Patent US6316807B1 successfully refreshed from Google Patents.
US6316807B1
Expired / Lapsed
US
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Low on-resistance trench lateral MISFET with better switching characteristics and method for manufacturing same
Assignee: Fuji Electric Co Ltd
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Filing: 1998-12-31
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Granted: 2001-11-13
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Expires: 2018-12-31
Abstract
Abstract A high-voltage and low on-resistance semiconductor device incorporates a trench structure that provides improved switching characteristics. In a preferred embodiment, a Trench Lateral Power MISFET is provided having a gate, channel and drift regions that are built on the side-walls of the trench. The process used to form the MISFET involves a self-aligned trench bottom contact hole to contact a source provided at the bottom of the trench to achieve minimum pitch and very low on-resistance. An example of a MISFET with 80 V breakdown voltage having a cell pitch of 3.4 microns is disclosed in which an on-resistance of 0.7 mΩ-cm 2 is realized. The switching characteristics of the MISFET are twice as good as that of prior MISFET device structures.
Inventors
- 👤 Naoto Fujishima
- 👤 C. Andre T. Salama
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 15:59
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/60; H10D30/601; H10D30/608; H10D30/63; H10D30/64; H10D30/66; H10D30/663; H10D30/668; H10D64/00; H10D64/20; H10D64/23; H10D64/251; H10D64/252; H10D64/256
Claims Analysis
Total Claims: 3
Claim 1
Independent Claim
227 words
A MISFET comprising: a substrate of a first conductivity type including a trench and an extended trench; an oxide layer that is formed on the sidewalls of the trench and extends over a top surface of the substrate; a gate oxide layer formed on sidewalls of the extended trench and the oxide layer; a gate layer formed on the gate oxide layer, wherein the gate layer and the gate oxide layer are selectively etched so that the top surface of the substrate is exposed in regions adjacent to the trench; a drain located in the top surface of the substrate in at least one of the regions adjacent to the trench; a base of the first conductivity type and a source of the second conductivity type formed in the substrate under the extended trench; a further oxide layer formed inside the trench, inside the extended trench and over the exposed regions of the substrate, wherein a thickness of the further oxide layer inside the trench and inside the extended trench is less than the thickness of the further oxide layer on the exposed regions of the substrate, and wherein a contact hole is provided through the further oxide layer at the bottom of the extended trench that extends to the substrate; an electrical interconnection material that extends through the trench, the extended trench and the contact hole.
Claim 2
Dependent Claim
227 words
A MISFET comprising: a substrate of a first conductivity type including a trench and an extended trench; an oxide layer that is formed on the sidewalls of the trench and extends over a top surface of the substrate; a gate oxide layer formed on sidewalls of the extended trench and the oxide layer; a gate layer formed on the gate oxide layer, wherein the gate layer and the gate oxide layer are selectively etched so that the top surface of the substrate is exposed in regions adjacent to the trench; a drain located in the top surface of the substrate in at least one of the regions adjacent to the trench; a base of the first conductivity type and a source of the second conductivity type formed in the substrate under the extended trench; a further oxide layer formed inside the trench, inside the extended trench and over the exposed regions of the substrate, wherein a thickness of the further oxide layer inside the trench and inside the extended trench is less than the thickness of the further oxide layer on the exposed regions of the substrate, and wherein a contact hole is provided through the further oxide layer at the bottom of the extended trench that extends to the substrate; an electrical interconnection material that extends through the trench, the extended trench and the contact hole.
Claim 3
Dependent Claim
41 words
A MISFET as claimed in claim 1 further comprising a first conductivity type diffusion region in the substrate along sidewalls of the trench and an extended drain region of a second conductivity type formed in the first conductivity type diffusion region.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2004-11-12 | 2005-05-14 | 2005-11-13 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2008-11-12 | 2009-05-14 | 2009-11-13 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2012-11-12 | 2013-05-14 | 2013-11-13 | $7700.00 | Window Closed / Lapsed |