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Misted deposition method of fabricating integrated circuits

Assignee: Symetrix Corp
•
Filing: 1995-01-23
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Granted: 1999-03-30
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Expires: 2015-01-23
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Abstract

Abstract A method and apparatus are disclosed for forming thin films of chemical compounds utilized in integrated circuits. The method includes steps forming a precursor liquid comprising a chemical compound in a solvent, providing a substrate within a vacuum deposition chamber, producing a mist of the precursor liquid, and flowing the mist into the deposition chamber while maintaining the chamber at ambient temperature to deposit a layer of the precursor liquid on the substrate. The liquid is dried to form a thin film of a solid material on the substrate, then the integrated circuit is completed to include at least a portion of the film of solid material in a component of the integrated circuit.

Inventors

  • 👤 Larry D. McMillan
  • 👤 Carlos A. Paz de Araujo
  • 👤 Tommy L. Roberts

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 02:19
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/60; H10P14/63; H10P14/6326; H10P14/6342; B; B05; B05D; B05D1/00; B05D1/60; B05D3/00; B05D3/04; B05D3/0493; C; C23; C23C; C23C16/00; C23C16/22; C23C16/30; C23C16/40; C23C16/409; C23C16/44; C23C16/4412; C23C16/448; C23C16/4486; C23C16/455; C23C16/45561; C23C16/45563; C23C16/4558; C23C16/46; C23C16/48; C23C16/482; C23C16/52; C23C18/00; C23C18/02; C23C18/12; C23C18/1204; C23C18/1208; C23C18/1216; C23C18/125; C23C18/1287; C23C18/1295; C23C18/14; C23C18/143; C23C26/00; C23C26/02; C30; C30B; C30B29/00; C30B29/60; C30B29/68; C30B7/00; H10B; H10B53/00; H10D; H10D1/00; H10D1/60; H10D1/68; H10D1/682; H10D1/684; H10D1/692; H10N; H10N30/00; H10N30/01; H10N30/07; H10N30/074; H10P14/65; H10P14/6516; H10P14/6536; H10P14/6538; H05; H05K; H05K3/00; H05K3/10; H05K3/105; H10P14/66; H10P14/668; H10P14/69; H10P14/692; H10P14/6938; H10P14/69398; Y; Y10; Y10S; Y10S427/00; Y10S427/101

Claims Analysis

Total Claims: 20
Claim 1
Independent Claim 121 words
A method of fabricating an integrated circuit comprising the steps of: (a) providing a liquid precursor comprising: a metal compound selected from the group consisting of metal alkoxides, metal carboxylates, and derivatives of metal alkoxides and metal carboxylates; and a solvent; (b) placing a substrate inside an enclosed deposition chamber; (c) producing a mist of said liquid precursor; (d) flowing said mist into said deposition chamber to form a film of precursor liquid on said substrate; (e) treating the precursor liquid to form a thin film of solid material on said substrate; and (f) continuing the fabrication of said integrated circuit to include at least a portion of said thin film of solid material in a component of said integrated circuit.
Claim 2
Independent Claim 121 words
A method of fabricating an integrated circuit comprising the steps of: (a) providing a liquid precursor comprising: a metal compound selected from the group consisting of metal alkoxides, metal carboxylates, and derivatives of metal alkoxides and metal carboxylates; and a solvent; (b) placing a substrate inside an enclosed deposition chamber; (c) producing a mist of said liquid precursor; (d) flowing said mist into said deposition chamber to form a film of precursor liquid on said substrate; (e) treating the precursor liquid to form a thin film of solid material on said substrate; and (f) continuing the fabrication of said integrated circuit to include at least a portion of said thin film of solid material in a component of said integrated circuit.
Claim 3
Dependent Claim 13 words
The method of claim 1, wherein said metal compound comprises a metal alkoxide.
Claim 4
Dependent Claim 13 words
The method of claim 1, wherein said metal compound comprises a metal carboxylate.
Claim 5
Dependent Claim 10 words
The method of claim 1, wherein said solvent comprises 2-methoxyethanol.
Claim 6
Dependent Claim 10 words
The method of claim 1, wherein said solvent comprises methanol.
Claim 7
Dependent Claim 12 words
The method of claim 1, wherein said step of treating comprises drying.
Claim 8
Dependent Claim 23 words
The method of claim 6 wherein said step of drying comprises maintaining a sub-atmospheric pressure greater than 200 Torr in said deposition chamber.
Claim 9
Dependent Claim 19 words
The method of claim 6, wherein said step of treating further comprises heating said film which has been dried.
Claim 10
Dependent Claim 21 words
The method of claim 8, wherein said step of treating further comprises annealing said film which has been dried and heated.
Claim 11
Dependent Claim 26 words
The method of claim 1, wherein the step of flowing said mist into said deposition chamber is performed while maintaining a vacuum in the deposition chamber.
Claim 12
Dependent Claim 11 words
The method of claim 1, wherein said mist is an aerosol.
Claim 13
Dependent Claim 45 words
The method of claim 1, wherein a surface of said substrate defines a substrate plane, and said mist is flowed between said substrate and a barrier plate located within said deposition chamber in a spaced relation to said substrate and parallel to said substrate plane.
Claim 14
Dependent Claim 21 words
The method of claim 1, wherein said step of flowing is performed while maintaining said deposition chamber at substantially ambient temperature.
Claim 15
Independent Claim 111 words
A method of fabricating an integrated circuit comprising the steps of: (a) providing a liquid precursor comprising: a chemical compound including a metal-oxide bond; (b) placing a substrate inside an enclosed deposition chamber; (c) producing a mist of said liquid precursor; (d) injecting said mist into said deposition chamber to form a film of precursor liquid on said substrate; (e) treating the precursor liquid to form a thin film of solid material on said substrate, said solid material including said metal-oxide bond; and (f) continuing the fabrication of said integrated circuit to include at least a portion of said thin film of solid material in a component of said integrated circuit.
Claim 16
Independent Claim 111 words
A method of fabricating an integrated circuit comprising the steps of: (a) providing a liquid precursor comprising: a chemical compound including a metal-oxide bond; (b) placing a substrate inside an enclosed deposition chamber; (c) producing a mist of said liquid precursor; (d) injecting said mist into said deposition chamber to form a film of precursor liquid on said substrate; (e) treating the precursor liquid to form a thin film of solid material on said substrate, said solid material including said metal-oxide bond; and (f) continuing the fabrication of said integrated circuit to include at least a portion of said thin film of solid material in a component of said integrated circuit.
Claim 17
Dependent Claim 13 words
The method of claim 14, wherein said chemical compound comprises a metal alkoxide.
Claim 18
Dependent Claim 13 words
The method of claim 14, wherein said chemical compound comprises a metal carboxylate.
Claim 19
Dependent Claim 12 words
The method of claim 14 wherein said step of treating comprises drying.
Claim 20
Dependent Claim 18 words
The method of claim 14 wherein said step of treating comprises applying ultraviolet radiation to said precursor liquid.

References Cited (Backward Citations)

US4571350A Cited
US4595609A Cited
US4725344A Cited
US4993361A Cited
WO1989007667A1 Cited
US5393564A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2002-03-29 2002-09-28 2003-03-30 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2006-03-29 2006-09-28 2007-03-30 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2010-03-29 2010-09-28 2011-03-30 $7700.00 Window Closed / Lapsed

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