Multiple die stack apparatus employing T-shaped interposer elements

Claim 2

An interposer apparatus for use between a first semiconductor device and a second semiconductor device, said first semiconductor device and said second semiconductor device each having a plurality of bond pads disposed on an active surface thereof and a bottom surface, comprising: a first surface having a first length, a first width, and a coefficient of thermal expansion and a second surface having a length, a width smaller than said first width of said first surface, and a coefficient of thermal expansion substantially the same as the coefficient of thermal expansion of the first surface, said first surface comprising an overhang portion of said interposer apparatus for protection of said plurality of bond pads disposed on said first semiconductor device and said second surface being mountable to said active surface of said first semiconductor device.

Claim 3

The interposer apparatus according to claim 1 , wherein said overhang portion further comprises at least one conductive strip for connection to at least one bond pad of said plurality of bond pads of said first semiconductor device.

Claim 4

The interposer apparatus according to claim 1 , wherein said first and second surfaces are formed from a common unitary member.

Claim 5

The interposer apparatus according to claim 1 , wherein said interposer apparatus provides thermal conductivity for thermal energy transfer from said first semiconductor device and said second semiconductor device, each mounted to said interposer apparatus.

Claim 6

The interposer apparatus according to claim 1 , wherein said interposer apparatus provides thermal insulation between said first semiconductor device and said second semiconductor device, each mounted to said interposer apparatus.

Claim 7

The interposer apparatus according to claim 1 , wherein said interposer apparatus provides one of thermal conductivity and thermal insulation between said first semiconductor device and said second semiconductor device, each mounted to said interposer apparatus.

Claim 8

The interposer apparatus according to claim 1 , wherein said interposer apparatus provides electrical insulation between said first semiconductor device and said second semiconductor device, each mounted to said interposer apparatus.

Claim 9

The interposer apparatus according to claim 1 , wherein said interposer apparatus provides thermal insulation and electrical insulation between said first semiconductor device and said second semiconductor device, each mounted to said interposer apparatus.

Claim 10

The interposer apparatus according to claim 1 , wherein said interposer apparatus provides thermal conductivity and electrical insulation between said first semiconductor device and said second semiconductor device, each mounted to said interposer apparatus.

Claim 11

The interposer apparatus according to claim 3 , wherein said common unitary member has a coefficient of thermal expansion substantially equal to that of said first semiconductor device.

Claim 12

The interposer apparatus according to claim 3 , wherein said common unitary member has a coefficient of thermal expansion substantially equal to that of said second semiconductor device.

Claim 13

The interposer apparatus according to claim 3 , wherein said common unitary member has a coefficient of thermal expansion substantially equal to that of said first semiconductor device and said second semiconductor device.

Claim 14

The interposer apparatus according to claim 1 , wherein said first surface of said interposer apparatus is connected to a base portion of said second semiconductor device.

Claim 15

The interposer apparatus according to claim 1 , wherein a third semiconductor device is mounted adjacent said second semiconductor device.

Claim 16

The interposer apparatus according to claim 1 , wherein said length of said second surface is substantially the same as said first length of said first surface.

Claim 17

The interposer apparatus according to claim 1 , wherein said length of said second surface is substantially the same as the width of said second surface.

Claim 18

An interposer apparatus for use between a first semiconductor device and a second semiconductor device, said first semiconductor device and said second semiconductor device each having a plurality of bond pads on an active surface thereof and a bottom surface, said interposer apparatus comprising: a first surface having a first length, a first width, a coefficient of thermal expansion; a second surface having a length, a width smaller than said first width of said first surface, and a coefficient of thermal expansion substantially the same as the coefficient of thermal expansion of the first surface, said first surface comprising an overhang portion of said interposer apparatus for protection of said plurality of bond pads disposed on said first semiconductor device and said second surface being mountable to said active surface of said first semiconductor device; a third surface having a first length and a first width; and a fourth surface having a length and a width smaller than said first width of said third surface, said third surface providing an overhang portion of said interposer apparatus for protection of said plurality of bond pads disposed on said second semiconductor device and said fourth surface being mountable to said active surface of said second semiconductor device.

Claim 19

An interposer apparatus for use between a first semiconductor device and a second semiconductor device, said first semiconductor device and said second semiconductor device each having a plurality of bond pads on an active surface thereof and a bottom surface, said interposer apparatus comprising: a first surface having a first length, a first width, a coefficient of thermal expansion; a second surface having a length, a width smaller than said first width of said first surface, and a coefficient of thermal expansion substantially the same as the coefficient of thermal expansion of the first surface, said first surface comprising an overhang portion of said interposer apparatus for protection of said plurality of bond pads disposed on said first semiconductor device and said second surface being mountable to said active surface of said first semiconductor device; a third surface having a first length and a first width; and a fourth surface having a length and a width smaller than said first width of said third surface, said third surface providing an overhang portion of said interposer apparatus for protection of said plurality of bond pads disposed on said second semiconductor device and said fourth surface being mountable to said active surface of said second semiconductor device.

Claim 20

The interposer apparatus according to claim 17 , wherein said overhang portion further comprises at least one conductive strip for connection to at least one bond pad of said plurality of bond pads of said first semiconductor device.

Claim 21

The interposer apparatus according to claim 17 , wherein said first and second surfaces are formed from a common unitary member.

Claim 22

The interposer apparatus according to claim 17 , wherein said third and fourth surfaces are formed from a common unitary member.

Claim 23

The interposer apparatus according to claim 17 , wherein said interposer apparatus provides thermal conductivity for thermal energy transfer from said first semiconductor device and said second semiconductor device, each mounted to said interposer apparatus.

Claim 24

The interposer apparatus according to claim 17 , wherein said interposer apparatus provides thermal insulation between said first semiconductor device and said second semiconductor device, each mounted to said interposer apparatus.

Claim 25

The interposer apparatus according to claim 17 , wherein said interposer apparatus provides one of thermal conductivity and thermal insulation between said first semiconductor device and said second semiconductor device, each mounted to said interposer apparatus.

Claim 26

The interposer apparatus according to claim 17 , wherein said interposer apparatus provides electrical insulation between said first semiconductor device and said second semiconductor device, each mounted to said interposer apparatus.

Claim 27

The interposer apparatus according to claim 17 , wherein said interposer apparatus provides thermal insulation and electrical insulation between said first semiconductor device and said second semiconductor device, each mounted to said interposer apparatus.

Claim 28

The interposer apparatus according to claim 17 , wherein said interposer apparatus provides thermal conductivity and electrical insulation between said first semiconductor device and said second semiconductor device mounted to said interposer apparatus.

Claim 29

The interposer apparatus according to claim 19 , wherein said common unitary member has a coefficient of thermal expansion substantially equal to that of said first semiconductor device.

Claim 30

The interposer apparatus according to claim 20 , wherein said common unitary member has a coefficient of thermal expansion substantially equal to that of said first semiconductor device.

Claim 31

The interposer apparatus according to claim 19 , wherein said common unitary member has a coefficient of thermal expansion substantially equal to that of said second semiconductor device.

Claim 32

The interposer apparatus according to claim 20 , wherein said common unitary member has a coefficient of thermal expansion substantially equal to that of said second semiconductor device.

Claim 33

The interposer apparatus according to claim 19 , wherein said common unitary member has a coefficient of thermal expansion substantially equal to that of said first semiconductor device and said second semiconductor device.

Claim 34

The interposer apparatus according to claim 20 , wherein said common unitary member has a coefficient of thermal expansion substantially equal to that of said first semiconductor device and said second semiconductor device.

Claim 35

The interposer apparatus according to claim 17 , wherein said first surface of said interposer apparatus is connected to a base portion of said second semiconductor device.

Claim 36

The interposer apparatus according to claim 17 , wherein said third surface of said interposer apparatus is connected to a base portion of a third semiconductor device.

Claim 37

The interposer apparatus according to claim 17 , wherein a third semiconductor device is mounted adjacent said second semiconductor device.

Claim 38

The interposer apparatus according to claim 17 , wherein said length of said second surface is substantially the same as said first length of said first surface.

Claim 39

The interposer apparatus according to claim 17 , wherein said length of said second surface is substantially the same as the width of said second surface.

Claim 40

The interposer apparatus according to claim 17 , wherein said length of said fourth surface is substantially the same as said first length of said third surface.

Claim 41

The interposer apparatus according to claim 17 , wherein said length of said fourth surface is substantially the same as the width of said fourth surface.

Claim 42

An interposer apparatus for use between a plurality of semiconductor devices, each semiconductor device of said plurality of semiconductor devices having at least one bond pad on an active surface thereof and a bottom surface, comprising: a first surface having a first length, a first width, and a coefficient of thermal expansion; a second surface having a length, a width smaller than said first width of said first surface, and a coefficient of thermal expansion substantially the same as the coefficient of thermal expansion of the first surface, said first surface providing a protective overhang portion that protects the at least one bond pad on an active surface of a first semiconductor device and said second surface being mountable to said active surface of said first semiconductor device.

Claim 43

An interposer apparatus for use between a plurality of semiconductor devices, each semiconductor device of said plurality of semiconductor devices having at least one bond pad on an active surface thereof and a bottom surface, comprising: a first surface having a first length, a first width, and a coefficient of thermal expansion; a second surface having a length, a width smaller than said first width of said first surface, and a coefficient of thermal expansion substantially the same as the coefficient of thermal expansion of the first surface, said first surface providing a protective overhang portion that protects the at least one bond pad on an active surface of a first semiconductor device and said second surface being mountable to said active surface of said first semiconductor device.

Claim 44

The interposer apparatus according to claim 40 , wherein said protective overhang portion further comprises at least one conductive strip for connecting to said first semiconductor device.

Claim 45

The interposer apparatus according to claim 40 , wherein said first and second surfaces are formed from a unitary member.

Claim 46

The interposer apparatus according to claim 40 , further comprising: a third surface having a first length and a first width; and a fourth surface having a length and a width smaller than said first width of said third surface, said third surface providing a portion that is at least partially covering said at least one bond pad on an active surface of a second semiconductor device and said fourth surface being mountable to said active surface of said second semiconductor device.

Claim 47

The interposer apparatus according to claim 40 , wherein said interposer apparatus provides thermal and electrical insulation between said first semiconductor device and a second semiconductor device of said plurality of semiconductor devices connected to said interposer apparatus.

Claim 48

The interposer apparatus according to claim 40 , wherein said interposer apparatus provides thermal conductivity and electrical insulation between said first semiconductor device and a second semiconductor device of said plurality of semiconductor devices connected to said interposer apparatus.

Claim 49

The interposer apparatus according to claim 42 , wherein said unitary member has a coefficient of thermal expansion substantially the same as said first semiconductor device.

Claim 50

The interposer apparatus according to claim 40 , wherein said first surface of said interposer apparatus is connected to a base portion of a second semiconductor device of said plurality of semiconductor devices.

Claim 51

The interposer apparatus according to claim 47 , wherein at least a third semiconductor device mounts adjacent said second semiconductor device of said plurality of semiconductor devices.

Claim 52

The interposer apparatus according to claim 40 , wherein said length of said second surface is substantially the same as said first length of said first surface.

Claim 53

The interposer apparatus according to claim 40 , wherein said length of said second surfaces is substantially the same as the width of said second surface.