Patent US5879964A successfully refreshed from Google Patents.
← Back to Patent Explorer
US5879964A Expired / Lapsed US ⏱️ 0.0 years remaining

Method for fabricating chip size packages using lamination process

Assignee: Korea Advanced Institute of Science and Technology
•
Filing: 1998-06-26
•
Granted: 1999-03-09
•
Expires: 2018-06-26
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract A method for fabricating chip size packages which uses a lamination process, thereby not only achieving an improvement in the reliability of final electronic products, a reduction in the manufacturing costs, and a mass production resulting in a high marketability, but also being applicable to the fabrication of packages for both memory and non-memory chips and enabling the final electronic products to have high electronic performance while making the package size of the final electronic products not greater than 1.2 times the semiconductor chip size. The method includes the steps of cutting a wafer into a plurality of wafer strips each having several dies, arranging the wafer strips on an adhesive-coated polymer film supported by an annular frame in such a manner that they are aligned with each other while being uniformly spaced from one another, bonding the aligned wafer strips to the polymer film in accordance with a lamination process, forming a polymer dam made of an epoxy-based polymer on the polymer film around a wafer region, forming an encapsulant encapsulating the wafer strips, forming a double laminated polymer film to encapsulate the chips as an alternative encapsulation method, forming via holes at positions respectively corresponding to pads of chips through the polymer film, forming an array of I/O pads for the chips, fusing solder balls to the I/O pads, and cutting several ten dies integrally formed in one lot into separate packages.

Inventors

  • 👤 Kyung Wook Paik
  • 👤 Se Young Jang

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-04 14:25
CPC Classifications
H; H10; H10W; H10W74/00; H10W74/10; H10W74/111; H10W74/129; H10W70/00; H10W70/01; H10W70/05; H10W70/08; H10W70/09; H10W72/00; H10W72/01; H10W72/0198; H10W70/60; H10W72/20; H10W72/241; H10W72/29; H10W72/90; H10W72/941; H10W72/9413

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 313 words
A method for fabricating chip size packages, comprising the steps of: cutting a wafer, on which desired circuit patterns have been formed, into a plurality of wafer strips each having several dies, using a diamond saw; arranging the wafer strips on a stress reducing thermoplastic adhesive-coated polymer film supported by an annular frame in such a manner that they are aligned with each other while being uniformly spaced from one another by about 5 mm and in such a manner that the upper surface of each wafer strip faces the surface of the polymer film opposite to the annular frame; bonding the aligned wafer strips to the polymer film in accordance with a lamination process; forming a polymer dam made of an epoxy-based polymer on the surface of the polymer film, to which the wafer strips are bonded, around a wafer region where the wafer strips are disposed, filling an epoxy-based polymer in the wafer region defined by the polymer dam, thereby forming an encapsulant encapsulating the wafer strips, and curing the encapsulant; forming a double laminated polymer film to encapsulate the chips as an alternative encapsulation method; forming via holes at positions respectively corresponding to pads of chips through the polymer film, forming a solderable Ti/Ni/Cu metal thin film over the polymer film, forming a photoresist film over the solderable metal thin film, patterning the photoresist film, and patterning the metal thin film while using the patterned photoresist film as a mask, thereby forming an array of I/O pads for the chips; coating a flux on the I/O pads, arranging solder balls on the I/O pads, respectively, fusing the solder balls to the associated I/O pads using a solder reflow oven, and removing the flux using an organic solvent; and polishing the backside of the resulting epoxy encapsulated structure, and cutting several ten dies integrally formed in one lot into separate packages.
Claim 2
Independent Claim 313 words
A method for fabricating chip size packages, comprising the steps of: cutting a wafer, on which desired circuit patterns have been formed, into a plurality of wafer strips each having several dies, using a diamond saw; arranging the wafer strips on a stress reducing thermoplastic adhesive-coated polymer film supported by an annular frame in such a manner that they are aligned with each other while being uniformly spaced from one another by about 5 mm and in such a manner that the upper surface of each wafer strip faces the surface of the polymer film opposite to the annular frame; bonding the aligned wafer strips to the polymer film in accordance with a lamination process; forming a polymer dam made of an epoxy-based polymer on the surface of the polymer film, to which the wafer strips are bonded, around a wafer region where the wafer strips are disposed, filling an epoxy-based polymer in the wafer region defined by the polymer dam, thereby forming an encapsulant encapsulating the wafer strips, and curing the encapsulant; forming a double laminated polymer film to encapsulate the chips as an alternative encapsulation method; forming via holes at positions respectively corresponding to pads of chips through the polymer film, forming a solderable Ti/Ni/Cu metal thin film over the polymer film, forming a photoresist film over the solderable metal thin film, patterning the photoresist film, and patterning the metal thin film while using the patterned photoresist film as a mask, thereby forming an array of I/O pads for the chips; coating a flux on the I/O pads, arranging solder balls on the I/O pads, respectively, fusing the solder balls to the associated I/O pads using a solder reflow oven, and removing the flux using an organic solvent; and polishing the backside of the resulting epoxy encapsulated structure, and cutting several ten dies integrally formed in one lot into separate packages.

References Cited (Backward Citations)

US5070040A Cited
US5126286A Cited
US5786237A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2002-03-08 2002-09-07 2003-03-09 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2006-03-08 2006-09-07 2007-03-09 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2010-03-08 2010-09-07 2011-03-09 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag