US6110786A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Semiconductor device having elevated gate electrode and elevated active regions and method of manufacture thereof
Assignee: GlobalFoundries Inc
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Filing: 1998-04-16
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Granted: 2000-08-29
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Expires: 2018-04-16
Abstract
Abstract A semiconductor device having an elevated gate electrode and elevated active regions and a process for manufacturing such a device is disclosed. In accordance with one embodiment a semiconductor device is formed by forming a gate insulating layer over a substrate and forming a photoresist block over the gate insulating layer. First portions of the gate insulating layer and first portions of the substrate adjacent the photoresist block are then removed to form a first elevated substrate region under the gate insulating layer and photoresist block. Edge portions of the photoresist block are then removed. Second portions of the gate insulating layer and portions of the first elevated substrate region adjacent the photoresist block are then removed to form second elevated substrate regions adjacent the photoresist block, and a dopant is implanted into the second elevated substrate regions to form source/drain regions, and the photoresist block is used to form a gate electrode. In accordance with another embodiment a semiconductor device is formed substantially as above, but the dopant is implanted at an angle relative to the substrate surface.
Inventors
- 👤 Mark I. Gardner
- 👤 Jon Cheek
- 👤 John Bush
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 08:58
CPC Classifications
H; H10; H10D; H10D62/00; H10D62/10; H10D62/13; H10D62/149; H10D62/151; H10D30/00; H10D30/60; H10D62/01; H10D62/021; H10P; H10P30/00; H10P30/20; H10P30/222
Claims Analysis
Total Claims: 24
Claim 1
Independent Claim
64 words
A process of fabricating a semiconductor device, comprising: forming a first elevated substrate region over a substrate; removing edge portions of the first elevated substrate region and forming second elevated substrate regions adjacent the first elevated substrate region; forming a gate electrode, and an underlying gate insulator layer, over the first elevated substrate region; and forming active regions in the second elevated substrate regions.
Claim 2
Dependent Claim
64 words
A process of fabricating a semiconductor device, comprising: forming a first elevated substrate region over a substrate; removing edge portions of the first elevated substrate region and forming second elevated substrate regions adjacent the first elevated substrate region; forming a gate electrode, and an underlying gate insulator layer, over the first elevated substrate region; and forming active regions in the second elevated substrate regions.
Claim 3
Dependent Claim
22 words
The process of claim 1, further comprising forming a gate insulating layer over the substrate before forming the first elevated substrate region.
Claim 4
Dependent Claim
16 words
The process of claim 2, wherein forming the gate insulating layer includes forming an oxide layer.
Claim 5
Dependent Claim
23 words
The process of claim 2, further comprising forming a photoresist block over the gate insulating layer before forming the first elevated substrate region.
Claim 6
Dependent Claim
31 words
The process of claim 4, wherein forming the first elevated substrate region includes removing first portions of the gate insulating layer and first portions of the substrate adjacent the photoresist block.
Claim 7
Dependent Claim
38 words
The process of claim 5, wherein removing the first portions of the gate insulating layer and first portions of the substrate includes forming a first elevated substrate region having a height ranging from about 0.2 to 0.4 microns.
Claim 8
Dependent Claim
39 words
The process of claim 5, further including removing edge portions of the photoresist block from over edge portions of the first elevated substrate region after forming the first elevated substrate region and before forming the second elevated substrate regions.
Claim 9
Dependent Claim
21 words
The process of claim 7, wherein the edge portions of the photoresist block are removed using a photoresist trim etch technique.
Claim 10
Dependent Claim
28 words
The process of claim 7, wherein removing the edge portions of the photoresist block includes removing edge portions having a width ranging from about 0.02 to 0.04 microns.
Claim 11
Dependent Claim
29 words
The process of claim 7, wherein removing the edge portions of the photoresist block includes narrowing the photoresist block to a width ranging from about 0.12 to 0.16 microns.
Claim 12
Dependent Claim
25 words
The process of claim 7, wherein forming the second elevated substrate regions includes removing part of the edge portions of the first elevated substrate region.
Claim 13
Dependent Claim
54 words
The process of claim 4, wherein using the photoresist block to form a gate electrode includes: forming a dielectric layer over portions of the substrate adjacent the photoresist block; removing the photoresist block to leave an opening in the dielectric layer over the gate insulating layer; and forming a gate electrode in the opening.
Claim 14
Dependent Claim
21 words
The process of claim 1, wherein the second elevated substrate regions has a depth ranging from about 0.1 to 0.3 microns.
Claim 15
Dependent Claim
20 words
The process of claim 1, wherein forming the active regions includes implanting a dopant into the second elevated substrate regions.
Claim 16
Dependent Claim
21 words
The process of claim 14, wherein the dopant is implanted to about half a depth of the second elevated substrate regions.
Claim 17
Dependent Claim
25 words
The process of claim 14, wherein implanting the dopant includes implanting a dopant with a concentration ranging from about 2E15 to 8E15 atoms/cm 2 .
Claim 18
Dependent Claim
23 words
The process of claim 14, wherein implanting the dopant includes implanting a dopant with an energy ranging from about 2 to 10 KEV.
Claim 19
Dependent Claim
28 words
The process of claim 14, wherein implanting the dopant includes implanting the dopant at an angle ranging from about 20 to 60 degrees relative to the substrate surface.
Claim 20
Dependent Claim
40 words
The process of claim 18, wherein implanting the dopant at an angle includes forming LDD source/drain regions each having a heavily-doped region in a corresponding second elevated substrate region and a lightly-doped region in a corresponding first elevated substrate region.
Claim 21
Dependent Claim
17 words
The process of claim 1, further including forming spacers adjacent the first and second elevated substrate regions.
Claim 22
Dependent Claim
18 words
The process of claim 20, wherein the spacers are formed from a material selected from oxide and nitride.
Claim 23
Dependent Claim
98 words
A process of fabricating a semiconductor device, comprising: forming a photoresist block over a substrate; etching first portions of the substrate adjacent the photoresist block to form a first elevated substrate region under photoresist block; etching edge portions of the photoresist block over edge portions of the first elevated substrate region; etching part of the edge portions of the first elevated substrate region to form second elevated substrate regions adjacent the first elevated substrate region; implanting a dopant into the second elevated substrate regions to form source/drain regions; and using the photoresist block to form a gate electrode.
Claim 24
Dependent Claim
98 words
A process of fabricating a semiconductor device, comprising: forming a photoresist block over a substrate; etching first portions of the substrate adjacent the photoresist block to form a first elevated substrate region under photoresist block; etching edge portions of the photoresist block over edge portions of the first elevated substrate region; etching part of the edge portions of the first elevated substrate region to form second elevated substrate regions adjacent the first elevated substrate region; implanting a dopant into the second elevated substrate regions to form source/drain regions; and using the photoresist block to form a gate electrode.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2003-08-29 | 2004-02-28 | 2004-08-29 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2007-08-29 | 2008-02-28 | 2008-08-29 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2011-08-29 | 2012-02-28 | 2012-08-29 | $7700.00 | Window Closed / Lapsed |