Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
581 words
A semiconductor device comprising: a circuit composed of MOS transistors having a threshold voltage set to a low value, a source electrode of said MOS transistors being a power supply line which is made alternatively equal to a substrate bias potential of said MOS transistors in an operating condition of the semiconductor device or to a potential higher than said substrate bias potential in an absolute potential in a standby condition of the semiconductor device; a first power supply line of a high potential; a second power supply line of a low potential; a third power supply line which is alternatively set to a potential equal to that of said first power supply line or to a potential lower than that of said first power supply line by some degree, and a fourth power supply line which is alternatively set to a potential equal to that of said second power supply line or to a potential higher than that of said second power supply line by some degree; wherein said circuit is a memory cell circuit which includes: a first inverter having a first pMOS transistor and a first nMOS transistor connected in series, a second inverter having a second pMOS transistor and a second nMOS transistor connected in series, said first inverter and said second inverter being connected in such a back-to-back manner that an output of each inverter is connected to an input of the other inverter, a third nMOS transistor connected between a first bit and the input of said first inverter and having a gate connected to a word line, and a fourth nMOS transistor connected between a second bit and the input of said second inverter and having a gate connected to said word line; a substrate bias terminal of each of said first and second pMOS transistors being connected to said first power supply line, a source of each of said first and second pMOS transistors being connected to said third power supply line, a substrate bias terminal of each of said first to fourth nMOS transistors being connected to said second power supply line, a source of each of said first and second nMOS transistors being connected to said fourth power supply line; the semiconductor device further comprising a control circuit including: said first power supply line supplied with a high potential, said second power supply line supplied with a low potential, said third power supply line connected through a first potential difference generating circuit to said first power supply line so that a potential lower than said high potential by a potential difference created by said first potential difference generating circuit is supplied to said third power supply line, said fourth power supply line connected through a second potential difference generating circuit to said second power supply line so that a potential higher than said low potential by a potential difference created by said second potential difference generating circuit is supplied to said fourth power supply line, a first switch means connected between said first and third power supply lines for short-circuiting between said first and third power supply lines when said first switch means is closed, a second switch means connected between said second and fourth power supply lines for short-circuiting between said second and fourth power supply lines when said second switch means is closed, and a control line connected to a control input of said first and second switch means to simultaneously on-off control said first and second switch means.
Claim 2
Dependent Claim
581 words
A semiconductor device comprising: a circuit composed of MOS transistors having a threshold voltage set to a low value, a source electrode of said MOS transistors being a power supply line which is made alternatively equal to a substrate bias potential of said MOS transistors in an operating condition of the semiconductor device or to a potential higher than said substrate bias potential in an absolute potential in a standby condition of the semiconductor device; a first power supply line of a high potential; a second power supply line of a low potential; a third power supply line which is alternatively set to a potential equal to that of said first power supply line or to a potential lower than that of said first power supply line by some degree, and a fourth power supply line which is alternatively set to a potential equal to that of said second power supply line or to a potential higher than that of said second power supply line by some degree; wherein said circuit is a memory cell circuit which includes: a first inverter having a first pMOS transistor and a first nMOS transistor connected in series, a second inverter having a second pMOS transistor and a second nMOS transistor connected in series, said first inverter and said second inverter being connected in such a back-to-back manner that an output of each inverter is connected to an input of the other inverter, a third nMOS transistor connected between a first bit and the input of said first inverter and having a gate connected to a word line, and a fourth nMOS transistor connected between a second bit and the input of said second inverter and having a gate connected to said word line; a substrate bias terminal of each of said first and second pMOS transistors being connected to said first power supply line, a source of each of said first and second pMOS transistors being connected to said third power supply line, a substrate bias terminal of each of said first to fourth nMOS transistors being connected to said second power supply line, a source of each of said first and second nMOS transistors being connected to said fourth power supply line; the semiconductor device further comprising a control circuit including: said first power supply line supplied with a high potential, said second power supply line supplied with a low potential, said third power supply line connected through a first potential difference generating circuit to said first power supply line so that a potential lower than said high potential by a potential difference created by said first potential difference generating circuit is supplied to said third power supply line, said fourth power supply line connected through a second potential difference generating circuit to said second power supply line so that a potential higher than said low potential by a potential difference created by said second potential difference generating circuit is supplied to said fourth power supply line, a first switch means connected between said first and third power supply lines for short-circuiting between said first and third power supply lines when said first switch means is closed, a second switch means connected between said second and fourth power supply lines for short-circuiting between said second and fourth power supply lines when said second switch means is closed, and a control line connected to a control input of said first and second switch means to simultaneously on-off control said first and second switch means.
Claim 3
Dependent Claim
76 words
A semiconductor device claimed in claim 1 wherein said control circuit further includes a first series circuit composed of a third switch means and a first capacitor and connected between said third and fourth power supply lines, and a second series circuit composed of a fourth switch means and a second capacitor and connected between said third and fourth power supply lines, said third and fourth switch means means being on-off controlled complementarily to each other.
Claim 4
Dependent Claim
41 words
A semiconductor device claimed in claim 1 wherein said first and second switch means are maintained in an open condition in a standby condition of the semiconductor device, and in a closed condition in an operating condition of the semiconductor device.
Claim 5
Dependent Claim
488 words
A semiconductor device comprising: a circuit composed of MOS transistors having a threshold voltage set to a low value, a source electrode of said MOS transistors being a power supply line which is made alternatively equal to a substrate bias potential of said MOS transistors in an operating condition of the semiconductor device or to a potential higher than said substrate bias potential in an absolute potential in a standby condition of the semiconductor device; a first power supply line of a high potential; a second power supply line of a low potential; and a fourth power supply line which is alternatively set to a potential equal to that of said second power supply line by some degree; wherein said circuit is a memory cell circuit which includes: a first inverter having a first resistor and a first nMOS transistor connected in series, a second inverter having a second resistor and a second nMOS transistor connected in series, said first inverter and said second inverter being connected in such a back-to-back manner that an output of each inverter is connected to an input of the other inverter, a third nMOS transistor connected between a first bit and the input of said first inverter and having a gate connected to a word line, a fourth nMOS transistor connected between a second bit and the input of said second inverter and having a gate connected to said word line; a substrate bias terminal of each of said first to fourth nMOS transistors being connected to said second power supply line, a source of each of said first and second nMOS transistors being connected to said fourth power supply line; the semiconductor device further comprising a control circuit including: said first power supply line supplied with a high potential, said second power supply line supplied with a low potential, a third power supply line connected through a first potential difference generating circuit to said first power supply line so that a potential lower than said high potential by a potential difference created by said first potential difference generating circuit is supplied to said third power supply line, said fourth power supply line connected through a second potential difference generating circuit to said second power supply line so that a potential higher than said low potential by a potential difference created by said second potential difference generating circuit is supplied to said fourth power supply line, a first switch means connected between said first and third power supply lines for short-circuiting between said first and third power supply lines when said first switch means is closed, a second switch means connected between said second and fourth power supply lines for short-circuiting between said second and fourth power supply lines when said second switch means is closed, and a control line connected to a control input of said first and second switch means to simultaneously on-off control said first and second switch means.
Claim 6
Dependent Claim
488 words
A semiconductor device comprising: a circuit composed of MOS transistors having a threshold voltage set to a low value, a source electrode of said MOS transistors being a power supply line which is made alternatively equal to a substrate bias potential of said MOS transistors in an operating condition of the semiconductor device or to a potential higher than said substrate bias potential in an absolute potential in a standby condition of the semiconductor device; a first power supply line of a high potential; a second power supply line of a low potential; and a fourth power supply line which is alternatively set to a potential equal to that of said second power supply line by some degree; wherein said circuit is a memory cell circuit which includes: a first inverter having a first resistor and a first nMOS transistor connected in series, a second inverter having a second resistor and a second nMOS transistor connected in series, said first inverter and said second inverter being connected in such a back-to-back manner that an output of each inverter is connected to an input of the other inverter, a third nMOS transistor connected between a first bit and the input of said first inverter and having a gate connected to a word line, a fourth nMOS transistor connected between a second bit and the input of said second inverter and having a gate connected to said word line; a substrate bias terminal of each of said first to fourth nMOS transistors being connected to said second power supply line, a source of each of said first and second nMOS transistors being connected to said fourth power supply line; the semiconductor device further comprising a control circuit including: said first power supply line supplied with a high potential, said second power supply line supplied with a low potential, a third power supply line connected through a first potential difference generating circuit to said first power supply line so that a potential lower than said high potential by a potential difference created by said first potential difference generating circuit is supplied to said third power supply line, said fourth power supply line connected through a second potential difference generating circuit to said second power supply line so that a potential higher than said low potential by a potential difference created by said second potential difference generating circuit is supplied to said fourth power supply line, a first switch means connected between said first and third power supply lines for short-circuiting between said first and third power supply lines when said first switch means is closed, a second switch means connected between said second and fourth power supply lines for short-circuiting between said second and fourth power supply lines when said second switch means is closed, and a control line connected to a control input of said first and second switch means to simultaneously on-off control said first and second switch means.
Claim 7
Dependent Claim
76 words
A semiconductor device claimed in claim 4 wherein said control circuit further includes a first series circuit composed of a third switch means and a first capacitor and connected between said third and fourth power supply lines, and a second series circuit composed of a fourth switch means and a second capacitor and connected between said third and fourth power supply lines, said third and fourth switch means means being on-off controlled complementarily to each other.
Claim 8
Dependent Claim
41 words
A semiconductor device claimed in claim 4 wherein said first and second switch means are maintained in an open condition in a standby condition of the semiconductor device, and in a closed condition in an operating condition of the semiconductor device.
Claim 9
Dependent Claim
212 words
A control circuit for a semiconductor device, including a first power supply line supplied with a high potential, a second power supply line supplied with a low potential, a third power supply line connected through a first potential difference generating circuit to said first power supply line so that a potential lower than said high potential by a potential difference created by said first potential difference generating circuit is supplied to said third power supply line, a fourth power supply line connected through a second potential difference generating circuit to said second power supply line so that a potential higher than said low potential by a potential difference created by said second potential difference generating circuit is supplied to said fourth power supply line, a first switch means connected between said first and third power supply lines for short-circuiting between said first and third power supply lines when said first switch means is closed, a second switch means connected between said second and fourth power supply lines for short-circuiting between said second and fourth power supply lines when said second switch means is closed, and a control line connected to a control input of said first and second switch means means to simultaneously on-off control said first and second switch means means.
Claim 10
Dependent Claim
212 words
A control circuit for a semiconductor device, including a first power supply line supplied with a high potential, a second power supply line supplied with a low potential, a third power supply line connected through a first potential difference generating circuit to said first power supply line so that a potential lower than said high potential by a potential difference created by said first potential difference generating circuit is supplied to said third power supply line, a fourth power supply line connected through a second potential difference generating circuit to said second power supply line so that a potential higher than said low potential by a potential difference created by said second potential difference generating circuit is supplied to said fourth power supply line, a first switch means connected between said first and third power supply lines for short-circuiting between said first and third power supply lines when said first switch means is closed, a second switch means connected between said second and fourth power supply lines for short-circuiting between said second and fourth power supply lines when said second switch means is closed, and a control line connected to a control input of said first and second switch means means to simultaneously on-off control said first and second switch means means.
Claim 11
Dependent Claim
72 words
A control circuit claimed in claim 7 further including a first series circuit composed of a third switch means and a first capacitor and connected between said third and fourth power supply lines, and a second series circuit composed of a fourth switch means and a second capacitor and connected between said third and fourth power supply lines, said third and fourth switch means means being on-off controlled complementarily to each other.
Claim 12
Dependent Claim
41 words
A control circuit claimed in claim 7 wherein said first and second switch means are maintained in an open condition in a standby condition of the semiconductor device, and in a closed condition in an operating condition of the semiconductor device.