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US6074897A Expired / Lapsed US ⏱️ 0.0 years remaining

Integrated circuit bonding method and apparatus

Assignee: Bell Semiconductor LLC
•
Filing: 1999-01-28
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Granted: 2000-06-13
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Expires: 2019-01-28
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Abstract

Abstract A technique for enabling sufficient flow of flux cleaning fluids and an underfill material in the relatively low-profile gap between a flip-chip bonded IC chip and a substrate, such as a printed circuit board, is to provide at least one aperture in the substrate under the IC chip. The use of such an aperture enables, for example, flux cleaning fluid to flow through the aperture into the low-profile gap between the IC chip and the substrate surface, such as by the application of pressure or by gravity, which then exits through openings between formed interconnect bonds at a sufficient flow rate to adequately remove flux residues. An epoxy underfill to the IC chip can be formed in a similar manner. For example, a relatively thick bead of epoxy, such as on the order of the thickness of the IC chip, is deposited or stencil printed on the substrate surface around the edges of the IC chip and capillary action is then relied upon to draw the epoxy into the low-profile gap. Undesirable air pockets which otherwise would develop form the displaced air as the epoxy flows into the low-profile gap can advantageously escape through the aperture of the invention.

Inventors

  • 👤 Yinon Degani
  • 👤 Lawrence Arnold Greenberg

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-03 16:00
CPC Classifications
H; H10; H10W; H10W74/00; H10W74/01; H10W74/012; H05; H05K; H05K1/00; H05K1/18; H05K1/181; H10W40/00; H10W40/10; H10W72/00; H10W72/071; H10W72/072; H10W74/10; H10W74/15; H10W70/00; H10W70/60; H10W70/67; H10W70/68; H10W70/681; H10W72/07231; H10W72/07236; H10W72/073; H10W72/07331; H10W72/07337; H10W72/07338; H10W72/851; H10W72/853; H10W72/856; H10W74/131; H10W74/142; Y; Y10; Y10S; Y10S438/00; Y10S438/906

Claims Analysis

Total Claims: 13
Claim 1
Independent Claim 102 words
A method for bonding an integrated circuit chip to a substrate comprising: providing at least one aperture in a major surface of said substrate; bonding at least two contact pads of said integrated circuit to matching contact pads on said major substrate surface to form corresponding electrical interconnections wherein said integrated circuit covers an area of the substrate containing said at least one aperture, said bonding step forming a low-profile gap between said integrated circuit and said substrate; and flowing cleaning fluid into said low-profile gap through said aperture for removal of at least a portion of undesirable material from said gap.
Claim 2
Independent Claim 102 words
A method for bonding an integrated circuit chip to a substrate comprising: providing at least one aperture in a major surface of said substrate; bonding at least two contact pads of said integrated circuit to matching contact pads on said major substrate surface to form corresponding electrical interconnections wherein said integrated circuit covers an area of the substrate containing said at least one aperture, said bonding step forming a low-profile gap between said integrated circuit and said substrate; and flowing cleaning fluid into said low-profile gap through said aperture for removal of at least a portion of undesirable material from said gap.
Claim 3
Dependent Claim 23 words
The method of claim 1 wherein said bonding step forms said low-profile gap with a height of approximately no greater than 150 μm.
Claim 4
Dependent Claim 23 words
The method of claim 2 wherein said bonding step forms said low-profile gap with a height of approximately no greater than 100 μm.
Claim 5
Dependent Claim 23 words
The method of claim 3 wherein said bonding step forms said low-profile gap with a height of approximately no greater than 50 μm.
Claim 6
Dependent Claim 14 words
The method of claim 1 wherein said fluid is a flux residue cleaning fluid.
Claim 7
Dependent Claim 21 words
The method of claim 1 wherein said fluid is flowed into said low-profile gap substantially based on the effects of gravity.
Claim 8
Independent Claim 132 words
A method for bonding an integrated circuit chip to a substrate comprising: providing at least one aperture in a major surface of said substrate; bonding at least two contact pads of said integrated circuit to matching contact pads on said major substrate surface to from corresponding electrical interconnections wherein said integrated circuit covers an area of the substrate containing said at least one aperture, said bonding step forming a low-profile gap between said integrated circuit and said substrate; providing containment walls on a major surface opposite said major substrate surface; disposing cleaning fluid in a cavity formed by said containment walls and said opposite major substrate surface; and draining said cleaning fluid through said aperture and into said gap for removal of at least a portion of undesirable material from said gap.
Claim 9
Independent Claim 132 words
A method for bonding an integrated circuit chip to a substrate comprising: providing at least one aperture in a major surface of said substrate; bonding at least two contact pads of said integrated circuit to matching contact pads on said major substrate surface to from corresponding electrical interconnections wherein said integrated circuit covers an area of the substrate containing said at least one aperture, said bonding step forming a low-profile gap between said integrated circuit and said substrate; providing containment walls on a major surface opposite said major substrate surface; disposing cleaning fluid in a cavity formed by said containment walls and said opposite major substrate surface; and draining said cleaning fluid through said aperture and into said gap for removal of at least a portion of undesirable material from said gap.
Claim 10
Dependent Claim 23 words
The method of claim 7 wherein said bonding step forms said low-profile gap with a height of approximately no greater than 150 μm.
Claim 11
Dependent Claim 23 words
The method of claim 7 wherein said bonding step forms said low-profile gap with a height of approximately no greater than 100 μm.
Claim 12
Dependent Claim 23 words
The method of claim 7 wherein said bonding step forms said low-profile gap with a height of approximately no greater than 50 μm.
Claim 13
Dependent Claim 14 words
The method of claim 7 wherein said fluid is a flux residue cleaning fluid.

References Cited (Backward Citations)

US4320047A Cited
US5656862A Cited
US5211764A Cited
US5477611A Cited
US5385290A Cited
US5534078A Cited
US5794330A Cited
US5710071A Cited
US5855821A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2003-06-13 2003-12-13 2004-06-13 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2007-06-13 2007-12-13 2008-06-13 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2011-06-13 2011-12-13 2012-06-13 $7700.00 Window Closed / Lapsed

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