US6127834A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Apparatus for testing an integrated circuit in an oven during burn-in
Assignee: ORCHARD HOLDINGS LLC
•
Filing: 1998-08-04
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Granted: 2000-10-03
•
Expires: 2018-08-04
Abstract
Abstract An apparatus for testing an integrated circuit in an oven during burn-in. A burn-in board in the oven is electrically connected to a plurality of integrated circuit ("IC") components. A driver/interface board outside the oven is electrically connected to the burn-in board through a plurality of contacts and sends and receives a plurality of signals between the IC components and a test controller. A switch module on the burn-in board comprises a plurality of high-temperature switches for transferring signals between the plurality of IC components and the driver/interface board during burn-in. A plurality of signals entering the switch module from the driver/interface board does not exceed in number the plurality of contacts, and is fewer in number than a plurality of signals exiting the switch module to the plurality of IC components.
Inventors
- 👤 Victor M. Eliashberg
- 👤 Kombupalayam M. Prakash
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-05 16:00
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/2851; G01R31/2855; G01R31/286; G01R31/2863; G01R31/2872; G01R31/2879
Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
201 words
An apparatus for testing an integrated circuit in an oven during burn-in comprising: a burn-in board in the oven electrically connected to a plurality of integrated circuit ("IC") components designed to perform certain functions; a driver/interface board outside the oven for sending and receiving a plurality of signals between the IC components and a test controller, the driver/interface board electrically connected to the burn-in board through a plurality of contacts; a switch module on the burn-in board comprising a plurality of switches capable of operating at temperatures in excess of 150 degrees Celsius for transferring signals between the plurality of IC components and the driver/interface board during burn-in, the plurality of switches coupled between the driver/interface board and the plurality of IC components so that a plurality of signals entering the switch module from the driver/interface board cause the IC components to perform at least one of the functions, the plurality of signals entering the switch module from the driver/interface board not exceeding in number the plurality of contacts, and a plurality of signals exiting the switch module exceeding in number the plurality of contacts for simultaneously signaling a number of IC components that is greater than the number of contacts.
Claim 2
Independent Claim
201 words
An apparatus for testing an integrated circuit in an oven during burn-in comprising: a burn-in board in the oven electrically connected to a plurality of integrated circuit ("IC") components designed to perform certain functions; a driver/interface board outside the oven for sending and receiving a plurality of signals between the IC components and a test controller, the driver/interface board electrically connected to the burn-in board through a plurality of contacts; a switch module on the burn-in board comprising a plurality of switches capable of operating at temperatures in excess of 150 degrees Celsius for transferring signals between the plurality of IC components and the driver/interface board during burn-in, the plurality of switches coupled between the driver/interface board and the plurality of IC components so that a plurality of signals entering the switch module from the driver/interface board cause the IC components to perform at least one of the functions, the plurality of signals entering the switch module from the driver/interface board not exceeding in number the plurality of contacts, and a plurality of signals exiting the switch module exceeding in number the plurality of contacts for simultaneously signaling a number of IC components that is greater than the number of contacts.
Claim 3
Dependent Claim
23 words
The apparatus of claim 1, wherein the plurality of high-temperature switches comprise a solenoid coupled to a plurality of switches via an actuator.
Claim 4
Dependent Claim
16 words
The apparatus of claim 1, wherein each of the plurality of high-temperature switches is a relay.
Claim 5
Dependent Claim
15 words
The apparatus of claim 1, wherein each of the plurality of IC components is programmable.
Claim 6
Dependent Claim
20 words
The apparatus of claim 1, wherein each of the plurality of IC components is an application specific integrated circuit ("ASIC").
Claim 7
Dependent Claim
24 words
The apparatus of claim 1, wherein the plurality of signals entering the switch module number half the plurality of signals exiting the switch module.
Claim 8
Dependent Claim
31 words
The apparatus of claim 6, wherein each of the plurality of IC components is a memory, and wherein the plurality of signals entering and exiting the switch module comprise data signals.
References Cited (Backward Citations)
US4145620A
Cited
US4374317A
Cited
US4746855A
Cited
US4683424A
Cited
US5093982A
Cited
US4902969A
Cited
US4947545A
Cited
US5103168A
Cited
US4956602A
Cited
US5254839A
Cited
US5126656A
Cited
US5191282A
Cited
US5402078A
Cited
US5420521A
Cited
US5880592A
Cited
US5429510A
Cited
US5543727A
Cited
US5528161A
Cited
US5796246A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2003-10-03 | 2004-04-03 | 2004-10-03 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2007-10-03 | 2008-04-03 | 2008-10-03 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2011-10-03 | 2012-04-03 | 2012-10-03 | $7700.00 | Window Closed / Lapsed |