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US5760480A Expired / Lapsed US ⏱️ 0.0 years remaining

Low RC interconnection

Assignee: GlobalFoundries Inc
•
Filing: 1995-09-20
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Granted: 1998-06-02
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Expires: 2015-09-20
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Abstract

Abstract A low RC delay interconnection pattern is formed with a low resistivity metal, such as copper, and a low dielectric constant material, such as organic polymers. An intermediate bonding layer is formed between the low resistivity metal and low dielectric constant material employing an adhesion promoter, such as a silane-based adhesion promoter. The adhesion promoter can be applied between the metal and dielectric layers or incorporated in the dielectric layer.

Inventors

  • 👤 Lu You
  • 👤 Robin W. Cheung
  • 👤 Simon S. Chan
  • 👤 Richard J. Huang

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 02:47
CPC Classifications
H; H10; H10W; H10W74/00; H10W74/10; H10W74/111; H10W74/127; H10W20/00; H10W20/40; H10W20/45; H10W20/48; H10W20/495

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 36 words
A semiconductor device comprising: a layer of dielectric material; a metal interconnect pattern; and an intermediate layer completely surrounding the metal interconnect pattern; wherein the metal is bonded to the dielectric material by the intermediate layer.
Claim 2
Dependent Claim 36 words
A semiconductor device comprising: a layer of dielectric material; a metal interconnect pattern; and an intermediate layer completely surrounding the metal interconnect pattern; wherein the metal is bonded to the dielectric material by the intermediate layer.
Claim 3
Dependent Claim 22 words
The semiconductor device according to claim 1, wherein the intermediate layer comprises the reaction product of an adhesion promoter and the metal.
Claim 4
Dependent Claim 15 words
The semiconductor device according to claim 2, wherein the adhesion promoter comprises a silane-based organic.
Claim 5
Dependent Claim 21 words
The semiconductor device according to claim 3, wherein the silane-based organic is selected from the group consisting of 3-aminopropyltriethoxysilane and 3-methacryloxypropyltrimethoxysilane.
Claim 6
Dependent Claim 24 words
The semiconductor device according to claim 3, wherein the silane-based organic compound comprises a vinyl, chloropropyl, epoxy, diamine, mercapto and/or cationic stryryl organofunctional group.
Claim 7
Dependent Claim 40 words
The semiconductor device according to claim 1, wherein the intermediate bonding layer consists essentially of an adhesion promoter, the reaction product of the metal and the adhesion promoter, and the reaction product of the adhesion promoter and the dielectric material.

References Cited (Backward Citations)

US4720424A Cited
US5324591A Cited
US5091251A Cited
US5114757A Cited
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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2001-06-01 2001-12-01 2002-06-02 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2005-06-01 2005-12-01 2006-06-02 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2009-06-01 2009-12-01 2010-06-02 $7700.00 Window Closed / Lapsed

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