US5706238A
Expired / Lapsed
US
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Self current limiting antifuse circuit
Assignee: Micron Technology Inc
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Filing: 1997-01-14
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Granted: 1998-01-06
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Expires: 2017-01-14
Abstract
Abstract An antifuse bank includes a bank of self-decoupling anti fuse circuits. The anti fuse circuits are programmed according to a pattern of address bits by blowing antifuses corresponding to bits of the address. The antifuses are blown by applying a high voltage across the antifuse. As each antifuse is blown, its resistance drops and current through the antifuse increases. The self-decoupling circuit detects the increased current flow and, when the anti fuse resistance is sufficiently low, limits current flow through the anti fuse. The antifuse thus does not load the high voltage source as other antifuses are blown.
Inventors
- 👤 Douglas J. Cutter
- 👤 Kurt D. Beigel
- 👤 Adrian E. Ong
- 👤 Fan Ho
- 👤 Patrick J. Mullarkey
- 👤 Dien S. Luong
- 👤 Brett Debenham
- 👤 Kim M. Pierce
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 04:02
CPC Classifications
G; G11; G11C; G11C17/00; G11C17/14; G11C17/18
Claims Analysis
Total Claims: 15
Claim 1
Independent Claim
158 words
A self-decoupling integrated antifuse circuit, comprising: a plurality of test nodes; a voltage source having an output operative to provide a selected voltage; a plurality of antifuses coupled between respective ones of the test nodes and the voltage source, each of the antifuses having an antifuse impedance each antifuse being configured to blow from a high resistance to a lower resistance in response to the selected voltage; a plurality of sense circuits, each sense circuit having a sense input coupled to a respective one of the test nodes and a sense output, each sense circuit being configured to provide a signal indicative of the antifuse impedance being outside of a selected range; and a plurality of isolation circuits each having a control input coupled to a respective one of the sense circuit outputs, each of the isolation circuits being configured to limit current flow through the respective antifuse in response to the signal indicative of the antifuse impedance.
Claim 2
Dependent Claim
158 words
A self-decoupling integrated antifuse circuit, comprising: a plurality of test nodes; a voltage source having an output operative to provide a selected voltage; a plurality of antifuses coupled between respective ones of the test nodes and the voltage source, each of the antifuses having an antifuse impedance each antifuse being configured to blow from a high resistance to a lower resistance in response to the selected voltage; a plurality of sense circuits, each sense circuit having a sense input coupled to a respective one of the test nodes and a sense output, each sense circuit being configured to provide a signal indicative of the antifuse impedance being outside of a selected range; and a plurality of isolation circuits each having a control input coupled to a respective one of the sense circuit outputs, each of the isolation circuits being configured to limit current flow through the respective antifuse in response to the signal indicative of the antifuse impedance.
Claim 3
Dependent Claim
43 words
The antifuse circuit of claim 1 wherein each of the sense circuits includes a reset input, each of the sense circuits being configured to terminate the respective signal indicative of the antifuse impedance in response to a reset signal at the reset input.
Claim 4
Dependent Claim
27 words
The antifuse circuit of claim 2 wherein each of the isolation circuits is responsive to the reset signal to provide a current path through the respective antifuse.
Claim 5
Dependent Claim
26 words
The antifuse circuit of claim 3 wherein each of the isolation circuits includes a pass transistor, wherein the gate of the transistor forms the control input.
Claim 6
Dependent Claim
210 words
A self-decoupling address detection circuit, comprising: a blowing voltage input; a latch circuit having a supply input coupled to a supply voltage, a set input, a latch output terminal and a latch control input terminal, wherein the latch circuit is responsive to switch from a first latch state in which the latch circuit provides a first latch signal at the latch output terminal to a second latch state in which the latch circuit provides a second latch signal at the latch output terminal in response to a selected voltage at the latch control input terminal; an antifuse coupled between the blowing voltage input and the latch control input terminal, the antifuse being operative to blow in response to a fuse blowing voltage applied across the antifuse; and a decoupling circuit between the latch control input terminal and a reference potential, the decoupling circuit having a decoupling input coupled to the latch output terminal, the decoupling circuit being configured to provide a current path from the latch control input terminal to the reference potential in response to the first latch signal at the decoupling input and to block current flow from the latch control input terminal to the reference potential in response to the second latch signal at the decoupling input.
Claim 7
Dependent Claim
210 words
A self-decoupling address detection circuit, comprising: a blowing voltage input; a latch circuit having a supply input coupled to a supply voltage, a set input, a latch output terminal and a latch control input terminal, wherein the latch circuit is responsive to switch from a first latch state in which the latch circuit provides a first latch signal at the latch output terminal to a second latch state in which the latch circuit provides a second latch signal at the latch output terminal in response to a selected voltage at the latch control input terminal; an antifuse coupled between the blowing voltage input and the latch control input terminal, the antifuse being operative to blow in response to a fuse blowing voltage applied across the antifuse; and a decoupling circuit between the latch control input terminal and a reference potential, the decoupling circuit having a decoupling input coupled to the latch output terminal, the decoupling circuit being configured to provide a current path from the latch control input terminal to the reference potential in response to the first latch signal at the decoupling input and to block current flow from the latch control input terminal to the reference potential in response to the second latch signal at the decoupling input.
Claim 8
Dependent Claim
30 words
The address detection circuit of claim 5 wherein the decoupling circuit includes a pass circuit coupled to block current flow through the decoupling circuit in response to the trigger voltage.
Claim 9
Dependent Claim
138 words
The address detection circuit of claim 5 wherein the latch circuit includes: a supply voltage input; a buffering circuit having a buffer input coupled to the latch control input terminal, the buffering circuit further including a buffer output coupled to the latch output terminal operative to provide a signal at the buffer output corresponding to the first latch state in response to a voltage other than the selected voltage of the buffer input and to provide a signal corresponding to the second latch state in response to the selected voltage at the buffer input; and a pull-up circuit having an input terminal coupled between the supply voltage input and the buffer input, the pull-up circuit being operative to provide couple the supply voltage input to the buffer input in response to a selected signal of the pull-up input.
Claim 10
Dependent Claim
54 words
The address detection circuit of claim 7 wherein the pull-up circuit includes: a set terminal coupled to the set input; an impedance element; and a first transistor serially coupled with the impedance element between the supply voltage input and the buffer input, the gate of the first transistor being coupled to the set terminal.
Claim 11
Dependent Claim
35 words
The address detection circuit of claim 8 wherein the pull-up circuit further includes a second transistor coupled in parallel with the first transistor, the gate of the second transistor being coupled to the buffer output.
Claim 12
Independent Claim
118 words
A method of programming selected antifuses in an antifuse bank including a plurality of antifuses, wherein each antifuse includes a first terminal and a second terminal, comprising the steps of: providing current paths from the first terminals to a reference voltage; applying a fuse blowing voltage to the second terminals of the selected antifuses; monitoring a voltage at a location along the current path of each of the selected antifuses while the fuse blowing voltage is applied to the selected antifuse; and in response to one of the monitored voltages falling within a selected voltage range, blocking the respective current path until all of the monitored voltages corresponding to the selected antifuses fall within the selected voltage range.
Claim 13
Independent Claim
118 words
A method of programming selected antifuses in an antifuse bank including a plurality of antifuses, wherein each antifuse includes a first terminal and a second terminal, comprising the steps of: providing current paths from the first terminals to a reference voltage; applying a fuse blowing voltage to the second terminals of the selected antifuses; monitoring a voltage at a location along the current path of each of the selected antifuses while the fuse blowing voltage is applied to the selected antifuse; and in response to one of the monitored voltages falling within a selected voltage range, blocking the respective current path until all of the monitored voltages corresponding to the selected antifuses fall within the selected voltage range.
Claim 14
Dependent Claim
98 words
The method of claim 10 wherein the antifuse bank includes a plurality of latches, each latch corresponding to a respective one of the antifuses and wherein the step of detecting a voltage at a location along the current path of each of the selected antifuses while the fuse blowing voltage is applied to the selected antifuse includes the steps of: setting the respective latch to produce an output signal of a first state; and switching the latch in response to the detected voltage falling within the selected voltage range to produce an output signal of a second state.
Claim 15
Dependent Claim
51 words
The method of claim 11 wherein the current path includes a switch and wherein the step of blocking the respective current path until all of the detected voltages fall within the selected voltage range includes the step of opening the switch in response to the output signal of the second state.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2001-01-05 | 2001-07-07 | 2002-01-06 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2005-01-05 | 2005-07-07 | 2006-01-06 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2009-01-05 | 2009-07-07 | 2010-01-06 | $7700.00 | Window Closed / Lapsed |