US6091251A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Discrete die burn-in for nonpackaged die
Assignee: Individual
•
Filing: 1997-07-07
•
Granted: 2000-07-18
•
Expires: 2017-07-07
Abstract
Abstract A reusable burn-in/test fixture for discrete TAB die consists of two halves. The first half of the test fixture contains cavity in which die is inserted. When the two halves are assembled, the fixture establishes electrical contact with the die and with a burn-in oven. The test fixture need not be opened until the burn-in and electrical test are completed. The fixture permits the die to be characterized prior to assembly.
Inventors
- 👤 Alan G. Wood
- 👤 Tim J. Corbett
- 👤 Gary L. Chadwick
- 👤 Chender Huang
- 👤 Larry D. Kinsman
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 06:47
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/2851; G01R31/2893; G01R1/00; G01R1/02; G01R1/04; G01R1/0408; G01R1/0433; G01R1/0441; G01R1/0466; G01R1/0483; H; H05; H05K; H05K3/00; H05K3/40; H05K3/4007; H10; H10P; H10P72/00; H10P72/70; H10P72/74; H10P74/00; H10P74/23; H10W; H10W70/00; H10W70/60; H10W70/62; H10W70/65; H10W70/67; H10W70/68; H10W90/00; H10W90/701; H10W99/00; G01R3/00; G01R31/2855; G01R31/286; G01R31/2863; H05K2201/00; H05K2201/01; H05K2201/0104; H05K2201/0133; H05K2201/03; H05K2201/0332; H05K2201/0335; H05K2201/0347; H05K2201/0364; H05K2201/0367; H05K2201/0388; H05K2201/0394; H05K2201/09; H05K2201/09209; H05K2201/09372; H05K2201/09481; H05K2201/095; H05K2201/09563; H05K2203/00; H05K2203/03; H05K2203/0307; H05K2203/07; H05K2203/0703; H05K2203/0723; H05K3/0058; H05K3/0067; H05K3/42; H05K3/423; H10W70/654; H10W70/655; H10W70/681; H10W90/20; H10W90/24; H10W90/721; H10W90/722
Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
223 words
A method for testing a semiconductor die having a die contact comprising: providing a test circuitry configured to generate test signals; providing a test fixture comprising a first plate and a second plate configured to house the die, the first slate comprising a cavity for retaining the die, an external lead, and a contact in electrical communication with the external lead and in approximate planar alignment with the die contact with the die in the cavity; providing a die contact member between the first plate and the second plate for electrically connecting the die contact to the external lead, the die contact member comprising a plastic film, a first bump on the film for electrically contacting the die contact, a conductive trace on the film in electrical communication with the first bump, and a second bump on the film in electrical communication with the conductive trace for electrically contacting the contact; placing the die in the cavity and the second plate on the first elate with the die contact in electrical contact with the first bump, the contact in electrical contact with the second bump, and the external lead in electrical communication with the test circuitry; and applying the test signals through the external lead, the contact, the second bump, the conductive trace, the first bump, and the die contact to the die.
Claim 2
Independent Claim
223 words
A method for testing a semiconductor die having a die contact comprising: providing a test circuitry configured to generate test signals; providing a test fixture comprising a first plate and a second plate configured to house the die, the first slate comprising a cavity for retaining the die, an external lead, and a contact in electrical communication with the external lead and in approximate planar alignment with the die contact with the die in the cavity; providing a die contact member between the first plate and the second plate for electrically connecting the die contact to the external lead, the die contact member comprising a plastic film, a first bump on the film for electrically contacting the die contact, a conductive trace on the film in electrical communication with the first bump, and a second bump on the film in electrical communication with the conductive trace for electrically contacting the contact; placing the die in the cavity and the second plate on the first elate with the die contact in electrical contact with the first bump, the contact in electrical contact with the second bump, and the external lead in electrical communication with the test circuitry; and applying the test signals through the external lead, the contact, the second bump, the conductive trace, the first bump, and the die contact to the die.
Claim 3
Dependent Claim
27 words
The method of claim 1 further comprising bonding the first bump to the die contact prior to the placing step to attach the member to the die.
Claim 4
Dependent Claim
31 words
The method of claim 2 wherein the first bump is bonded to the die contact with a reversible bond generally weaker than an attachment of the die contact to the die.
Claim 5
Dependent Claim
23 words
The method of claim 1 wherein the first plate comprises a slot in the cavity for removing the die following the applying step.
Claim 6
Independent Claim
226 words
A method for testing a semiconductor die having a die contact comprising: providing a test circuitry configured to generate test signals; providing a test fixture comprising a first plate and a second plate configured to house the die, the first plate comprising a cavity for retaining the die, an external lead, and a slot in the cavity for removing the die; providing a die contact member configured for placement between the first plate and the second plate for electrically connecting the die to the external lead, the die contact member comprising a plastic film, a bump on the film for electrically contacting the die contact, a conductive trace on the film in electrical communication with the bump and with the external lead; providing a compressible member configured for placement between the first plate and the second plate to bias the die against the die contact member; placing the die in the cavity with the die contact in electrical contact with the bump; securing the second plate to the first plate with the compressible member compressed therebetween to bias the bump against the die contact; placing the external lead in electrical communication with the test circuitry; applying the test signals through the external lead, the conductive trace, the bump, and the die contact to the die; and following the applying step, removing the die using the slot.
Claim 7
Independent Claim
226 words
A method for testing a semiconductor die having a die contact comprising: providing a test circuitry configured to generate test signals; providing a test fixture comprising a first plate and a second plate configured to house the die, the first plate comprising a cavity for retaining the die, an external lead, and a slot in the cavity for removing the die; providing a die contact member configured for placement between the first plate and the second plate for electrically connecting the die to the external lead, the die contact member comprising a plastic film, a bump on the film for electrically contacting the die contact, a conductive trace on the film in electrical communication with the bump and with the external lead; providing a compressible member configured for placement between the first plate and the second plate to bias the die against the die contact member; placing the die in the cavity with the die contact in electrical contact with the bump; securing the second plate to the first plate with the compressible member compressed therebetween to bias the bump against the die contact; placing the external lead in electrical communication with the test circuitry; applying the test signals through the external lead, the conductive trace, the bump, and the die contact to the die; and following the applying step, removing the die using the slot.
Claim 8
Dependent Claim
19 words
The method of claim 5 further comprising bonding the bump to the die contact prior to the placing step.
Claim 9
Dependent Claim
14 words
The method of claim 5 wherein the bump comprises solder or a conductive polymer.
Claim 10
Independent Claim
203 words
A method for testing a semiconductor die having a die contact comprising: providing a test circuitry configured to generate test signals; providing a test fixture comprising a first plate and a second plate configured to house the die, the first plate comprising an external lead connectable to the test circuitry; providing a die contact member configured for placement between the first plate and the second plate to electrically connect the die to the external lead, the member comprising a plastic film, a bump on the film for electrically contacting the die contact, and a conductive trace on the film in electrical communication with the bump and electrically connectable to the external lead; attaching the member to the die by bonding the bump to the die contact; placing the die and the member in the test fixture between the first elate and the second plate with the conductive trace in electrical communication with the external lead and the external lead in electrical communication with the test circuitry; applying the test signals through the external lead, the conductive trace, the bump, and the die contact to the die; and following the applying step removing the die with the member attached thereto from the test fixture.
Claim 11
Independent Claim
203 words
A method for testing a semiconductor die having a die contact comprising: providing a test circuitry configured to generate test signals; providing a test fixture comprising a first plate and a second plate configured to house the die, the first plate comprising an external lead connectable to the test circuitry; providing a die contact member configured for placement between the first plate and the second plate to electrically connect the die to the external lead, the member comprising a plastic film, a bump on the film for electrically contacting the die contact, and a conductive trace on the film in electrical communication with the bump and electrically connectable to the external lead; attaching the member to the die by bonding the bump to the die contact; placing the die and the member in the test fixture between the first elate and the second plate with the conductive trace in electrical communication with the external lead and the external lead in electrical communication with the test circuitry; applying the test signals through the external lead, the conductive trace, the bump, and the die contact to the die; and following the applying step removing the die with the member attached thereto from the test fixture.
Claim 12
Dependent Claim
33 words
The method of claim 8 wherein the bonding step comprises bonding the bump to the die contact with a reversible bond generally weaker than an attachment of the die contact to the die.
Claim 13
Dependent Claim
14 words
The method of claim 8 wherein the bump comprises solder or a conductive polymer.
References Cited (Backward Citations)
US4169642A
Cited
US4585991A
Cited
US5014161A
Cited
US4891585A
Cited
US4783719A
Cited
US4918383A
Cited
US4912399A
Cited
US4899107A
Cited
US4906920A
Cited
US5072289A
Cited
US5073117A
Cited
JPH0369131A
Cited
US4968931A
Cited
US5123850A
Cited
US5088190A
Cited
US5117439A
Cited
US5225037A
Cited
US5302891A
Cited
US5815000A
Cited
US5878485A
Cited
US5896036A
Cited
US5949242A
Cited
US5180977A
Cited
US5825195A
Cited
US5543725A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2003-07-18 | 2004-01-17 | 2004-07-18 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2007-07-18 | 2008-01-17 | 2008-07-18 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2011-07-18 | 2012-01-17 | 2012-07-18 | $7700.00 | Window Closed / Lapsed |