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US6404216B1 Expired / Lapsed US ⏱️ 0.0 years remaining

Test contact

Assignee: Micron Technology Inc
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Filing: 1999-02-26
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Granted: 2002-06-11
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Expires: 2019-02-26
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Abstract

Abstract A semiconductor leadframe with an improved test contact is disclosed. Leadframes that are coated with a harder thinner material such as Nickel/Palladium and subsequently plated with a softer and thicker metal test contact, such as gold or silver, is disclosed. The areas that are plated with the test contact are on lead fingers where a test probe would normally contact. The test probe penetrates the softer material much easier allowing for a good contact, thus better testing and burning-in.

Inventors

  • 👤 Patrick W. Tandy

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-08 07:17
CPC Classifications
H; H10; H10W; H10W70/00; H10W70/40; H10W70/421; H10W70/438; H10W70/456; H10W70/457; G; G01; G01R; G01R31/00; G01R31/28; G01R31/2851; G01R31/2884; H10W72/00; H10W72/071; H10W72/073; H10W72/075; H10W72/07531; H10W72/07532; H10W72/07533; H10W72/50; H10W72/531; H10W72/536; H10W72/5363; H10W72/551; H10W72/552; H10W72/5522; H10W72/5524; H10W72/59; H10W72/851; H10W72/853; H10W72/865; H10W72/874; H10W72/884; H10W72/90; H10W72/951; H10W72/952; H10W74/00; H10W90/00; H10W90/701; H10W90/731; H10W90/736; H10W90/751; H10W90/756

Claims Analysis

Total Claims: 23
Claim 1
Independent Claim 122 words
A semiconductor leadframe, comprising: at least one semiconductor chip mounting structure including: a semiconductor chip mounting pad for mounting a semiconductor chip thereon; fingers, having a top and bottom surface, said fingers connected to said semiconductor chip mounting pad; chip mounting pad supports for supporting said mounting pad, said chip mounting pad supports extending from the semiconductor leadframe to said chip mounting pad, thereby supporting said chip mounting pad; test contacts on at least one of said top and bottom surfaces of said fingers; and, first and second side rails formed on a pair of sides of said at least one semiconductor chip mounting structure, said side rails being substantially parallel and each said side rail including a plurality of indexing holes.
Claim 2
Dependent Claim 122 words
A semiconductor leadframe, comprising: at least one semiconductor chip mounting structure including: a semiconductor chip mounting pad for mounting a semiconductor chip thereon; fingers, having a top and bottom surface, said fingers connected to said semiconductor chip mounting pad; chip mounting pad supports for supporting said mounting pad, said chip mounting pad supports extending from the semiconductor leadframe to said chip mounting pad, thereby supporting said chip mounting pad; test contacts on at least one of said top and bottom surfaces of said fingers; and, first and second side rails formed on a pair of sides of said at least one semiconductor chip mounting structure, said side rails being substantially parallel and each said side rail including a plurality of indexing holes.
Claim 3
Dependent Claim 17 words
The semiconductor leadframe of claim 1 further comprising a semiconductor chip mounted on said chip mounting pad.
Claim 4
Dependent Claim 21 words
The semiconductor leadframe of claim 2 , further comprising a semiconductor package encapsulating said semiconductor chip and said chip mounting pad.
Claim 5
Dependent Claim 15 words
The semiconductor leadframe of claim 1 , wherein said test contacts comprise a soft metal.
Claim 6
Dependent Claim 13 words
The semiconductor leadframe of claim 1 , wherein said test contacts comprise silver.
Claim 7
Dependent Claim 13 words
The semiconductor leadframe of claim 1 , wherein said test contacts comprise gold.
Claim 8
Dependent Claim 18 words
The semiconductor leadframe of claim 1 , wherein said test contacts are adapted for receiving a test probe.
Claim 9
Dependent Claim 89 words
A semiconductor leadframe, comprising: at least one semiconductor chip mounting structure including: fingers, having a top and bottom surface, said fingers connected to the semiconductor leadframe, wherein said fingers are adapted for receiving a semiconductor chip; test contacts on at least one of said top and bottom surfaces of said fingers; and, first and second side rails formed on a pair of sides of said at least one semiconductor chip mounting structure, said side rails being substantially parallel and each said side rail including a plurality of indexing holes.
Claim 10
Dependent Claim 89 words
A semiconductor leadframe, comprising: at least one semiconductor chip mounting structure including: fingers, having a top and bottom surface, said fingers connected to the semiconductor leadframe, wherein said fingers are adapted for receiving a semiconductor chip; test contacts on at least one of said top and bottom surfaces of said fingers; and, first and second side rails formed on a pair of sides of said at least one semiconductor chip mounting structure, said side rails being substantially parallel and each said side rail including a plurality of indexing holes.
Claim 11
Dependent Claim 16 words
The semiconductor leadframe of claim 8 , further comprising a semiconductor chip mounted on said fingers.
Claim 12
Dependent Claim 16 words
The semiconductor leadframe of claim 9 , further comprising a semiconductor package encapsulating said semiconductor chip.
Claim 13
Independent Claim 61 words
A method of manufacturing a semiconductor device assembly, comprising the steps of: forming a semiconductor leadframe from an iron system alloy and including a pair of parallel side rails, each said side rail including at least one indexing hole, and a plurality of lead fingers; coating the leadframe with a hard, conductive material; and forming test contacts on said lead fingers.
Claim 14
Independent Claim 61 words
A method of manufacturing a semiconductor device assembly, comprising the steps of: forming a semiconductor leadframe from an iron system alloy and including a pair of parallel side rails, each said side rail including at least one indexing hole, and a plurality of lead fingers; coating the leadframe with a hard, conductive material; and forming test contacts on said lead fingers.
Claim 15
Dependent Claim 19 words
The method of claim 11 , wherein said step of coating the leadframe comprises coating the leadframe with palladium.
Claim 16
Dependent Claim 19 words
The method of claim 11 , wherein said step of coating the leadframe comprises coating the leadframe with nickel.
Claim 17
Dependent Claim 21 words
The method of claim 11 , wherein said step of forming test contacts comprises forming test contacts from a soft metal.
Claim 18
Dependent Claim 18 words
The method of claim 11 , further comprising the step of mounting a semiconductor chip on said leadframe.
Claim 19
Dependent Claim 30 words
The method of claim 15 , further comprising the step of encapsulating said leadframe, said semiconductor chip and a portion of said plurality of lead fingers in a semiconductor package.
Claim 20
Dependent Claim 19 words
The method of claim 16 , further comprising the step of placing a test probe on said test contacts.
Claim 21
Dependent Claim 21 words
The method of claim 17 , wherein said step of placing the test probe provides an interface to a testing apparatus.
Claim 22
Dependent Claim 26 words
The method of claim 17 , wherein said step of placing said test probe provides a current to said test contacts to burn-in said semiconductor chip.
Claim 23
Dependent Claim 15 words
The method of claim 19 , further comprising the step of removing said test contacts.

References Cited (Backward Citations)

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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2005-06-10 2005-12-10 2006-06-11 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2009-06-10 2009-12-10 2010-06-11 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2013-06-10 2013-12-10 2014-06-11 $7700.00 Window Closed / Lapsed

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