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US6127834A
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US
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Apparatus for testing an integrated circuit in an oven during burn-in
Assignee: ORCHARD HOLDINGS LLC
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Filing: 1998-08-04
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Granted: 2000-10-03
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Expires: 2018-08-04
Abstract
Abstract An apparatus for testing an integrated circuit in an oven during burn-in. A burn-in board in the oven is electrically connected to a plurality of integrated circuit ("IC") components. A driver/interface board outside the oven is electrically connected to the burn-in board through a plurality of contacts and sends and receives a plurality of signals between the IC components and a test controller. A switch module on the burn-in board comprises a plurality of high-temperature switches for transferring signals between the plurality of IC components and the driver/interface board during burn-in. A plurality of signals entering the switch module from the driver/interface board does not exceed in number the plurality of contacts, and is fewer in number than a plurality of signals exiting the switch module to the plurality of IC components.
Inventors
- 👤 Victor M. Eliashberg
- 👤 Kombupalayam M. Prakash
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-05 22:12
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/2851; G01R31/2855; G01R31/286; G01R31/2863; G01R31/2872; G01R31/2879
Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
201 words
An apparatus for testing an integrated circuit in an oven during burn-in comprising: a burn-in board in the oven electrically connected to a plurality of integrated circuit ("IC") components designed to perform certain functions; a driver/interface board outside the oven for sending and receiving a plurality of signals between the IC components and a test controller, the driver/interface board electrically connected to the burn-in board through a plurality of contacts; a switch module on the burn-in board comprising a plurality of switches capable of operating at temperatures in excess of 150 degrees Celsius for transferring signals between the plurality of IC components and the driver/interface board during burn-in, the plurality of switches coupled between the driver/interface board and the plurality of IC components so that a plurality of signals entering the switch module from the driver/interface board cause the IC components to perform at least one of the functions, the plurality of signals entering the switch module from the driver/interface board not exceeding in number the plurality of contacts, and a plurality of signals exiting the switch module exceeding in number the plurality of contacts for simultaneously signaling a number of IC components that is greater than the number of contacts.
Claim 2
Independent Claim
201 words
An apparatus for testing an integrated circuit in an oven during burn-in comprising: a burn-in board in the oven electrically connected to a plurality of integrated circuit ("IC") components designed to perform certain functions; a driver/interface board outside the oven for sending and receiving a plurality of signals between the IC components and a test controller, the driver/interface board electrically connected to the burn-in board through a plurality of contacts; a switch module on the burn-in board comprising a plurality of switches capable of operating at temperatures in excess of 150 degrees Celsius for transferring signals between the plurality of IC components and the driver/interface board during burn-in, the plurality of switches coupled between the driver/interface board and the plurality of IC components so that a plurality of signals entering the switch module from the driver/interface board cause the IC components to perform at least one of the functions, the plurality of signals entering the switch module from the driver/interface board not exceeding in number the plurality of contacts, and a plurality of signals exiting the switch module exceeding in number the plurality of contacts for simultaneously signaling a number of IC components that is greater than the number of contacts.
Claim 3
Dependent Claim
23 words
The apparatus of claim 1, wherein the plurality of high-temperature switches comprise a solenoid coupled to a plurality of switches via an actuator.
Claim 4
Dependent Claim
16 words
The apparatus of claim 1, wherein each of the plurality of high-temperature switches is a relay.
Claim 5
Dependent Claim
15 words
The apparatus of claim 1, wherein each of the plurality of IC components is programmable.
Claim 6
Dependent Claim
20 words
The apparatus of claim 1, wherein each of the plurality of IC components is an application specific integrated circuit ("ASIC").
Claim 7
Dependent Claim
24 words
The apparatus of claim 1, wherein the plurality of signals entering the switch module number half the plurality of signals exiting the switch module.
Claim 8
Dependent Claim
31 words
The apparatus of claim 6, wherein each of the plurality of IC components is a memory, and wherein the plurality of signals entering and exiting the switch module comprise data signals.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2003-10-03 | 2004-04-03 | 2004-10-03 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2007-10-03 | 2008-04-03 | 2008-10-03 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2011-10-03 | 2012-04-03 | 2012-10-03 | $7700.00 | Window Closed / Lapsed |