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US6101117A Expired / Lapsed US ⏱️ 0.0 years remaining

Two transistor single capacitor ferroelectric memory

Assignee: International Business Machines Corp
•
Filing: 1999-03-22
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Granted: 2000-08-08
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Expires: 2019-03-22
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Abstract

Abstract A back-plane ferroelectric memory apparatus employing a read transistor, a write transistor and a ferroelectric capacitor storage means. A back plane forms a gate region underneath the read transistor with the potential of the back plane affected by polarization of the ferroelectric capacitor. The write and read transistors are different, the write transistor may be a vertical structure and the read transistor may be a write transistor and the write transistor's drain is connected to the back plane of read transistor and a plate of the ferroelectric capacitor.

Inventors

  • 👤 Sandip Tiwari

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-08 13:23
CPC Classifications
G; G11; G11C; G11C11/00; G11C11/21; G11C11/22; G11C11/221; G11C11/225; G11C11/2253; G11C11/2255; H; H10; H10B; H10B53/00

Claims Analysis

Total Claims: 16
Claim 1
Independent Claim 94 words
A ferroelectric memory employing transistor switches and a ferroelectric capacitor comprising: a ferroelectric capacitor having first and second plates; a write transistor device having a first node connected to a first bit line; a second node connected to said first plate of said ferroelectric capacitor; a read transistor device having a first node connected to a second bit line, a second node connected to said second plate of said ferroelectric capacitor, and a back plane connected to said second node of said write transistor device and to said first plate of said ferroelectric capacitor.
Claim 2
Dependent Claim 94 words
A ferroelectric memory employing transistor switches and a ferroelectric capacitor comprising: a ferroelectric capacitor having first and second plates; a write transistor device having a first node connected to a first bit line; a second node connected to said first plate of said ferroelectric capacitor; a read transistor device having a first node connected to a second bit line, a second node connected to said second plate of said ferroelectric capacitor, and a back plane connected to said second node of said write transistor device and to said first plate of said ferroelectric capacitor.
Claim 3
Dependent Claim 37 words
A ferroelectric memory according to claim 1 wherein said first and second bit lines are the same and said write transistor device and said read transistor device have their first nodes connected to the same bit line.
Claim 4
Dependent Claim 48 words
A ferroelectric memory according to claim 1 wherein said first bit line connected to said first node of said write transistor device is a write bit line and wherein said second bit line connected to said first node of said read transistor device is a sense bit line.
Claim 5
Dependent Claim 37 words
A ferroelectric memory according to claim 1 wherein said write transistor device further includes a gate electrode connected to a write line and said read transistor device further includes a gate electrode connected to a read line.
Claim 6
Dependent Claim 16 words
A ferroelectric memory according to claim 4 wherein said read line and write line are separate.
Claim 7
Dependent Claim 27 words
A ferroelectric memory according to claim 1 wherein said back plane of said read transistor device forms a gate region responsive to polarization of said ferroelectric capacitor.
Claim 8
Dependent Claim 27 words
A ferroelectric memory according to claim 1 wherein said write transistor device is a vertical structure and said read transistor device is a back plane planar structure.
Claim 9
Dependent Claim 18 words
A ferroelectric memory according to claim 7 wherein said back plane planar structure uses a polysilicon back plane.
Claim 10
Dependent Claim 19 words
A ferroelectric memory according to claim 7 wherein said back plane planar structure uses a single crystal back plane.
Claim 11
Dependent Claim 20 words
A ferroelectric memory according to claim 7 wherein said back plane transistor employs a W, Ti, N, WN back plane.
Claim 12
Dependent Claim 25 words
A ferroelectric memory according to claim 7 wherein said back plane transistor employs a refractory, high temperature and silicon and silicon dioxide compatible back plane.
Claim 13
Dependent Claim 14 words
A ferroelectric memory according to claim 7 wherein said transistors employ MM-single crystal material.
Claim 14
Dependent Claim 25 words
A ferroelectric memory according to claim 7 wherein said transistors employ a semiconductor material including GaA 3 , GaImA 3 , ImP, SiC, Ge, SiGe.
Claim 15
Dependent Claim 22 words
A ferroelectric memory according to claim 1 wherein said ferroelectric memory with said back plane functions as a random access NAND cell.
Claim 16
Dependent Claim 22 words
A ferroelectric memory according to claim 1 wherein said ferroelectric memory with said back plane functions as a random access NOR cell.

References Cited (Backward Citations)

US5396452A Cited
US5656528A Cited
US5737261A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2003-08-08 2004-02-07 2004-08-08 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2007-08-08 2008-02-07 2008-08-08 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2011-08-08 2012-02-07 2012-08-08 $7700.00 Window Closed / Lapsed

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