Method for assembling an integrated circuit chip package having an underfill material between a chip and a substrate

Claim 1

A method for assembling an integrated circuit chip package having an organic package substrate and an integrated circuit chip, said method comprising the following steps: providing an organic package substrate having, A) a metal core having at least one clearance formed therethrough, B) at least one dielectric layer disposed on each of top and bottom surfaces of said metal core, said at least one dielectric layer being a polytetrafluoroethylene material having a mixture disposed within said material, said mixture containing particulate filler, C) at least one conductive layer disposed on each of said dielectric layers and at least one conductive via electrically connecting said conductive layers, and D) a plurality of interconnect pads adapted to electrically and mechanically mount an integrated circuit chip; providing an integrated circuit chip having disposed on a surface thereof a plurality of solder interconnect members; locating the integrated circuit chip on said organic package substrate in an orientation wherein each of said solder interconnect members of said integrated circuit chip are aligned with an individual interconnect pad of said organic package substrate; heating the organic package substrate and the integrated circuit chip to a temperature of less than 260° C. to thereby mechanically and electrically attach the integrated circuit chip to the organic package substrate; cleaning said integrated circuit chip and said organic package substrate with a solvent liquid; plasma cleaning said integrated circuit chip and said organic package substrate; heating said integrated circuit chip and said organic package substrate to a temperature ranging from about 70° C. to about 90° C.; providing an underfill bonding material having an elastic modulus less than about 10 Gpa, a Poisson's Ratio less than about 0.29, a coefficient of thermal expansion of less than about 32 ppm/°C., and a linear cure shrinkage of less than about 0.2%; disposing said underfill bonding material between said integrated circuit chip and said organic package substrate; and curing said underfill bonding material.

Claim 2

A method for assembling an integrated circuit chip package having an organic package substrate and an integrated circuit chip, said method comprising the following steps: providing an organic package substrate having, A) a metal core having at least one clearance formed therethrough, B) at least one dielectric layer disposed on each of top and bottom surfaces of said metal core, said at least one dielectric layer being a polytetrafluoroethylene material having a mixture disposed within said material, said mixture containing particulate filler, C) at least one conductive layer disposed on each of said dielectric layers and at least one conductive via electrically connecting said conductive layers, and D) a plurality of interconnect pads adapted to electrically and mechanically mount an integrated circuit chip; providing an integrated circuit chip having disposed on a surface thereof a plurality of solder interconnect members; locating the integrated circuit chip on said organic package substrate in an orientation wherein each of said solder interconnect members of said integrated circuit chip are aligned with an individual interconnect pad of said organic package substrate; heating the organic package substrate and the integrated circuit chip to a temperature of less than 260° C. to thereby mechanically and electrically attach the integrated circuit chip to the organic package substrate; cleaning said integrated circuit chip and said organic package substrate with a solvent liquid; plasma cleaning said integrated circuit chip and said organic package substrate; heating said integrated circuit chip and said organic package substrate to a temperature ranging from about 70° C. to about 90° C.; providing an underfill bonding material having an elastic modulus less than about 10 Gpa, a Poisson's Ratio less than about 0.29, a coefficient of thermal expansion of less than about 32 ppm/°C., and a linear cure shrinkage of less than about 0.2%; disposing said underfill bonding material between said integrated circuit chip and said organic package substrate; and curing said underfill bonding material.

Claim 3

A method for assembling an integrated circuit chip package having an organic package substrate and an integrated circuit chip, said method comprising the following steps: providing an organic package substrate having, A) a metal core having at least one clearance formed therethrough, B) at least one dielectric layer disposed on each of top and bottom surfaces of said metal core, said at least one dielectric layer being a fluoropolymer material having a mixture disposed within said material, said mixture containing particulate filler, C) at least one conductive layer disposed on each of said dielectric layers and at least one conductive via electrically connecting said conductive layers, and D) a plurality of interconnect pads adapted to electrically and mechanically mount an integrated circuit chip; providing an integrated circuit chip having disposed on a surface thereof a plurality of solder interconnect members; locating the integrated circuit chip on said organic package substrate in an orientation wherein each of said solder interconnect members of said integrated circuit chip are aligned with an individual interconnect pad of said organic package substrate; heating the organic package substrate and the integrated circuit chip to a temperature of less than 260° C. to thereby mechanically and electrically attach the integrated circuit chip to the organic package substrate; cleaning said integrated circuit chip and said organic package substrate with a solvent liquid; plasma cleaning said integrated circuit chip and said organic package substrate; heating said integrated circuit chip and said organic package substrate to a temperature ranging from about 70° C. to about 90° C.; providing an underfill bonding material having an elastic modulus less than about 10 Gpa, a Poisson's Ratio less than about 0.29, a coefficient of thermal expansion of less than about 32 ppm/°C., and a linear cure shrinkage of less than about 0.2%; disposing said underfill bonding material between said integrated circuit chip and said organic package substrate; and curing said underfill bonding material.

Claim 4

A method for assembling an integrated circuit chip package having an organic package substrate and an integrated circuit chip, said method comprising the following steps: providing an organic package substrate having, A) a metal core having at least one clearance formed therethrough, B) at least one dielectric layer disposed on each of top and bottom surfaces of said metal core, said at least one dielectric layer being a fluoropolymer material having a mixture disposed within said material, said mixture containing particulate filler, C) at least one conductive layer disposed on each of said dielectric layers and at least one conductive via electrically connecting said conductive layers, and D) a plurality of interconnect pads adapted to electrically and mechanically mount an integrated circuit chip; providing an integrated circuit chip having disposed on a surface thereof a plurality of solder interconnect members; locating the integrated circuit chip on said organic package substrate in an orientation wherein each of said solder interconnect members of said integrated circuit chip are aligned with an individual interconnect pad of said organic package substrate; heating the organic package substrate and the integrated circuit chip to a temperature of less than 260° C. to thereby mechanically and electrically attach the integrated circuit chip to the organic package substrate; cleaning said integrated circuit chip and said organic package substrate with a solvent liquid; plasma cleaning said integrated circuit chip and said organic package substrate; heating said integrated circuit chip and said organic package substrate to a temperature ranging from about 70° C. to about 90° C.; providing an underfill bonding material having an elastic modulus less than about 10 Gpa, a Poisson's Ratio less than about 0.29, a coefficient of thermal expansion of less than about 32 ppm/°C., and a linear cure shrinkage of less than about 0.2%; disposing said underfill bonding material between said integrated circuit chip and said organic package substrate; and curing said underfill bonding material.