Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
187 words
A semiconductor device having an element isolating region for electrically isolating mutually neighboring element formation regions from each other, and comprising: a semiconductor substrate having a main surface and provided at said main surface with in said element isolating region with a plurality of trenches; a first insulating layer filling said trench and having a portion protruded above said main surface, said portion of said first insulating layer protruded above said main surface having a side surface substantially continuous with a side surface of said trench; a second insulating layer formed entirely on said main surface located between said plurality of trenches, and made of a material different from that of said first insulating layer; and a conductive layer electrically connected to an element in said element formation region, having a portion located in said element formation region and formed on said main surface with a third insulating layer therebetween, and having a portion located in said element isolating region and extending over upper surfaces of said first and second insulating layers, said second insulating layer having a thickness larger than that of said third insulating layer.
Claim 2
Dependent Claim
187 words
A semiconductor device having an element isolating region for electrically isolating mutually neighboring element formation regions from each other, and comprising: a semiconductor substrate having a main surface and provided at said main surface with in said element isolating region with a plurality of trenches; a first insulating layer filling said trench and having a portion protruded above said main surface, said portion of said first insulating layer protruded above said main surface having a side surface substantially continuous with a side surface of said trench; a second insulating layer formed entirely on said main surface located between said plurality of trenches, and made of a material different from that of said first insulating layer; and a conductive layer electrically connected to an element in said element formation region, having a portion located in said element formation region and formed on said main surface with a third insulating layer therebetween, and having a portion located in said element isolating region and extending over upper surfaces of said first and second insulating layers, said second insulating layer having a thickness larger than that of said third insulating layer.
Claim 3
Dependent Claim
35 words
The semiconductor device according to claim 1, wherein the upper surface of said first insulating layer is at the substantially same level as the upper surface of said second insulating layer from said main surface.
Claim 4
Dependent Claim
53 words
The semiconductor device according to claim 2, wherein the upper surface of said conductive layer in said element formation region is located at a first level from said main surface, and the upper surfaces of said first and second insulating layers are located at a second level not higher than said first level.
Claim 5
Dependent Claim
21 words
The semiconductor device according to claim 1, wherein said second insulating layer has a thickness from 2000 Å to 8000 Å.
Claim 6
Dependent Claim
39 words
The semiconductor device according to claim 1, wherein said first insulating layer is a silicon oxide film not substantially containing impurity, and said second insulating layer is a silicon oxide film containing at least either of boron or phosphorus.
Claim 7
Dependent Claim
27 words
The semiconductor device according to claim 1, wherein said first insulating layer has a silicon oxide film, and said second insulating layer has a silicon nitride film.
Claim 8
Dependent Claim
24 words
The semiconductor device according to claim 1, wherein said trench extends with its width kept in a range from 0.1 μm to 10 μm.
Claim 9
Dependent Claim
33 words
The semiconductor device according to claim 1, wherein said conductive layer is a gate electrode layer of an insulated gate field effect transistor, and said third insulating layer is a gate insulating layer.
Claim 10
Dependent Claim
26 words
The semiconductor device according to claim 8, wherein said element formation region having said insulated gate field effect transistor is surrounded by said element isolating region.