiconductor element on the redistribution board via electrode pads formed on a surface of the redistribution board.
Claim 3
Dependent Claim
37 words
The manufacturing method of the semiconductor device as claimed in claim 1 , wherein the step of forming the redistribution board includes the step of forming the redistribution board incorporating a passive element on the base board.
Claim 4
Dependent Claim
41 words
The manufacturing method of the semiconductor device as claimed in claim 1 , further comprising a redistribution board mounting step of mounting the redistribution board on a package board via electrode pads formed on an other surface of the redistribution board.
Claim 5
Dependent Claim
48 words
The manufacturing method of the semiconductor device as claimed in claim 1 , wherein the base board is made of a silicon wafer, a plurality of the redistribution boards are integrally formed on said silicon wafer, and the redistribution boards are individualized after the base board removing step.
Claim 6
Dependent Claim
66 words
The manufacturing method of the semiconductor device as claimed in claim 1 , wherein: the base board is made of a sapphire board including a thin organic film formed on a surface where the redistribution board is formed; and the base board separating step includes a step irradiating a laser beam to the thin organic film via the sapphire board and vaporizing the thin organic film.
Claim 7
Dependent Claim
37 words
The manufacturing method of the semiconductor device as claimed in claim 1 , wherein: the base board is made of silicon; and the base board separating step includes a step of removing the silicon by using etching.
Claim 8
Dependent Claim
32 words
The manufacturing method of the semiconductor device as claimed in claim 6 , wherein the base board separating step includes the step of removing the silicon by using etching and grinding together.
Claim 9
Dependent Claim
38 words
The manufacturing method of the semiconductor device as claimed in claim 1 , wherein: the base board is made of copper or copper alloy; and the base board separating step includes a step of etching the base board.