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Method for forming micro patterns of semiconductor devices

Assignee: SK Hynix Inc
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Filing: 1996-09-27
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Granted: 1998-10-13
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Expires: 2016-09-27
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Abstract

Abstract A method for forming micro patterns of a semiconductor device which uses a dipole illumination aperture adapted to transmit the spatial frequency components of light only in the X-axis direction and a dipole illumination aperture adapted to transmit the spatial frequency components of light only in the Y-axis direction, thereby obtaining the same effect as in the case using two sheets of masks to provide an increase in process margin.

Inventors

  • 👤 Hyeong Soo Kim
  • 👤 Chang Mun Lim
  • 👤 Ki Ho Baik

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-07 22:55
CPC Classifications
G; G03; G03F; G03F7/00; G03F7/70; G03F7/70058; G03F7/70091; H; H10; H10P; H10P95/00; G03F7/70125; G03F7/70425; G03F7/70466

Claims Analysis

Total Claims: 5
Claim 1
Independent Claim 99 words
A method for forming micro patterns of a semiconductor device having spatial frequencies of both horizontal and vertical axes, the method comprising: conducting a primary light exposure using a dipole illumination aperture adapted to condense only horizontal spatial frequency components of light; and conducting a secondary light exposure using a second dipole illumination aperture adapted to condense only vertical spatial frequency components of light, thereby forming the micro patterns; wherein each of the first and second dipole illumination apertures has a distance between poles thereof that varies in accordance with the spatial frequency of the patterns to be obtained.
Claim 2
Independent Claim 99 words
A method for forming micro patterns of a semiconductor device having spatial frequencies of both horizontal and vertical axes, the method comprising: conducting a primary light exposure using a dipole illumination aperture adapted to condense only horizontal spatial frequency components of light; and conducting a secondary light exposure using a second dipole illumination aperture adapted to condense only vertical spatial frequency components of light, thereby forming the micro patterns; wherein each of the first and second dipole illumination apertures has a distance between poles thereof that varies in accordance with the spatial frequency of the patterns to be obtained.
Claim 3
Dependent Claim 26 words
The method in accordance with claim 1, wherein: the light used in the light exposure has a wavelength band ranging from 50 nm to 800 nm.
Claim 4
Dependent Claim 20 words
The method in accordance with claim 1, wherein: the light exposure uses a conventional mask or a phase shift mask.
Claim 5
Dependent Claim 29 words
The method in accordance with claim 1, wherein: the distance between poles is larger than 0, but equal to or smaller than the value of "aperture diameter--2×pole diameter. "

References Cited (Backward Citations)

US4859548A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2001-10-12 2002-04-13 2002-10-13 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2005-10-12 2006-04-13 2006-10-13 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2009-10-12 2010-04-13 2010-10-13 $7700.00 Window Closed / Lapsed

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