Image sensor pixel circuit

Claim 2

An image sensing device having a plurality of imager cells, each of said imager cells comprising: a photosensitive element providing a photocharge responsive to incoming light; a first transistor coupled to an activation line carrying an activation signal to a first plurality of imager cells of said device to selectively activate cells for image data readout, said first transistor operable to transfer said photocharge towards a reference circuit node within said imager cell responsive to said activation signal; a second transistor operably coupled to said first transistor, said second transistor operative to selectively set a voltage level at said reference node; and a third transistor having a control terminal coupled to said reference node, and an output terminal coupled to an output data line common to a second plurality of imager cells, said third transistor providing an output signal on said data line related to said reference node voltage and indicative of an amount of light incident upon said photosensitive element.

Claim 3

The device of claim 1 wherein said photosensitive element comprises a photodiode.

Claim 4

The device of claim 2 wherein said photodiode comprises a pinned photodiode.

Claim 5

The device of claim 1 wherein said photosensitive element comprises a photogate.

Claim 6

The device of claim 1 wherein said first, second and third transistors are MOSFETs.

Claim 7

The device of claim 1 wherein said first plurality of imager cells comprise a row of imager cells and said activation line comprises a row select line carrying a row select signal, said second plurality of imager cells comprises a column of imager cells, and said output data line is a column data line.

Claim 8

The device of claim 1 wherein during a signal read operation from an active cell, said third transistor of inactive cells is caused to turn off, whereby said reference nodes of inactive cells are isolated from said output data line.

Claim 9

The device of claim 1 wherein noise of image data is reduced using correlation double sampling, by said third transistor providing a first output signal indicative of a reset level during a first sampling interval of a readout interval and a second output signal indicative of light intensity during a second sampling interval of said readout interval, said first and second outputs being compared, whereby image data noise is reduced.

Claim 10

The device of claim 1 wherein said output signal is a voltage.

Claim 11

The device of claim 1 wherein said output signal comprises a current output.

Claim 12

The device of claim 1, further comprising a shutter transistor coupled between said photosensitive element and said first transistor, said shutter transistor performing an electronic shuttering function.

Claim 13

The device of claim 1, further comprising an anti-blooming transistor coupled to said photosensitive element.

Claim 14

The device of claim 12, further comprising a shutter transistor coupled between said photosensitive element and said first transistor, said shutter transistor performing an electronic shuttering function.

Claim 15

The device of claim 12 wherein a conducting terminal of said third transistor and said anti-blooming transistor are connected to a common voltage supply line.

Claim 16

The device of claim 12 wherein conducting terminals of said anti-blooming transistor and said third transistor are connected to different voltage supply lines.

Claim 17

The device of claim 1 wherein conducting terminals of said second and third transistors are connected to a common voltage supply line that supplies voltage to said first plurality of imager cells.

Claim 18

The device of claim 1 wherein conducting terminals of said second and third transistors are connected to different voltage supply lines.

Claim 19

The device of claim 1, including CMOS timing and logic circuitry supplying voltage waveforms to said imager cells to control image data readout.

Claim 20

An image sensor having a plurality of imager cells arranged in rows and columns, each of said imager cells comprising: a photosensitive element providing a photocharge responsive to incoming light; a first transistor having a control terminal coupled to a row select line carrying a row select signal to imager cells of a common row to selectively activate imager cells for image data readout, said first transistor operable to transfer said photocharge towards a reference circuit node within said imager cell responsive to said row select signal; a second transistor operably coupled to said first transistor, said second transistor operative to selectively set a voltage level at said reference node responsive to a reset signal applied to a control terminal thereof, said reset signal being applied to imager cells of a common row; and a third transistor having a control terminal coupled to said reference node, and an output terminal coupled to a column data line, said third transistor providing, on said column data line during an image data readout interval for the imager cells of said common row, a first output signal indicative of a reset level at said reference node in a first sampling interval of the readout interval, and a second output signal related to said reference node voltage and indicative of an amount of light incident upon said photosensitive element during a second sampling interval within said readout interval, wherein a comparison is performed between said first and second output signals to extract image data with noise removed.

Claim 21

An image sensor having a plurality of imager cells arranged in rows and columns, each of said imager cells comprising: a photosensitive element providing a photocharge responsive to incoming light; a first transistor having a control terminal coupled to a row select line carrying a row select signal to imager cells of a common row to selectively activate imager cells for image data readout, said first transistor operable to transfer said photocharge towards a reference circuit node within said imager cell responsive to said row select signal; a second transistor operably coupled to said first transistor, said second transistor operative to selectively set a voltage level at said reference node responsive to a reset signal applied to a control terminal thereof, said reset signal being applied to imager cells of a common row; and a third transistor having a control terminal coupled to said reference node, and an output terminal coupled to a column data line, said third transistor providing, on said column data line during an image data readout interval for the imager cells of said common row, a first output signal indicative of a reset level at said reference node in a first sampling interval of the readout interval, and a second output signal related to said reference node voltage and indicative of an amount of light incident upon said photosensitive element during a second sampling interval within said readout interval, wherein a comparison is performed between said first and second output signals to extract image data with noise removed.

Claim 22

The image sensor of claim 19 wherein during said second sampling interval, said row select signal is high whereby said first transistor is turned on.

Claim 23

The image sensor of claim 19 wherein immediately prior to said second sampling interval, said row select signal is high and said first transistor is on, and during said second sampling interval, said row select signal is low and said first transistor is off, whereby clock feedthrough through said first transistor is reduced.

Claim 24

The image sensor of claim 19 wherein during said readout interval and prior to said first sampling interval, said reset signal is high and a reset voltage VR applied to a conducting terminal of said second transistor is high, and during said first sampling interval, said reset signal is low and said second transistor is off.

Claim 25

The image sensor of claim 20 wherein during a time interval just prior to a base reset/read interval, said reset signal is brought low, said reset level being high during a first portion of said base reset/read interval, and low during a second portion of said base reset/read interval, said second sampling interval occurring during said second portion of said base reset/read interval, whereby clock feedthrough through said second transistor is reduced.

Claim 26

The image sensor of claim 19 wherein during a time prior to said readout interval, photocharge collection takes place wherein said reset signal is high, said row select signal is low and a voltage VR applied to a conducting terminal of said second transistor is low, thereby holding said reference circuit node at a low potential and turning said third transistor off.

Claim 27

An image sensor having an array of imager cells arranged in rows and columns, with CMOS timing and logic circuitry applying control signals to said array, each of said imager cells comprising: a photosensitive element providing a photocharge responsive to incoming light; a first field effect transistor (FET) having a gate terminal coupled to a row select line carrying a row select signal to imager cells of a common row to selectively activate imager cells for image data readout, and a conducting terminal coupled to a reference circuit node, said first FET operable to transfer said photocharge towards said reference circuit node within said imager cell responsive to said row select signal; a second FET operably coupled to said first FET, said second FET operative to selectively set a voltage level at said reference node responsive to a reset signal applied to a gate terminal thereof, said reset signal being applied to imager cells of a common row, said second FET having a first conducting terminal coupled to said reference circuit node and a second conducting terminal coupled to a control line common to said common row and carrying a signal VR; and a third FET having a gate coupled to said reference node, and an output terminal coupled to a column data line, said third transistor providing, on said column date line, during an image data readout interval for the imager cells of said common row, a first output signal indicative of a reset level at said reference node in a first sampling interval of the readout interval, and a second output signal related to said reference node voltage and indicative of an amount of light incident upon said photosensitive element during a second sampling interval within said readout interval, wherein a comparison is performed between said first and second output signals to extract image data with noise removed.

Claim 28

An image sensor having an array of imager cells arranged in rows and columns, with CMOS timing and logic circuitry applying control signals to said array, each of said imager cells comprising: a photosensitive element providing a photocharge responsive to incoming light; a first field effect transistor (FET) having a gate terminal coupled to a row select line carrying a row select signal to imager cells of a common row to selectively activate imager cells for image data readout, and a conducting terminal coupled to a reference circuit node, said first FET operable to transfer said photocharge towards said reference circuit node within said imager cell responsive to said row select signal; a second FET operably coupled to said first FET, said second FET operative to selectively set a voltage level at said reference node responsive to a reset signal applied to a gate terminal thereof, said reset signal being applied to imager cells of a common row, said second FET having a first conducting terminal coupled to said reference circuit node and a second conducting terminal coupled to a control line common to said common row and carrying a signal VR; and a third FET having a gate coupled to said reference node, and an output terminal coupled to a column data line, said third transistor providing, on said column date line, during an image data readout interval for the imager cells of said common row, a first output signal indicative of a reset level at said reference node in a first sampling interval of the readout interval, and a second output signal related to said reference node voltage and indicative of an amount of light incident upon said photosensitive element during a second sampling interval within said readout interval, wherein a comparison is performed between said first and second output signals to extract image data with noise removed.

Claim 29

The image sensor of claim 25, wherein during said readout interval, the VR signal applied to imager cells of inactive rows is low, the reset signal applied to imager cells of inactive cells is high, and the row select signal applied to inactive rows is low.