Nonvolatile semiconductor memory device having memory cell transistor provided with offset region acting as a charge carrier injecting region

Claim 2

A nonvolatile semiconductor memory device comprising: a semiconductor substrate of a first conductivity type; first and second diffusion layers of a second conductivity type formed in said semiconductor substrate and spaced apart by a channel region; a gate electrode overlying a part of said channel region which extends to said first diffusion layer; a first insulating film between said gate electrode and said semiconductor substrate; and a second insulating film comprising at least two layers of different materials and overlying a part of said second diffusion layer and a part of said channel region which extends to said second diffusion layer, one of said at least two layers of said second insulating film being a charge carrier accumulating layer, wherein potentials are applied to said first and second diffusion regions such that avalanche hot carriers are generated which do not pass through said part of said channel region beneath said gate electrode, and either electrons or holes are injected into said charge accumulating layer of said second insulating film in accordance with a potential of said gate electrode.

Claim 3

The memory device according to claim 1, wherein said second insulating film has a thickness less than 30 nm.

Claim 4

The memory device according to claim 1, wherein said second insulating film constitutes a side wall of said gate electrode.

Claim 5

The memory device according to claim 1, wherein said second insulating film comprises a silicon oxide film having a thickness greater than 2 nm and less than 10 nm and a silicon nitride film having a thickness greater than 0.5 nm and less than 7 nm.

Claim 6

The memory device according to claim 1, wherein said first insulating film has the same construction as said second insulating film.

Claim 7

The memory device according to claim 1, wherein said second insulating film comprises at least one silicon oxide film having a thickness greater than 1 nm formed on said charge carrier accumulating layer.

Claim 8

The memory device according to claim 1, wherein said second insulating film comprises a silicon oxide film and a tantalum oxide film.

Claim 9

The memory device according to claim 1, wherein said second insulating film comprises a silicon oxide film and a strontium titanate film.

Claim 10

The memory device according to claim 1, wherein said second insulating film comprises a silicon oxide film and a barium strontium titanate film.

Claim 11

The memory device according to claim 1, wherein said first diffusion layer comprises an outer region lightly doped with impurities and an inner region heavily doped with impurities.

Claim 12

A nonvolatile semiconductor memory device comprising: a semiconductor substrate of a first conductivity type; first and second diffusion layers of a second conductivity type formed in said semiconductor substrate and spaced apart by a channel region; a gate electrode overlying a part of said channel region which extends to said first diffusion layer; a first insulating film between said gate electrode and said semiconductor substrate; a sidewall electrode overlying a part of said second diffusion layer and a part of said channel region which extends to said second diffusion layer, said sidewall electrode being capacitively coupled with said gate electrode; and a second insulating film comprising three layers formed between said sidewall electrode and said part of said second diffusion layer and between said sidewall electrode and said part of said channel region which extends to said second diffusion layer, one of said three layers of said second insulating film being a charge carrier accumulating layer, wherein potentials are applied to said first and second diffusion regions such that avalanche hot carriers are generated which do not pass through said part of said channel region beneath said gate electrode, and at least one type of charge carriers selected from the group consisting of electrons and holes are injected into said charge accumulating layer of said second insulating film in accordance with a potential of said gate electrode.

Claim 13

A nonvolatile semiconductor memory device comprising: a semiconductor substrate of a first conductivity type; first and second diffusion layers of a second conductivity type formed in said semiconductor substrate and spaced apart by a channel region; a gate electrode overlying a part of said channel region which extends to said first diffusion layer; a first insulating film between said gate electrode and said semiconductor substrate; a sidewall electrode overlying a part of said second diffusion layer and a part of said channel region which extends to said second diffusion layer, said sidewall electrode being capacitively coupled with said gate electrode; and a second insulating film comprising three layers formed between said sidewall electrode and said part of said second diffusion layer and between said sidewall electrode and said part of said channel region which extends to said second diffusion layer, one of said three layers of said second insulating film being a charge carrier accumulating layer, wherein potentials are applied to said first and second diffusion regions such that avalanche hot carriers are generated which do not pass through said part of said channel region beneath said gate electrode, and at least one type of charge carriers selected from the group consisting of electrons and holes are injected into said charge accumulating layer of said second insulating film in accordance with a potential of said gate electrode.

Claim 14

The memory device according to claim 11, wherein said second insulating film has a thickness less than 30 nm.

Claim 15

The memory device according to claim 11, wherein said second insulating film constitutes an insulating film between said side wall electrode and said gate electrode.

Claim 16

The memory device according to claim 11, wherein said second insulating film comprises a silicon oxide film having a thickness greater than 2 nm and less than 10 nm; a silicon nitride film having a thickness greater than 0.5 nm and less than 7 nm; and a silicon oxide film having a thickness greater than 2 nm and less than 10 nm.

Claim 17

The memory device according to claim 11, wherein said first insulating film has the same construction as said second insulating film.

Claim 18

The memory device according to claim 11, wherein said second insulating film comprises a silicon oxide film and a tantalum oxide film.

Claim 19

The memory device according to claim 11, wherein said second insulating film comprises a silicon oxide film and a strontium titanate film.

Claim 20

The memory device according to claim 11, wherein said second insulating film comprises a silicon oxide film and a barium strontium titanate film.

Claim 21

The memory device according to claim 11, wherein said first diffusion layer comprises an outer region lightly doped with impurities and an inner region heavily doped with impurities.

Claim 22

A nonvolatile semiconductor memory device comprising: a semiconductor substrate of a first conductivity type; and memory cells formed in said semiconductor substrate, each of said memory cells comprising first and second diffusion layers of a second conductivity type formed in said semiconductor substrate and spaced apart by a channel region; a gate electrode overlying a part of said channel region extending to said first diffusion layer; a first insulating film between said gate electrode and said semiconductor substrate; and a second insulating film comprising at least two layers of different materials and overlying a part of said second diffusion layer and a part of said channel region which extends to said second diffusion layer, one of said at least two layers of said second insulating film being a charge carrier accumulating layer, wherein a potential is applied to said second diffusion layer of a selected memory cell such that hot carriers are generated within a depletion region adjacent to said second diffusion layer and do not pass through said part of said channel region beneath said gate electrode, and at least one type of charge carriers selected from the group consisting of electrons and holes are injected from said depletion region into said charge carrier accumulating layer of said second insulating film in accordance with a potential of said gate electrode, whereas a potential applied to the gate electrode of an unselected memory cell which is influenced by the potential applied to said second diffusion layer of said selected memory cell is set to a value at which neither electrons nor holes are injected into a region adjacent to the second diffusion layer of said unselected memory cell.

Claim 23

A nonvolatile semiconductor memory device comprising: a semiconductor substrate of a first conductivity type; and memory cells formed in said semiconductor substrate, each of said memory cells comprising first and second diffusion layers of a second conductivity type formed in said semiconductor substrate and spaced apart by a channel region; a gate electrode overlying a part of said channel region extending to said first diffusion layer; a first insulating film between said gate electrode and said semiconductor substrate; and a second insulating film comprising at least two layers of different materials and overlying a part of said second diffusion layer and a part of said channel region which extends to said second diffusion layer, one of said at least two layers of said second insulating film being a charge carrier accumulating layer, wherein a potential is applied to said second diffusion layer of a selected memory cell such that hot carriers are generated within a depletion region adjacent to said second diffusion layer and do not pass through said part of said channel region beneath said gate electrode, and at least one type of charge carriers selected from the group consisting of electrons and holes are injected from said depletion region into said charge carrier accumulating layer of said second insulating film in accordance with a potential of said gate electrode, whereas a potential applied to the gate electrode of an unselected memory cell which is influenced by the potential applied to said second diffusion layer of said selected memory cell is set to a value at which neither electrons nor holes are injected into a region adjacent to the second diffusion layer of said unselected memory cell.

Claim 24

A nonvolatile semiconductor memory device comprising: a semiconductor substrate of a first conductivity type; and memory cells formed in said semiconductor substrate, each of said memory cells comprising: first and second diffusion layers of a second conductivity type formed in said semiconductor substrate and spaced apart by a channel region; a gate electrode overlying a part of said channel region which extends to said first diffusion layer; a first insulating film between said gate electrode and said semiconductor substrate; a sidewall electrode overlying a part of said second diffusion layer and a part of said channel region which extends to said second diffusion layer, said sidewall electrode being capacitively coupled with said gate electrode; and a second insulating film comprising at least two layers of different materials and overlying a part of said second diffusion layer and a part of said channel region which extends to said second diffusion layer, one of said at least two layers of said second insulating film being a charge carrier accumulating layer, wherein a potential is applied to said second diffusion region of a selected memory cell such that hot carriers are generated within a depletion region adjacent to said second diffusion layer and do not pass through said part of said channel region beneath said gate electrode, and at least one type of carrier charges selected from the group consisting of electrons and holes are injected from said depletion region into said charge carrier accumulating layer of said second insulating film in accordance with a potential of said gate electrode, and, whereas a potential applied to the gate electrode of an unselected memory cell influenced by the potential applied to said second diffusion layer of said selected memory cell is set to a value at which neither electrons nor holes are injected into a region adjacent to said second diffusion layer of said unselected memory cell.

Claim 25

A nonvolatile semiconductor memory device comprising: a semiconductor substrate of a first conductivity type; and memory cells formed in said semiconductor substrate, each of said memory cells comprising: first and second diffusion layers of a second conductivity type formed in said semiconductor substrate and spaced apart by a channel region; a gate electrode overlying a part of said channel region which extends to said first diffusion layer; a first insulating film between said gate electrode and said semiconductor substrate; a sidewall electrode overlying a part of said second diffusion layer and a part of said channel region which extends to said second diffusion layer, said sidewall electrode being capacitively coupled with said gate electrode; and a second insulating film comprising at least two layers of different materials and overlying a part of said second diffusion layer and a part of said channel region which extends to said second diffusion layer, one of said at least two layers of said second insulating film being a charge carrier accumulating layer, wherein a potential is applied to said second diffusion region of a selected memory cell such that hot carriers are generated within a depletion region adjacent to said second diffusion layer and do not pass through said part of said channel region beneath said gate electrode, and at least one type of carrier charges selected from the group consisting of electrons and holes are injected from said depletion region into said charge carrier accumulating layer of said second insulating film in accordance with a potential of said gate electrode, and, whereas a potential applied to the gate electrode of an unselected memory cell influenced by the potential applied to said second diffusion layer of said selected memory cell is set to a value at which neither electrons nor holes are injected into a region adjacent to said second diffusion layer of said unselected memory cell.

Claim 26

A nonvolatile semiconductor memory device comprising: a semiconductor substrate of a first conductivity type; first and second diffusion layers of a second conductivity type formed in said semiconductor substrate and spaced apart by a channel region; a gate electrode overlying a part of said channel region which extends to said first diffusion layer; a first insulating film between said gate electrode and said semiconductor substrate; a sidewall electrode overlying a part of said second diffusion layer and a part of said channel region which extends to said second diffusion layer, a potential of said sidewall electrode being controlled only by capacitive coupling; and a second insulating film formed between said sidewall electrode and said part of said channel region which extends to said second diffusion layer, said second insulating film including a charge carrier accumulating layer.

Claim 27

A nonvolatile semiconductor memory device comprising: a semiconductor substrate of a first conductivity type; first and second diffusion layers of a second conductivity type formed in said semiconductor substrate and spaced apart by a channel region; a gate electrode overlying a part of said channel region which extends to said first diffusion layer; a first insulating film between said gate electrode and said semiconductor substrate; a sidewall electrode overlying a part of said second diffusion layer and a part of said channel region which extends to said second diffusion layer, a potential of said sidewall electrode being controlled only by capacitive coupling; and a second insulating film formed between said sidewall electrode and said part of said channel region which extends to said second diffusion layer, said second insulating film including a charge carrier accumulating layer.

Claim 28

The nonvolatile semiconductor memory device according to claim 22, wherein said second insulating film is further formed between said sidewall electrode and said gate electrode.

Claim 29

The nonvolatile semiconductor memory device according to claim 22, wherein said charge carrier accumulating layer of said second insulating film is one of the group consisting a silicon nitride layer; a tantalum oxide layer; a strontium oxide layer; a barium strontium titanate layer; and a lead zirconate titanate layer.

Claim 30

The nonvolatile semiconductor memory device according to claim 22, wherein said second insulating film is an oxide-nitride-oxide (ONO) film.

Claim 31

A nonvolatile semiconductor memory device comprising: a semiconductor substrate of a first conductivity type; first and second diffusion layers of a second conductivity type formed in said semiconductor substrate and spaced apart by a channel region; a control gate electrode overlying a part of said channel region which extends to said first diffusion layer; a first insulating film between said control gate electrode and said semiconductor substrate; and a second insulating film comprising at least a first layer of a first material and a second layer of a second different material, said first layer formed on a sidewall of said control gate electrode and further formed to overly a part of said second diffusion layer and a part of said channel region which extends to said second diffusion layer, said second layer of said second insulating film being a charge carrier accumulating layer.

Claim 32

A nonvolatile semiconductor memory device comprising: a semiconductor substrate of a first conductivity type; first and second diffusion layers of a second conductivity type formed in said semiconductor substrate and spaced apart by a channel region; a control gate electrode overlying a part of said channel region which extends to said first diffusion layer; a first insulating film between said control gate electrode and said semiconductor substrate; and a second insulating film comprising at least a first layer of a first material and a second layer of a second different material, said first layer formed on a sidewall of said control gate electrode and further formed to overly a part of said second diffusion layer and a part of said channel region which extends to said second diffusion layer, said second layer of said second insulating film being a charge carrier accumulating layer.

Claim 33

The nonvolatile semiconductor memory device according to claim 26, wherein said charge carrier accumulating layer of said second insulating film is one of the group consisting a silicon nitride layer; a tantalum oxide layer; a strontium oxide layer; a barium strontium titanate layer; and a lead zirconate titanate layer.

Claim 34

The nonvolatile semiconductor memory device according to claim 26, wherein said second insulating film is an oxide-nitride-oxide (ONO) film.