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US6130449A Expired / Lapsed US ⏱️ 0.0 years remaining

Semiconductor memory device and a method for fabricating the same

Assignee: Adeia Semiconductor Advanced Technologies Inc
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Filing: 1997-10-03
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Granted: 2000-10-10
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Expires: 2017-10-03
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Abstract

Abstract A semiconductor memory device and a method of fabricating the same are provided, in which an interlayer film which only covers a peripheral circuit region except a memory cell array region is formed above the peripheral circuit region to reduce a topological difference between both regions after bitlines are formed, therefore a semiconductor substrate which has a plain surface as a main one can be used as a starting body with no preliminary processing thereon and a shallow trench isolation technique can also be applied, besides interconnects to the peripheral circuit can be led up to the surface of the device through a multi-step plug connection and thereby processing of large aspect-ratio holes, stuffing of metal in the holes and the like are unnecessary and as a result reliability of the process is improved.

Inventors

  • 👤 Hideyuki Matsuoka
  • 👤 Shinichiro Kimura
  • 👤 Toshiaki Yamanaka

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 02:18
CPC Classifications
H; H10; H10B; H10B12/00; H10B12/30; H10B12/48; H10B12/01; H10B12/09; H10B12/02; H10B12/03; H10B12/033; H10B12/0335; H10B12/31; H10B12/315; H10D; H10D1/00; H10D1/01; H10D1/041; H10D1/042; H10D1/60; H10D1/68; H10D1/692; H10D1/711; H10D1/712; H10D1/716

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 276 words
A semiconductor memory device having a memory cell array region and a peripheral circuit region, comprising: a semiconductor substrate; a plurality of first transistors formed on a main surface of said semiconductor substrate in said memory cell array region; a plurality of second transistors formed on the main surface of said semiconductor substrate in said peripheral circuit region; a first interlayer insulating film covering said plurality of first transistors, said plurality of second transistors and the main surface of said semiconductor substrate; a plurality of first interconnect lines formed on said first interlayer insulating film; a second interlayer insulating film covering said plurality of first interconnect lines and the surface of said first interlayer insulating film; a third interlayer insulating film only covering the surface of said second interlayer insulating film over said peripheral circuit region; a plurality of storage capacitors formed on the surface of said second interlayer insulating film of said memory cell array region and inside a recess formed by said third interlayer insulating film; a fourth interlayer insulating film covering said plurality of storage capacitors and an upper surface of said third interlayer insulating film; a plurality of second interconnect lines formed on said fourth interlayer insulating film; a first plug formed in a first contact hole which penetrates said third interlayer insulating film; and a second plug formed in a second contact hole which penetrates said fourth interlayer insulating film; wherein one of said second interconnect lines in said peripheral circuit region is electrically connected to one of said first interconnect lines in said peripheral circuit region via a plurality of plugs which include said first plug and said second plug.
Claim 2
Dependent Claim 276 words
A semiconductor memory device having a memory cell array region and a peripheral circuit region, comprising: a semiconductor substrate; a plurality of first transistors formed on a main surface of said semiconductor substrate in said memory cell array region; a plurality of second transistors formed on the main surface of said semiconductor substrate in said peripheral circuit region; a first interlayer insulating film covering said plurality of first transistors, said plurality of second transistors and the main surface of said semiconductor substrate; a plurality of first interconnect lines formed on said first interlayer insulating film; a second interlayer insulating film covering said plurality of first interconnect lines and the surface of said first interlayer insulating film; a third interlayer insulating film only covering the surface of said second interlayer insulating film over said peripheral circuit region; a plurality of storage capacitors formed on the surface of said second interlayer insulating film of said memory cell array region and inside a recess formed by said third interlayer insulating film; a fourth interlayer insulating film covering said plurality of storage capacitors and an upper surface of said third interlayer insulating film; a plurality of second interconnect lines formed on said fourth interlayer insulating film; a first plug formed in a first contact hole which penetrates said third interlayer insulating film; and a second plug formed in a second contact hole which penetrates said fourth interlayer insulating film; wherein one of said second interconnect lines in said peripheral circuit region is electrically connected to one of said first interconnect lines in said peripheral circuit region via a plurality of plugs which include said first plug and said second plug.
Claim 3
Dependent Claim 34 words
A semiconductor memory device according to claim 1, wherein an upper surface of said plurality of storage capacitors is located at a higher level than an upper surface of said third interlayer insulating film.
Claim 4
Dependent Claim 84 words
A semiconductor memory device according to claim 1 or 2, further comprising: a third plug formed in a second contact hole which penetrates said fourth interlayer insulating film; wherein said plurality of storage capacitors comprise a plurality of storage electrodes, a dielectric film and a plate electrode, wherein part of said plate electrode is extended onto said third interlayer insulating film, and wherein a power supply is provided to said plate electrode via said third plug at the extended part of said plate electrode.

References Cited (Backward Citations)

US5364811A Cited
US5448512A Cited
US5623164A Cited
US5414655A Cited
US5838038A Cited
US5717251A Cited
US5748521A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2003-10-10 2004-04-10 2004-10-10 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2007-10-10 2008-04-10 2008-10-10 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2011-10-10 2012-04-10 2012-10-10 $7700.00 Window Closed / Lapsed

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