Image data inspecting method and apparatus providing for equal sizing of first and second image data to be compared

Claim 2

A image data inspecting method, comprising: storing in a memory first image data of a first actual pattern obtained by optically imaging an actual element selected from among a reticle, a mask, a wafer and a chip and second image data of a second pattern comprising a test pattern and obtained from storage; sizing, with the aid of an image data processor, the first and second image data by a same amount; comparing, using a comparator, the sized first and second image data to determine whether the sized first and second image data match; and based upon the determination of the comparing step, correspondingly concluding whether the first pattern matches the second pattern wherein: the sizing step includes a step of enlarging and a step of reducing the first and second image data; and the comparing step includes a first step of comparing the enlarged first and second image data and making a first determination whether Or not the enlarged first and second image data match and a second step of comparing the reduced first and second image data and making a second determination of whether or not the reduced first and second image data match; and the concluding steps based upon the first and second determinations made by the comparing step.

Claim 3

The image data inspecting method as claimed in claim 1, wherein: the sizing step includes a step of enlarging and a step of reducing the first and second image data; and the comparing step includes a first step of comparing the enlarged first and second image data and making a first determination whether or not the enlarged first and second image data match and a second step of comparing the reduced first and second image data and making a second determination of whether or not the reduced first and second image data match; and the concluding step is based upon the first and second determinations made by the comparing step.

Claim 4

The image data inspecting method as claimed in claim 1, wherein the first and second image data have respective first and second signal formats and which further comprises the step of converting one of the first and second signal formats of the respective first and second image data so that the first and second signal formats of the respective first and second image data are the same, prior to performing the comparing step.

Claim 5

The image data inspecting method as claimed in claim 1, which further comprises the step of displaying the determination of the comparing step.

Claim 6

An image data inspecting apparatus, comprising: first means for providing first image data of a first actual pattern obtained by optically imaging an actual element from among a reticle, a mask, a wafer and a chip; second means for providing second image data of a second pattern comprising a test pattern obtained from storage; processing means for sizing the first and second image data by a same amount; memory means, coupled to said processing means, for storing the sized first and second image data; comparator means, coupled to said memory means, for receiving from the memory means and comparing the sized first and second image data to determine whether the sized first and second image data match; and output means, coupled to said comparator means, for outputting a determination of said comparator means wherein: said processing means sizes the first and second image data by selectively and separately, enlarging the first and second image data by the same amount and reducing the first and second image data by the same amount; and said comparator means separately and in a first step compares the enlarged first and second image data to make a first determination whether or not the enlarged first and second image data match and, in a second step, compares the reduced first and second image data to make a second determination whether or not the reduced first and second image data match.

Claim 7

An image data inspecting apparatus, comprising: first means for providing first image data of a first actual pattern obtained by optically imaging an actual element from among a reticle, a mask, a wafer and a chip; second means for providing second image data of a second pattern comprising a test pattern obtained from storage; processing means for sizing the first and second image data by a same amount; memory means, coupled to said processing means, for storing the sized first and second image data; comparator means, coupled to said memory means, for receiving from the memory means and comparing the sized first and second image data to determine whether the sized first and second image data match; and output means, coupled to said comparator means, for outputting a determination of said comparator means wherein: said processing means sizes the first and second image data by selectively and separately, enlarging the first and second image data by the same amount and reducing the first and second image data by the same amount; and said comparator means separately and in a first step compares the enlarged first and second image data to make a first determination whether or not the enlarged first and second image data match and, in a second step, compares the reduced first and second image data to make a second determination whether or not the reduced first and second image data match.

Claim 8

The image data inspecting apparatus as claimed in claim 5, wherein: said processing means sizes the first and second image data by, selectively and separately, enlarging the first and second image data by the same amount and reducing the first and second image data by the same amount; and said comparator means, separately and in a first step, compares the enlarged first and second image data to make a first determination whether or not the enlarged first and second image data match and, in a second step, compares the reduced first and second image data to make a second determination whether or not the reduced first and second image data match.

Claim 9

The image data inspecting apparatus as claimed in claim 5 wherein the first and second image data have respective first and second signal formats, further comprising converting means, coupled to said memory means, for converting one of the first and second signal formats of the respective first and second image data so that the first and second signal formats of the respective first and second image data are the same signal format when the sized first and second image data are compared by said comparator means.

Claim 10

The image data inspecting apparatus as claimed in claim 5, wherein said output means displays the result of the determination of said comparator means.