Vertical CMOS digital multi-valued restoring logic device

Claim 2

A quantum inverter circuit with three stable output states, the quantum inverter circuit, comprising: an input; an output; a first transistor comprising: a first gate, coupled to the input, a first source region, and a first drain region, coupled to the output, wherein current through the first drain region depends upon voltage from the first gate to the first source region and upon voltage from the first drain region to the first source region, so that for a constant voltage from the first gate to the first source region and increasing voltage between the first drain region and the first source reason there is a first plurality of resonance regions of operation with significant current flow through the first drain region and between resonance regions of operation in the first plurality of resonance regions there is a blocked anti-resonance region with significantly reduced current flow through the first drain region; and, a second transistor comprising: a second gate, coupled to the input, a second source region, and a second drain region, coupled to the output, wherein current through the second drain region depends upon voltage from the second gate to the second source region and upon voltage from the second drain region to the second source region, so that for a constant voltage from the second gate to the second source region and increasing voltage between the second drain region and the second source region there is a second plurality of resonance regions of operation with significant current flow through the second drain region and between resonance regions of operation in the second plurality of resonance regions there is a blocked anti-resonance region with significantly reduced current flow through the second drain region.

Claim 3

A quantum inverter circuit as in claim 1 wherein the first transistor additionally includes a first channel region between the first source region and the first drain region, the first channel region including a first tunnel barrier.

Claim 4

A quantum inverter circuit as in claim 2 wherein the second transistor additionally includes a second channel region between the second source region and the fourth source/drain, the second channel region including a second tunnel barrier.

Claim 5

A quantum inverter circuit as in claim 1 wherein the first transistor is an n-channel transistor and the second transistor is a p-channel transistor.

Claim 6

A quantum inverter circuit as in claim 1 wherein the first plurality of resonance regions of operation are out of phase with the second plurality of resonance regions of operation.

Claim 7

A quantum inverter circuit as in claim 1 wherein the quantum inverter circuit additionally has a fourth stable output state.

Claim 8

A logic circuit with three stable voltage states comprising: a first transistor, comprising: a first gate, a first source region, and a first drain region, wherein current through the first drain region depends upon voltage from the first gate to the first source region and upon voltage from the first drain region to the first source region, so that for a constant voltage from the first gate to the first source region and increasing voltage between the first drain region and the first source region there is a first plurality of resonance regions of operation with significant current flow through the first drain region and between resonance regions of operation in the first plurality of resonance regions there is a blocked anti-resonance region with significantly reduced current flow through the first drain region; and, a second transistor, comprising: a second gate, a second source region, and a second drain region, the second drain region being coupled to the first drain region of the first transistor, wherein current through the second drain region depends upon voltage from the second gate to the second source region and upon voltage from the second drain region to the second source region, so that for a constant voltage from the second gate to the second source region and increasing voltage between the second drain region and the second source region there is a second plurality of resonance regions of operation with significant current flow through the second drain region and between resonance regions of operation in the second plurality of resonance regions there is a blocked anti-resonance region with significantly reduced current flow through the second drain region.

Claim 9

A logic circuit with three stable voltage states comprising: a first transistor, comprising: a first gate, a first source region, and a first drain region, wherein current through the first drain region depends upon voltage from the first gate to the first source region and upon voltage from the first drain region to the first source region, so that for a constant voltage from the first gate to the first source region and increasing voltage between the first drain region and the first source region there is a first plurality of resonance regions of operation with significant current flow through the first drain region and between resonance regions of operation in the first plurality of resonance regions there is a blocked anti-resonance region with significantly reduced current flow through the first drain region; and, a second transistor, comprising: a second gate, a second source region, and a second drain region, the second drain region being coupled to the first drain region of the first transistor, wherein current through the second drain region depends upon voltage from the second gate to the second source region and upon voltage from the second drain region to the second source region, so that for a constant voltage from the second gate to the second source region and increasing voltage between the second drain region and the second source region there is a second plurality of resonance regions of operation with significant current flow through the second drain region and between resonance regions of operation in the second plurality of resonance regions there is a blocked anti-resonance region with significantly reduced current flow through the second drain region.

Claim 10

A logic circuit as in claim 7 wherein the first transistor additionally includes a first channel region between the first source region and the first drain region, the first channel region including a first tunnel barrier.

Claim 11

A logic circuit as in claim 8 wherein the second transistor additionally includes a second channel region between the second source region and the second drain region, the second channel region including a second tunnel barrier.

Claim 12

A logic circuit as in claim 7 wherein the first gate regions is connected to the second gate region.

Claim 13

A logic circuit as in claim 10 wherein the first transistor is an n-channel transistor and the second transistor is a p-channel transistor.

Claim 14

A logic circuit as in claim 11 wherein the first plurality of resonance regions of operation are out of phase with the second plurality of resonance regions of operation.

Claim 15

A logic circuit as in claim 7 wherein the logic circuit functions as a quantum inverter, the logic circuit additionally comprising: an input coupled to the first gate and the second gate, and an output coupled to the first drain region and the second drain region.

Claim 16

A logic circuit as in claim 7 wherein the logic circuit functions as a memory cell which is stable at three separate voltage levels, the logic circuit additionally comprising: a third transistor, comprising: a third gate, a third source region, and a third drain region, wherein current through the third drain region depends upon voltage from the third gate to the third source region and upon voltage from the third drain region to the third source region, so that for a constant voltage from the third gate to the third source region and increasing voltage between the third drain region and the third source region there is a third plurality of resonance regions of operation with significant current flow through the third drain region and between resonance regions of operation in the third plurality of resonance regions there is a blocked anti-resonance region with significantly reduced current flow through the third drain region; a fourth transistor, comprising: a fourth gate, a fourth source region, and a fourth drain region, wherein current through the fourth drain region depends upon voltage from the fourth gate to the fourth source region and upon voltage from the fourth drain region to the fourth source region, so that for a constant voltage from the fourth gate to the fourth source region and increasing voltage between the fourth drain region and the fourth source region there is a fourth plurality of resonance regions of operation with significant current flow through the fourth drain region and between resonance regions of operation in the fourth plurality of resonance regions there is a blocked anti-resonance region with significantly reduced current flow through the fourth drain region; a first capacitor having a first end and a second end, the first end being coupled to the first gate and to the second gate, the second end being coupled to the third drain region and to the fourth drain region; and, a second capacitor having a first end and a second end, the first end of the second capacitor being coupled to the third gate and to the fourth gate, the second end of the second capacitor being coupled to the first drain region and to the second drain region.

Claim 17

A logic circuit as in claim 7 wherein the logic circuit has a fourth stable logic voltage state.

Claim 18

A multi-valued logic circuit comprising: an input; an output; a first transistor comprising: a first source/drain region, a second source/drain region, coupled to the output, a first channel region including a first tunnel barrier, the first channel region being positioned between the first source/drain region and the second source/drain region; a first gate structure, coupled to the input; and a first gate dielectric between and contacting the first gate structure and the first channel region, wherein current flow between the first source/drain region and the second source/drain region is generally orthogonal to a plane of the first tunnel barrier; and, a second transistor comprising: a third source/drain region, coupled to the output, a fourth source/drain region, a second channel region including a second tunnel barrier, the second channel region positioned between the third source/drain region and the fourth source/drain region, a second gate structure, coupled to the input, and a second gate dielectric region between the second gate structure and the second channel region, wherein current flow between the third source/drain region and the fourth source/drain region is generally orthogonal to a plane of the second tunnel barrier; wherein the multi-valued logic circuit has a first stable operating point, a second stable operating point, and a third stable operating point, wherein the second stable operating point is an intermediate voltage value having a value between a voltage value of the first stable operating point and a voltage value of the second stable operating point, wherein responsive to changes of voltage applied to the input, the circuit transitions at the output between the first stable operating point, the second stable operating point and the third stable operating point.

Claim 19

A multi-valued logic circuit comprising: an input; an output; a first transistor comprising: a first source/drain region, a second source/drain region, coupled to the output, a first channel region including a first tunnel barrier, the first channel region being positioned between the first source/drain region and the second source/drain region; a first gate structure, coupled to the input; and a first gate dielectric between and contacting the first gate structure and the first channel region, wherein current flow between the first source/drain region and the second source/drain region is generally orthogonal to a plane of the first tunnel barrier; and, a second transistor comprising: a third source/drain region, coupled to the output, a fourth source/drain region, a second channel region including a second tunnel barrier, the second channel region positioned between the third source/drain region and the fourth source/drain region, a second gate structure, coupled to the input, and a second gate dielectric region between the second gate structure and the second channel region, wherein current flow between the third source/drain region and the fourth source/drain region is generally orthogonal to a plane of the second tunnel barrier; wherein the multi-valued logic circuit has a first stable operating point, a second stable operating point, and a third stable operating point, wherein the second stable operating point is an intermediate voltage value having a value between a voltage value of the first stable operating point and a voltage value of the second stable operating point, wherein responsive to changes of voltage applied to the input, the circuit transitions at the output between the first stable operating point, the second stable operating point and the third stable operating point.

Claim 20

The device recited in claim 16 wherein the first channel further includes a third tunnel barrier region.

Claim 21

The device recited in claim 16 wherein the first tunnel barrier and the third tunnel barrier form a quantum well.

Claim 22

The device recited in claim 16 wherein material from which the first tunnel barrier is formed has a different energy band structure than material from which a remaining portion of the first channel region is formed.