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Structure of a capacitor in a semiconductor device having a self align contact window which has a slanted sidewall

Assignee: United Microelectronics Corp
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Filing: 1998-08-03
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Granted: 2000-06-20
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Expires: 2018-08-03
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Abstract

Abstract A structure of a capacitor includes two gates and a commonly used source/drain region on a substrate. Then, a pitted self align contact window (PSACW) partly exposes the commonly used source/drain region. Then an glue/barrier layer and a lower electrode of the capacitor are over the PSACW. Then a dielectric thin film with a material having high dielectric constant is over the lower electrode. Then, an upper electrode is over the dielectric thin film to complete a capacitor, which has a structure of metal insulator metal with a shape like the PSACW.

Inventors

  • 👤 Kuo-Tai Huang
  • 👤 Wen-Yi Hsieh
  • 👤 Tri-Rung Yew

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 09:16
CPC Classifications
H; H10; H10B; H10B12/00; H10B12/01; H10B12/02; H10B12/03; H10B12/033; H10D; H10D1/00; H10D1/60; H10D1/68; H10D1/692; H10D1/711

Claims Analysis

Total Claims: 17
Claim 1
Independent Claim 119 words
A capacitor, comprising: a substrate, wherein a transistor having a gate and a source/drain region is formed on the substrate; an insulating layer over at least the transistor, wherein there is a self align contact window through the insulating layer exposing the source/drain region and wherein the self align contact window has a slanted side wall; a first metal layer on the slanted side wall of the self align contact window and on the source/drain region, wherein the first metal layer serves as a lower electrode of the capacitor; a dielectric layer covering the first metal layer; and a second metal layer covering the dielectric layer, wherein the second metal layer serves as an upper electrode of the capacitor.
Claim 2
Dependent Claim 119 words
A capacitor, comprising: a substrate, wherein a transistor having a gate and a source/drain region is formed on the substrate; an insulating layer over at least the transistor, wherein there is a self align contact window through the insulating layer exposing the source/drain region and wherein the self align contact window has a slanted side wall; a first metal layer on the slanted side wall of the self align contact window and on the source/drain region, wherein the first metal layer serves as a lower electrode of the capacitor; a dielectric layer covering the first metal layer; and a second metal layer covering the dielectric layer, wherein the second metal layer serves as an upper electrode of the capacitor.
Claim 3
Dependent Claim 12 words
The structure of claim 1, wherein the insulating layer includes silicon oxide.
Claim 4
Dependent Claim 13 words
The structure of claim 1, wherein the first metal layer includes Tungsten (W).
Claim 5
Dependent Claim 13 words
The structure of claim 1, wherein the first metal layer includes Platinum (Pt).
Claim 6
Dependent Claim 13 words
The structure of claim 1, wherein the first metal layer includes Ruthenium (Ru).
Claim 7
Dependent Claim 15 words
The structure of claim 1, wherein the dielectric layer includes Ta 2 O 5 .
Claim 8
Dependent Claim 13 words
The structure of claim 1, wherein the dielectric layer includes Pb(Zr,Ti)O 3 (PZT).
Claim 9
Dependent Claim 13 words
The structure of claim 1, wherein the dielectric layer includes (Ba,Sr)TiO 3 (BST).
Claim 10
Dependent Claim 12 words
The structure of claim 1, wherein the second metal layer includes Tungsten.
Claim 11
Dependent Claim 12 words
The structure of claim 1, wherein the second metal layer includes Platinum.
Claim 12
Dependent Claim 12 words
The structure of claim 1, wherein the second metal layer includes Ruthenium.
Claim 13
Dependent Claim 27 words
The structure of claim 1, wherein a glue/barrier layer is included between the first metal layer and the slanted side wall of the self align contact window.
Claim 14
Dependent Claim 12 words
The structure of claim 12, wherein the glue/barrier layer includes titanium/titanium nitride.
Claim 15
Dependent Claim 153 words
A capacitor, comprising: a substrate, wherein a transistor having a gate and a source/drain region is formed on the substrate; an insulating layer over the transistor, wherein there is a self align contact window through the insulating layer exposing the source/drain region and wherein the self align contact window has a slanted side wall; a first metal layer on the slanted side wall of the self align contact window and on the source/drain region, wherein the first metal layer serves as a lower electrode of the capacitor; a glue/barrier layer interposed between the first metal layer and the slanted side wall of the self align contact window; a TiSi 2 layer formed around an interface between the source/drain region and the glue/barrier layer; a dielectric layer covering the first metal layer; and a second metal layer covering the dielectric layer, wherein the second metal layer serves as an upper electrode of the capacitor.
Claim 16
Dependent Claim 153 words
A capacitor, comprising: a substrate, wherein a transistor having a gate and a source/drain region is formed on the substrate; an insulating layer over the transistor, wherein there is a self align contact window through the insulating layer exposing the source/drain region and wherein the self align contact window has a slanted side wall; a first metal layer on the slanted side wall of the self align contact window and on the source/drain region, wherein the first metal layer serves as a lower electrode of the capacitor; a glue/barrier layer interposed between the first metal layer and the slanted side wall of the self align contact window; a TiSi 2 layer formed around an interface between the source/drain region and the glue/barrier layer; a dielectric layer covering the first metal layer; and a second metal layer covering the dielectric layer, wherein the second metal layer serves as an upper electrode of the capacitor.
Claim 17
Dependent Claim 42 words
The structure of claim 14, wherein the transistor comprises a spacer formed on a sidewall of the gate, the self align contact window exposes a portion of the spacer, and the first metal layer is further on the portion of the spacer.

References Cited (Backward Citations)

US4845539A Cited
US5952687A Cited
US5936273A Cited
US5672543A Cited
US5918120A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2003-06-20 2003-12-20 2004-06-20 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2007-06-20 2007-12-20 2008-06-20 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2011-06-20 2011-12-20 2012-06-20 $7700.00 Window Closed / Lapsed

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