US6342452B1
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of fabricating a Si3N4/polycide structure using a dielectric sacrificial layer as a mask
Assignee: International Business Machines Corp
•
Filing: 2000-05-18
•
Granted: 2002-01-29
•
Expires: 2020-05-18
Abstract
Abstract According to the disclosed method, there is provided a structure consisting of a silicon substrate coated with a bottom thin SiO2 layer, a doped polysilicon layer, a refractory metal layer and a top Si3N4 capping layer. Said refractory metal and doped polysilicon layers will form a polycide layer under subsequent thermal treatments. First, a sacrificial layer of a dielectric material such as oxynitride is deposited onto the structure. Oxynitride is impervious to UV radiation and has excellent conformal properties. Then, a layer of a photoresist material is deposited onto the structure and patterned to form a mask. Now the dielectric and top Si3N4 layers are anisotropically etched using the photoresist mask. The mask is stripped and the refractory metal and doped polysilicon layers are anisotropically dry etched down to the SiO2 layer using the patterned dielectric layer as an in-situ hard mask. A conformal layer of Si3N4 is deposited onto the structure, then anisotropically dry etched until the thin SiO2 layer is exposed to form the Si3N4 spacers. Diffusion regions are formed in the substrate by ion implantation. A layer of BPSG is deposited onto the structure and planarized. Contact holes are formed to expose said diffusion regions and filled with a metal to create borderless metal contacts therewith.
Inventors
- 👤 Philippe Coronel
- 👤 Pascal Costaganna
- 👤 Lars Heineck
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 02:09
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/01; H10W20/031; H10W20/069; H10P; H10P50/00; H10P50/71; H10P50/20; H10P50/26; H10P50/264; H10P50/266; H10P50/267; H10P50/268
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
137 words
Method of fabricating a gate stack structure comprising: providing a structure comprising a semiconductor substrate underlying a gate dielectric layer, a doped polysilicon layer, a refractory metal layer and a top silicon nitride capping layer in sequence, said refractory metal and doped polysilicon layers forming a polycide layer under subsequent thermal treatments; depositing a layer of dielectric material onto said structure, said dielectric material being impervious to ultraviolet radiation and having a good conformal property; photolithographically patterning said layer of dielectric material to form an in-situ hardmask; using said in-situ hardmask, anisotropically etching said structure down to said semiconductor substrate to form a gate stack; conformally depositing silicon nitride over said gate stack; and with said in-situ hardmask still in place, anisotropically etching said conformally deposited silicon nitride to form spacers on sidewalls of said gate stack.
Claim 2
Dependent Claim
137 words
Method of fabricating a gate stack structure comprising: providing a structure comprising a semiconductor substrate underlying a gate dielectric layer, a doped polysilicon layer, a refractory metal layer and a top silicon nitride capping layer in sequence, said refractory metal and doped polysilicon layers forming a polycide layer under subsequent thermal treatments; depositing a layer of dielectric material onto said structure, said dielectric material being impervious to ultraviolet radiation and having a good conformal property; photolithographically patterning said layer of dielectric material to form an in-situ hardmask; using said in-situ hardmask, anisotropically etching said structure down to said semiconductor substrate to form a gate stack; conformally depositing silicon nitride over said gate stack; and with said in-situ hardmask still in place, anisotropically etching said conformally deposited silicon nitride to form spacers on sidewalls of said gate stack.
Claim 3
Dependent Claim
12 words
The method of claim 1 wherein said dielectric material comprises silicon dioxide.
Claim 4
Dependent Claim
14 words
The method of claim 1 wherein said dielectric material consists essentially of silicon oxynitride.
Claim 5
Dependent Claim
20 words
The method of claim 3 wherein said layer of dielectric material is deposited to a thickness greater than 120 nm.
Claim 6
Dependent Claim
12 words
The method of claim 4 wherein said thickness is about 200 nm.
Claim 7
Dependent Claim
250 words
Method of fabricating a composite Si3N4/polycide structure laterally coated with a Si3N4 spacer having a lowered aspect ratio comprising: a) providing a structure consisting of a silicon substrate coated with a bottom gate dielectric layer, a doped polysilicon layer, a refractory metal layer and a top Si3N4 capping layer; said refractory metal and doped polysilicon layers forming a polycide layer under subsequent thermal treatments; b) depositing a sacrificial layer of a dielectric material onto the structure, said dielectric material being impervious to ultraviolet (UV) radiation and having a good conformal property; c) depositing a layer of a photoresist material onto the structure; d) patterning said photoresist layer to form a mask; e) anisotropically dry etching to pattern the dielectric layer and top Si3N4 layers using the photoresist mask; f) stripping the photoresist mask; g) anisotropically dry etching the refractory metal and doped polysilicon layers down to the gate dielectric layer using the patterned dielectric layer as an in-situ hard mask; h) depositing a conformal layer of Si3N4, referred to as a Si3N4 spacer layer, onto the structure; i) anisotropically dry etching the Si3N4 spacer layer until the gate dielectric layer is exposed to form Si3N4 spacers; j) introducing a dopant into the silicon substrate to create diffusion regions at desired locations; k) depositing a layer of boro-phospho-silicate-glass (BPSG) onto the structure and planarizing it; l) forming contact holes to expose said diffusion regions; and, m) filling said contact holes with a metal to create metal contacts with the diffusion regions.
Claim 8
Dependent Claim
250 words
Method of fabricating a composite Si3N4/polycide structure laterally coated with a Si3N4 spacer having a lowered aspect ratio comprising: a) providing a structure consisting of a silicon substrate coated with a bottom gate dielectric layer, a doped polysilicon layer, a refractory metal layer and a top Si3N4 capping layer; said refractory metal and doped polysilicon layers forming a polycide layer under subsequent thermal treatments; b) depositing a sacrificial layer of a dielectric material onto the structure, said dielectric material being impervious to ultraviolet (UV) radiation and having a good conformal property; c) depositing a layer of a photoresist material onto the structure; d) patterning said photoresist layer to form a mask; e) anisotropically dry etching to pattern the dielectric layer and top Si3N4 layers using the photoresist mask; f) stripping the photoresist mask; g) anisotropically dry etching the refractory metal and doped polysilicon layers down to the gate dielectric layer using the patterned dielectric layer as an in-situ hard mask; h) depositing a conformal layer of Si3N4, referred to as a Si3N4 spacer layer, onto the structure; i) anisotropically dry etching the Si3N4 spacer layer until the gate dielectric layer is exposed to form Si3N4 spacers; j) introducing a dopant into the silicon substrate to create diffusion regions at desired locations; k) depositing a layer of boro-phospho-silicate-glass (BPSG) onto the structure and planarizing it; l) forming contact holes to expose said diffusion regions; and, m) filling said contact holes with a metal to create metal contacts with the diffusion regions.
Claim 9
Dependent Claim
11 words
The method of claim 6 wherein said dielectric material comprises oxynitride.
Claim 10
Dependent Claim
20 words
The method of claim 7 wherein said layer of dielectric material is deposited to a thickness greater than 120 nm.
Claim 11
Dependent Claim
12 words
The method of claim 8 wherein said thickness is about 200 rnm.
Claim 12
Dependent Claim
23 words
The method of claim 7 wherein said step e) of dry etching oxynitride is performed in a dry etcher with a CF4/CHF3/O2 chemistry.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2005-01-28 | 2005-07-30 | 2006-01-29 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2009-01-28 | 2009-07-30 | 2010-01-29 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2013-01-28 | 2013-07-30 | 2014-01-29 | $7700.00 | Window Closed / Lapsed |