Method of manufacture of memory device with high coupling ratio

Claim 1

A method of forming a semiconductor memory device with a floating gate electrode, an interelectrode dielectric layer and a control gate electrode including the steps as follows: providing a doped silicon semiconductor substrate with a surface covered with a tunnel oxide layer, forming a blanket, doped, first polysilicon layer having a top over said tunnel oxide layer, forming a first dielectric layer with a top surface over said top of said first polysilicon layer, forming a first mask with a window therethrough over said first dielectric layer, etching through said window to pattern said first dielectric layer extending said window down through said first dielectric layer to expose said first polysilicon layer and stripping away said first mask, etching through said window to remove material therebelow in said first polysilicon layer and said tunnel oxide layer down to extend said window down to expose a portion of said surface of said silicon semiconductor substrate thereby exposing sidewalls of said first dielectric layer and said first polysilicon layer, forming a gate oxide region on said portion of said surface of said silicon semiconductor substrate and forming reoxidation regions on said sidewalls of said first polysilicon layer, said gate oxide region having an exposed surface at the bottom of said window, and forming reoxidation regions on said sidewalls of said first polysilicon layer, said gate oxide region having an exposed surface at the bottom of said window, forming a blanket, doped, second polysilicon layer over said first dielectric layer extending down into said windows onto said gate oxide region and onto said sidewalls of said first dielectric layer and said reoxidation regions on said sidewalls of said first polysilicon layer, etching back said second polysilicon layer below said top surface of said first dielectric layer to a level above said top of said first polysilicon layer, stripping away those portions of said first dielectric layer which remain to expose said top of said first polysilicon layer, said reoxidation regions, and sidewalls of said second polysilicon layer, forming a blanket, third polysilicon layer over said top of said first polysilicon layer, said reoxidation regions, and said second polysilicon layer, forming an interpolysilicon dielectric layer and a fourth polysilicon layer successively above said third polysilicon layer, forming a second mask over said third polysilicon layer, said second mask being used for patterning a gate conductor stack above said gate oxide region by etching away portions of said fourth polysilicon layer, said interpolysilicon dielectric layer, said third polysilicon layer, said second polysilicon layer, and said tunnel oxide layer exposed through openings in said second mask to expose said surface of said substrate on either side of said gate oxide layer thereby forming said floating gate electrode, said interpolysilicon dielectric layer and said control gate electrode over said device centered over said gate oxide region, said floating gate electrode being formed by said third polysilicon layer which remains, said second polysilicon layer which remains, and said first polysilicon layer which remains with said second polysilicon layer which remains connecting said first layer portion which remains to said second layer portion which remains, forming self-aligned source/drain regions below exposed portions of said substrate with said source drain regions extending beneath said tunnel oxide layer.

Claim 2

A method of forming a semiconductor memory device with a floating gate electrode, an interelectrode dielectric layer and a control gate electrode including the steps as follows: providing a doped silicon semiconductor substrate with a surface covered with a tunnel oxide layer, forming a blanket, doped, first polysilicon layer having a top over said tunnel oxide layer, forming a first dielectric layer with a top surface over said top of said first polysilicon layer, forming a first mask with a window therethrough over said first dielectric layer, etching through said window to pattern said first dielectric layer extending said window down through said first dielectric layer to expose said first polysilicon layer and stripping away said first mask, etching through said window to remove material therebelow in said first polysilicon layer and said tunnel oxide layer down to extend said window down to expose a portion of said surface of said silicon semiconductor substrate thereby exposing sidewalls of said first dielectric layer and said first polysilicon layer, forming a gate oxide region on said portion of said surface of said silicon semiconductor substrate and forming reoxidation regions on said sidewalls of said first polysilicon layer, said gate oxide region having an exposed surface at the bottom of said window, and forming reoxidation regions on said sidewalls of said first polysilicon layer, said gate oxide region having an exposed surface at the bottom of said window, forming a blanket, doped, second polysilicon layer over said first dielectric layer extending down into said windows onto said gate oxide region and onto said sidewalls of said first dielectric layer and said reoxidation regions on said sidewalls of said first polysilicon layer, etching back said second polysilicon layer below said top surface of said first dielectric layer to a level above said top of said first polysilicon layer, stripping away those portions of said first dielectric layer which remain to expose said top of said first polysilicon layer, said reoxidation regions, and sidewalls of said second polysilicon layer, forming a blanket, third polysilicon layer over said top of said first polysilicon layer, said reoxidation regions, and said second polysilicon layer, forming an interpolysilicon dielectric layer and a fourth polysilicon layer successively above said third polysilicon layer, forming a second mask over said third polysilicon layer, said second mask being used for patterning a gate conductor stack above said gate oxide region by etching away portions of said fourth polysilicon layer, said interpolysilicon dielectric layer, said third polysilicon layer, said second polysilicon layer, and said tunnel oxide layer exposed through openings in said second mask to expose said surface of said substrate on either side of said gate oxide layer thereby forming said floating gate electrode, said interpolysilicon dielectric layer and said control gate electrode over said device centered over said gate oxide region, said floating gate electrode being formed by said third polysilicon layer which remains, said second polysilicon layer which remains, and said first polysilicon layer which remains with said second polysilicon layer which remains connecting said first layer portion which remains to said second layer portion which remains, forming self-aligned source/drain regions below exposed portions of said substrate with said source drain regions extending beneath said tunnel oxide layer.

Claim 7

A method of forming a semiconductor memory device with floating gate electrode, an interelectrode dielectric layer and a control gate electrode including the steps as follows: providing a doped silicon semiconductor substrate with a surface covered with a tunnel oxide layer, forming a blanket, doped, first polysilicon layer having a top over said tunnel oxide layer, forming a first dielectric layer with a top surface over said top of said first polysilicon layer, forming a first mask with a window therethrough over said first dielectric layer, etching through said window to pattern said first dielectric layer extending said window down through said first dielectric layer to expose said first polysilicon layer and stripping away said first mask, etching through said window to remove material therebelow in said first polysilicon layer and said tunnel oxide layer down to extend said window down to expose a portion of said surface of said silicon semiconductor substrate thereby exposing sidewalls of said first dielectric layer and said first polysilicon layer, forming a gate oxide region on said portion of said surface of said silicon semiconductor substrate, said gate oxide region being substantially thicker than said tunnel oxide layer and being located beneath the center of the location for said floating gate electrode, forming reoxidation regions on said sidewalls of said first polysilicon layer, said gate oxide region having an exposed surface at the bottom of said window, forming a blanket, doped, second polysilicon layer over said first dielectric layer extending down into said windows onto said gate oxide region and onto said sidewalls of said first dielectric layer and said reoxidation regions on said sidewalls of said first polysilicon layer, etching back said second polysilicon layer below said top surface of said first dielectric layer to a level above said top of said first polysilicon layer, stripping away those portions of said first dielectric layer which remain to expose said top of said first polysilicon layer, said reoxidation regions, and sidewalls of said second polysilicon layer, forming a blanket, third polysilicon layer over said top of said first polysilicon layer, said reoxidation regions, and said second polysilicon layer, forming an interpolysilicon dielectric layer and a fourth polysilicon layer successively above said third polysilicon layer, said interelectrode dielectric layer is composed of ONO material, forming a second mask over said third polysilicon layer, said second mask being used for patterning a gate conductor stack above said gate oxide region by etching away portions of said fourth polysilicon layer, said interpolysilicon dielectric layer, said third polysilicon layer, said second polysilicon layer, and said tunnel oxide layer exposed through openings in said second mask to expose said surface of said substrate on either side of said gate oxide layer thereby forming said floating gate electrode, said interpolysilicon dielectric layer and said control gate electrode over said device centered over said gate oxide region, said floating gate electrode being formed by said third polysilicon layer which remains, said second polysilicon layer which remains, and said first polysilicon layer which remains with said second polysilicon layer which remains connecting said first layer portion which remains to said second layer portion which remains, forming source/drain regions below exposed portions of said substrate with said source drain regions extending beneath said tunnel oxide layer, said self-aligned source/drain regions in said substrate are formed by a LATI ion implantation process performed at an angle of about 45°, and said tunnel oxide layer has a thickness from about 80 Å to about 100 Å and a gate oxide region has a thickness from about 150 Å to about 200 Å.

Claim 8

A method of forming a semiconductor memory device with floating gate electrode, an interelectrode dielectric layer and a control gate electrode including the steps as follows: providing a doped silicon semiconductor substrate with a surface covered with a tunnel oxide layer, forming a blanket, doped, first polysilicon layer having a top over said tunnel oxide layer, forming a first dielectric layer with a top surface over said top of said first polysilicon layer, forming a first mask with a window therethrough over said first dielectric layer, etching through said window to pattern said first dielectric layer extending said window down through said first dielectric layer to expose said first polysilicon layer and stripping away said first mask, etching through said window to remove material therebelow in said first polysilicon layer and said tunnel oxide layer down to extend said window down to expose a portion of said surface of said silicon semiconductor substrate thereby exposing sidewalls of said first dielectric layer and said first polysilicon layer, forming a gate oxide region on said portion of said surface of said silicon semiconductor substrate, said gate oxide region being substantially thicker than said tunnel oxide layer and being located beneath the center of the location for said floating gate electrode, forming reoxidation regions on said sidewalls of said first polysilicon layer, said gate oxide region having an exposed surface at the bottom of said window, forming a blanket, doped, second polysilicon layer over said first dielectric layer extending down into said windows onto said gate oxide region and onto said sidewalls of said first dielectric layer and said reoxidation regions on said sidewalls of said first polysilicon layer, etching back said second polysilicon layer below said top surface of said first dielectric layer to a level above said top of said first polysilicon layer, stripping away those portions of said first dielectric layer which remain to expose said top of said first polysilicon layer, said reoxidation regions, and sidewalls of said second polysilicon layer, forming a blanket, third polysilicon layer over said top of said first polysilicon layer, said reoxidation regions, and said second polysilicon layer, forming an interpolysilicon dielectric layer and a fourth polysilicon layer successively above said third polysilicon layer, said interelectrode dielectric layer is composed of ONO material, forming a second mask over said third polysilicon layer, said second mask being used for patterning a gate conductor stack above said gate oxide region by etching away portions of said fourth polysilicon layer, said interpolysilicon dielectric layer, said third polysilicon layer, said second polysilicon layer, and said tunnel oxide layer exposed through openings in said second mask to expose said surface of said substrate on either side of said gate oxide layer thereby forming said floating gate electrode, said interpolysilicon dielectric layer and said control gate electrode over said device centered over said gate oxide region, said floating gate electrode being formed by said third polysilicon layer which remains, said second polysilicon layer which remains, and said first polysilicon layer which remains with said second polysilicon layer which remains connecting said first layer portion which remains to said second layer portion which remains, forming source/drain regions below exposed portions of said substrate with said source drain regions extending beneath said tunnel oxide layer, said self-aligned source/drain regions in said substrate are formed by a LATI ion implantation process performed at an angle of about 45°, and said tunnel oxide layer has a thickness from about 80 Å to about 100 Å and a gate oxide region has a thickness from about 150 Å to about 200 Å.