US5753554A
Expired / Lapsed
US
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Semiconductor device and method of forming the same
Assignee: MagnaChip Semiconductor Ltd
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Filing: 1996-12-27
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Granted: 1998-05-19
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Expires: 2016-12-27
Abstract
Abstract A semiconductor device and method of forming the same are disclosed for eliminating the surface topology can be properly eliminated. A selected regions of semiconductor substrate for forming a gate and field oxide layer are etched to form trenches, a field oxide layer is formed in the inner part of trench which is corresponding to a selected region of field oxide layer and then a gate oxide film on surface of the semiconductor substrate and the inner part of the trenches. A gate is filled with a gate material in the trenches to a gate, junction regions are then formed in the semiconductor substrate which corresponds to either side of the gate.
Inventors
- 👤 Sang-Hoon Park
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-03 07:09
CPC Classifications
H; H10; H10D; H10D84/00; H10D84/80; H10D84/82; H10D84/83; H10D30/00; H10D30/60; H10D30/601; H10D30/608; H10D64/00; H10D64/01; H10D64/025; H10D64/027; H10W; H10W10/00; H10W10/01; H10W10/011; H10W10/014; H10W10/0143; H10W10/10; H10W10/17
Claims Analysis
Total Claims: 16
Claim 1
Independent Claim
78 words
A method of forming semiconductor device comprises the step of: forming a plurality of trenches by etching selected regions of a semiconductor substrate; forming a field oxide layer in the inner wall of trench which is corresponding to selected region of field oxide layer among said trenches; forming a gate oxide on the semiconductor substrate; filling said trenches with a conductive material to form a gate electrode; and forming junction region in the semiconductor substrate between said trenches.
Claim 2
Independent Claim
78 words
A method of forming semiconductor device comprises the step of: forming a plurality of trenches by etching selected regions of a semiconductor substrate; forming a field oxide layer in the inner wall of trench which is corresponding to selected region of field oxide layer among said trenches; forming a gate oxide on the semiconductor substrate; filling said trenches with a conductive material to form a gate electrode; and forming junction region in the semiconductor substrate between said trenches.
Claim 3
Dependent Claim
33 words
The method as claimed in claim 1, wherein the step of forming the trench is performed by anisotropically etching the semiconductor substrate such that the etched depth of the trench is 5,000-12,000 Angstroms.
Claim 4
Dependent Claim
98 words
The method as claimed in claim 1, wherein said forming step of trenches comprises the steps of: forming a oxide film on the substrate where the trenches are formed therein; forming a silicon nitride film on the oxide film; forming a photoresist pattern on the semiconductor substrate such that the silicon nitride film over the trench which is selected as a field oxide region, is exposed; removing the exposed silicon nitride film; forming the field oxide at the region where the silicon nitride film has been removed; and removing the photoresist pattern, silicon nitride film, and oxide film.
Claim 5
Dependent Claim
22 words
The method as claimed in claim 3, wherein said exposed silicon nitride film is removed using a PH4 solution of 160°-175° C.
Claim 6
Dependent Claim
44 words
The method as claimed in claim 1, wherein said filling step for the formation of said gate electrode gas comprises the steps of: depositing a polysilicon film to sufficiently fill the trenches; and etching back said polysilicon film until the semiconductor substrate is exposed.
Claim 7
Dependent Claim
21 words
The method as claimed in claim 5, wherein said gas for etching polysilicon is comprised of Cl2, HBr, and He gases.
Claim 8
Dependent Claim
27 words
The method as claimed in claim 1, further comprising the additional step of forming a metal-silicide layer on the gate, prior to said forming the junction region.
Claim 9
Dependent Claim
18 words
The method as claimed in claim 7, wherein said metal-silicide layer is formed by a selective deposition method.
Claim 10
Dependent Claim
46 words
The method as claimed in claim 7, wherein said forming step of the metal-silicide layer comprises the steps of: depositing metal-silicide layer on the whole surface of the silicon substrate; and patterning the deposited metal-silicide layer such that only the region over the gate electrode remains.
Claim 11
Dependent Claim
69 words
The method as claimed in claim 1, wherein forming the junction region comprises the step of: implanting a high concentration impurity ions into the semiconductor substrate adjacent to the gate electrode; implanting a low concentration impurity ions into the semiconductor substrate where the high concentration impurity ions have been implanted such that the implantation depth of low concentration impurity ions is deeper than that of high concentration impurity ions.
Claim 12
Dependent Claim
28 words
The method as claimed in claim 10, wherein said high concentration impurity ions are arsenic, and have a concentration of 1E13-1E17 ion/cm 3 and energy of 30-50 KeV.
Claim 13
Dependent Claim
29 words
The method as claimed in claim 10, wherein said low concentration impurity ions are P atoms, and have a concentration of 1E11-1E15 ion/cm 3 and energy of 40-60 KeV.
Claim 14
Dependent Claim
64 words
The method as claimed in claim 1, wherein said forming step of the junction region comprises the step of: implanting a low concentration impurity ions into the semiconductor substrate; implanting a high concentration impurity ions into the semiconductor substrate where the low concentration impurity ions have been implanted such that the low concentration impurity ions are deeply implanted than the high concentration impurity ions.
Claim 15
Dependent Claim
28 words
The method as claimed in claim 13, wherein said high concentration impurity ions are arsenic, and have a concentration of 1E13-1E17 ion/cm 3 and energy of 30-50 KeV.
Claim 16
Dependent Claim
28 words
The method as claimed in claim 13, wherein said low concentration impurity ions are phosphorous, and have a concentration of 1E11-1E15 ion/cm 3 and energy of 40-60 KeV.
References Cited (Backward Citations)
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