Patent US5748534A successfully refreshed from Google Patents.
US5748534A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Feedback loop for reading threshold voltage
Assignee: SanDisk Technologies LLC
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Filing: 1996-03-26
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Granted: 1998-05-05
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Expires: 2016-03-26
Abstract
Abstract To read the threshold voltage of a transistor such as a floating gate transistor in an analog or multi-level memory cell, the transistor is connected in a feedback loop which contains a differential amplifier having an output terminal and an input terminal respectively connected to the gate and a node (source or drain) of the transistor. A reference voltage is asserted to a second input terminal of the differential amplifier. A load provides a current which charges the node, and the differential amplifier adjusts the gate voltage of the memory cell to an equilibrium value where current through the transistor is equal to current through the reference cell. The equilibrium value of the gate voltage depends on and indicates the threshold voltage of the transistor. In one embodiment of the invention, the load is a current source which mirrors a current through a reference cell that is structurally identical to the transistor, and the drain of the reference cell provides the reference voltage to the amplifier.
Inventors
- 👤 Frank M. Dunlap
- 👤 Hock C. So
- 👤 Sau C. Wong
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 09:47
CPC Classifications
G; G11; G11C; G11C16/00; G11C16/02; G11C16/06; G11C16/34; G11C11/00; G11C11/56; G11C11/5621; G11C11/5642; G11C16/26; G11C16/28; G11C27/00; G11C27/005
Claims Analysis
Total Claims: 22
Claim 1
Independent Claim
144 words
A read circuit, comprising: an amplifier; means for connecting a node of a selected memory cell to an input terminal of the amplifier; means for applying a current to the input terminal of the amplifier, the means for applying comprising: a first transistor coupled between a supply voltage and the input terminal; a second transistor having a gate and a drain coupled together and to the gate of the first transistor; and a reference cell coupled in series with the second transistor between the supply voltage and ground; and means for connecting an output terminal of the amplifier to a gate of the selected memory cell, wherein an output voltage of the amplifier, that is provided while the output terminal is connected to the gate and the input terminal is connected to the node, indicates a data value stored in the selected memory cell.
Claim 2
Dependent Claim
144 words
A read circuit, comprising: an amplifier; means for connecting a node of a selected memory cell to an input terminal of the amplifier; means for applying a current to the input terminal of the amplifier, the means for applying comprising: a first transistor coupled between a supply voltage and the input terminal; a second transistor having a gate and a drain coupled together and to the gate of the first transistor; and a reference cell coupled in series with the second transistor between the supply voltage and ground; and means for connecting an output terminal of the amplifier to a gate of the selected memory cell, wherein an output voltage of the amplifier, that is provided while the output terminal is connected to the gate and the input terminal is connected to the node, indicates a data value stored in the selected memory cell.
Claim 3
Dependent Claim
45 words
The read circuit of claim 1, wherein connecting the output terminal of the amplifier to the gate of the selected memory cell and connecting the node of the selected memory cell to the input terminal of the amplifier creates a feedback loop having negative feedback.
Claim 4
Dependent Claim
35 words
The read circuit of claim 1, wherein the amplifier comprises a differential amplifier having a second input terminal in addition to the first-mentioned input terminal, the second input terminal being coupled to a reference voltage.
Claim 5
Dependent Claim
18 words
The read circuit of claim 1, wherein the reference cell is structurally identical to the selected memory cell.
Claim 6
Dependent Claim
22 words
The read circuit of claim 1, wherein the node is a drain of a floating gate transistor in the selected memory cell.
Claim 7
Dependent Claim
23 words
The read circuit of claim 1, wherein the node is a drain of a metal nitride oxide transistor in the selected memory cell.
Claim 8
Dependent Claim
115 words
A memory, comprising: an amplifier; a load coupled between an input terminal of the amplifier and a constant voltage terminal; an array of memory cells; a column decoder adapted to connect a node of a selected memory cell in the array to the input terminal of the amplifier; and a row decoder adapted to connect an output terminal of the amplifier to a gate of the selected memory cell, wherein an output voltage from the amplifier, provided while the output terminal is connected to the gate of the selected memory cell and the input terminal is connected to the node of the selected memory cell, indicates a data value stored in the selected memory cell.
Claim 9
Dependent Claim
115 words
A memory, comprising: an amplifier; a load coupled between an input terminal of the amplifier and a constant voltage terminal; an array of memory cells; a column decoder adapted to connect a node of a selected memory cell in the array to the input terminal of the amplifier; and a row decoder adapted to connect an output terminal of the amplifier to a gate of the selected memory cell, wherein an output voltage from the amplifier, provided while the output terminal is connected to the gate of the selected memory cell and the input terminal is connected to the node of the selected memory cell, indicates a data value stored in the selected memory cell.
Claim 10
Dependent Claim
20 words
The memory of claim 7, wherein the load comprises a current source coupled to an input terminal of the amplifier.
Claim 11
Dependent Claim
20 words
The memory of claim 7, wherein the load comprises a diode-connected device coupled to an input terminal of the amplifier.
Claim 12
Dependent Claim
19 words
The memory of claim 7, wherein the load comprises a resistor coupled to an input terminal of the amplifier.
Claim 13
Dependent Claim
48 words
The memory of claim 7, wherein the amplifier is a differential amplifier having a first input terminal and a second input terminal, wherein the first input terminal is the input terminal to which the load is coupled and a reference voltage is applied to the second input terminal.
Claim 14
Dependent Claim
41 words
The memory of claim 11, wherein the first input terminal is a positive input terminal, the second input terminal is a negative input terminal, and the column decoder connects a drain of the selected memory cell to the first input terminal.
Claim 15
Independent Claim
75 words
A method for reading the threshold voltage of a transistor, comprising: connecting a node of the transistor to a first input terminal of a differential amplifier; connecting an output terminal of the differential amplifier to a gate of the transistor; applying a reference voltage to a second input terminal of the differential amplifier; applying a current to the node; and determining the threshold voltage of the transistor from a voltage on gate of the transistor.
Claim 16
Independent Claim
75 words
A method for reading the threshold voltage of a transistor, comprising: connecting a node of the transistor to a first input terminal of a differential amplifier; connecting an output terminal of the differential amplifier to a gate of the transistor; applying a reference voltage to a second input terminal of the differential amplifier; applying a current to the node; and determining the threshold voltage of the transistor from a voltage on gate of the transistor.
Claim 17
Dependent Claim
24 words
The method of claim 13, wherein determining the threshold voltage comprises waiting until a current through the transistor settles to an approximately constant level.
Claim 18
Dependent Claim
59 words
The method of claim 13, wherein applying the current comprises: connecting the transistor to a current mirror so that current to the node of the transistor mirrors current through a reference cell which is substantially identical to the transistor; and applying to a gate of the reference cell a voltage greater than a threshold voltage of the reference cell.
Claim 19
Dependent Claim
29 words
The method of claim 15, wherein applying the reference voltage comprises connecting a source or drain of the reference cell to the second input terminal of the differential amplifier.
Claim 20
Dependent Claim
25 words
The method of claim 13, wherein the first input terminal is a positive input terminal and the second input terminal is a negative input terminal.
Claim 21
Dependent Claim
25 words
The read circuit of claim 1, wherein the data value read is an analog value represented by a threshold voltage of the selected memory cell.
Claim 22
Dependent Claim
26 words
The read circuit of claim 1, wherein the data value read is a multi-bit digital value represented by a threshold voltage of the selected memory cell.
References Cited (Backward Citations)
US5339272A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2001-05-04 | 2001-11-03 | 2002-05-05 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2005-05-04 | 2005-11-03 | 2006-05-05 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2009-05-04 | 2009-11-03 | 2010-05-05 | $7700.00 | Window Closed / Lapsed |