US5742307A
Expired / Lapsed
US
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Method for electrical tailoring drop ejector thresholds of thermal ink jet heater elements
Assignee: Xerox Corp
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Filing: 1997-01-21
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Granted: 1998-04-21
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Expires: 2017-01-21
Abstract
Abstract A method for electrical tailoring of thermal ink jet heater elements. The resistance of ink-jet heater elements formed of polysilicon is changed by applying energy through the resistor element of varying amounts at varying pulse widths. The application of pulsed current for up to 1 second total pulse width at voltages of up to 50 volts decreases the resistance by as much as thirty percent or more of the as fabricated values.
Inventors
- 👤 Thomas E. Watrobski
- 👤 William G. Hawkins
- 👤 Sophie V. Vandebroek
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 18:03
CPC Classifications
B; B41; B41J; B41J2/00; B41J2/005; B41J2/01; B41J2/015; B41J2/04; B41J2/045; B41J2/04501; B41J2/04565; B41J2/0458; B41J2/0459; B41J2/04591; B41J2/04593; B41J2/135; B41J2/14; B41J2/14016; B41J2/14072; B41J2/14088; B41J2/14112; B41J2/14129; B41J2/16; B41J2/1601; B41J2/1621; B41J2/1631; B41J2/1635; B41J2/164; B41J2/1642; B41J2/1646; B41J2202/00; B41J2202/01; B41J2202/03; B41J2202/13; B41J2202/20
Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
122 words
A thermal ink jet drop ejector, for ejecting an ink drop, generating thermal energy in response to an operating condition pulse, having a operating condition pulsewidth, being applied thereto during normal operation of the drop ejector, comprising: a silicon substrate; a field oxide layer, deposited on said silicon substrate; a polysilicon resistor, formed on said field oxide layer, said polysilicon resistor including a doped polysilicon material having a resistance value, the resistance value determined by adjustment with the application of a current pulse, generated by a signal generator, applied thereto, the current pulse, including a pulsewidth being equal to or greater than the operating condition pulsewidth, being applied repeatedly to said polysilicon resistor; and an insulator layer deposited on said polysilicon resistor.
Claim 2
Dependent Claim
122 words
A thermal ink jet drop ejector, for ejecting an ink drop, generating thermal energy in response to an operating condition pulse, having a operating condition pulsewidth, being applied thereto during normal operation of the drop ejector, comprising: a silicon substrate; a field oxide layer, deposited on said silicon substrate; a polysilicon resistor, formed on said field oxide layer, said polysilicon resistor including a doped polysilicon material having a resistance value, the resistance value determined by adjustment with the application of a current pulse, generated by a signal generator, applied thereto, the current pulse, including a pulsewidth being equal to or greater than the operating condition pulsewidth, being applied repeatedly to said polysilicon resistor; and an insulator layer deposited on said polysilicon resistor.
Claim 3
Dependent Claim
45 words
The thermal ink jet drop ejector of claim 1, wherein said polysilicon resistor includes a polysilicon material having a resistance value being determined by adjustment with the creation of a temperature above approximately 400° C. therein with the current pulse generated by the signal generator.
Claim 4
Dependent Claim
33 words
The thermal ink jet drop ejector of claim 2, wherein said insulator layer comprises a silicon nitride layer deposited on said polysilicon resistor and a cavitation layer formed on said silicon nitride layer.
Claim 5
Dependent Claim
20 words
The thermal ink jet drop ejector of claim 3, wherein said silicon nitride layer comprises a pyrolitically deposited silicon nitride.
Claim 6
Dependent Claim
15 words
The thermal ink jet drop ejector of claim 4, wherein said cavitation layer comprises tantalum.
Claim 7
Dependent Claim
43 words
The thermal ink jet drop ejector of claim 1, wherein said polysilicon resistor comprises a doped polysilicon material having the resistance determined by the current pulse being applied repeatedly to said polysilicon resistor for a total time period of one second or less.
References Cited (Backward Citations)
US4210996A
Cited
US4532530A
Cited
US4782202A
Cited
US4782202B1
Cited
US4947192A
Cited
US4929964A
Cited
US4929964B1
Cited
US4996487A
Cited
US4951063A
Cited
US5162814A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2001-04-20 | 2001-10-20 | 2002-04-21 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2005-04-20 | 2005-10-20 | 2006-04-21 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2009-04-20 | 2009-10-20 | 2010-04-21 | $7700.00 | Window Closed / Lapsed |