US5700740A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Prevention of corrosion of aluminum interconnects by removing corrosion-inducing species
Assignee: Taiwan Semiconductor Manufacturing Co TSMC Ltd
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Filing: 1996-03-25
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Granted: 1997-12-23
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Expires: 2016-03-25
Abstract
Abstract A method is described for the prevention of the corrosion of interconnection wirings made of aluminum or aluminum-copper alloys in semiconductor integrated circuits. The invention uses a weak solution of NH 4 OH to remove chlorine-containing residues that adhere to the sidewalls of the metal wirings patterned by reactive ion etching using chlorine-containing gaseous components, thus effectively quenching the chain reaction of aluminum electrochemical corrosion involving these chlorine-containing residues as an intermediary.
Inventors
- 👤 Chien-Feng Chen
- 👤 Huan Wen Wang
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 13:27
CPC Classifications
H; H10; H10P; H10P70/00; H10P70/20; H10P70/27; H10P70/273
Claims Analysis
Total Claims: 25
Claim 1
Independent Claim
139 words
A method of preventing corrosion of metal interconnection lines in an integrated circuit structure comprising: depositing an aluminum-copper alloy layer over a dielectric layer having a pattern of contact holes with a semiconductor substrate, coating a photoresist layer over the aluminum-copper layer exposing the photoresist through appropriate mask having desired pattern of metal lines, developing the photoresist to open up the negative image of the interconnection pattern, reactively etching the aluminum-copper alloy film through the photoresist openings in a plasma containing ions of chlorine and compounds of chlorides, dipping the semiconductor substrate wafer in a solution immediately after the reactive ion etching, and rinsing the wafer with deionized water, and stripping the photoresist either by using a solvent, or by ashing in an oxygen-containing plasma, rinsing with deionized water, rinsing with a solvent, and rinsing with deionized water again.
Claim 2
Independent Claim
139 words
A method of preventing corrosion of metal interconnection lines in an integrated circuit structure comprising: depositing an aluminum-copper alloy layer over a dielectric layer having a pattern of contact holes with a semiconductor substrate, coating a photoresist layer over the aluminum-copper layer exposing the photoresist through appropriate mask having desired pattern of metal lines, developing the photoresist to open up the negative image of the interconnection pattern, reactively etching the aluminum-copper alloy film through the photoresist openings in a plasma containing ions of chlorine and compounds of chlorides, dipping the semiconductor substrate wafer in a solution immediately after the reactive ion etching, and rinsing the wafer with deionized water, and stripping the photoresist either by using a solvent, or by ashing in an oxygen-containing plasma, rinsing with deionized water, rinsing with a solvent, and rinsing with deionized water again.
Claim 3
Dependent Claim
11 words
The method of claim 1 wherein said semiconductor substrate is silicon.
Claim 4
Dependent Claim
14 words
The method of claim 1 wherein said dielectric layer is thermally grown silicon dioxide.
Claim 5
Dependent Claim
27 words
The method of claim 1 wherein said dielectric layer is a composite of a thermally grown silicon dioxide film and a chemically vapor deposited silicon dioxide film.
Claim 6
Dependent Claim
27 words
The method of claim 1 wherein said dielectric layer is a composite of a thermally grown silicon dioxide film and a chemically vapor deposited silicon nitride film.
Claim 7
Dependent Claim
17 words
The method of claim 1 wherein said aluminum-copper alloy layer is in the form of a film.
Claim 8
Dependent Claim
13 words
The method of claim 1 wherein said aluminum-copper alloy is formed by sputtering.
Claim 9
Dependent Claim
13 words
The method of claim 1 wherein said aluminum-copper alloy includes a silicon component.
Claim 10
Dependent Claim
16 words
The method of claim 1 wherein said aluminum-copper alloy contains no more than 4% of copper.
Claim 11
Dependent Claim
20 words
The method of claim 1 wherein the said NH 4 OH solution has a pH value of 8 to 11.
Claim 12
Independent Claim
256 words
A method of preventing corrosion of metal wirings in multilevel interconnection in an integrated circuit structure comprising: depositing a dielectric film over a semiconductor substrate having first-level metal lines formed thereon, coating a photoresist over the dielectric film, exposing the photoresist through an appropriate mask having desired pattern of contact holes through to the first-level metal lines, developing the photoresist to open up via hole pattern in the photoresist, reactively ion-etching the dielectric to open up contact holes in the dielectric layer in a plasma containing Ar (200 sccm±10%), CF 4 (20 sccm±10%), CHF 3 (20 sccm±10%), N 2 (20 sccm±10%), and SF 6 (20 sccm±10%), stripping the photoresist either by using a suitable solvent or by ashing in an oxygen containing plasma, depositing a second-level aluminum-copper alloy film over the dielectric layer having a pattern of via holes for connection with the first-level metal lines, coating a photoresist layer over the second-level aluminum-copper film, exposing the photoresist through appropriate mask having desired pattern of metal lines, developing the photoresist to open up the negative image of the interconnection pattern, reactively etching the second-level aluminum-copper film through the photoresist openings in a plasma containing ions of chlorine and compounds of chlorides, dipping the semiconductor substrate wafer in a dilute NH 4 OH solution immediately after the reactive ion etching, and rinsing the wafer with deionized water, and stripping the photoresist either by using a solvent or by ashing in an oxygen-containing plasma, rinsing with deionized water, rinsing with a solvent, and rinsing with deionized water again.
Claim 13
Independent Claim
256 words
A method of preventing corrosion of metal wirings in multilevel interconnection in an integrated circuit structure comprising: depositing a dielectric film over a semiconductor substrate having first-level metal lines formed thereon, coating a photoresist over the dielectric film, exposing the photoresist through an appropriate mask having desired pattern of contact holes through to the first-level metal lines, developing the photoresist to open up via hole pattern in the photoresist, reactively ion-etching the dielectric to open up contact holes in the dielectric layer in a plasma containing Ar (200 sccm±10%), CF 4 (20 sccm±10%), CHF 3 (20 sccm±10%), N 2 (20 sccm±10%), and SF 6 (20 sccm±10%), stripping the photoresist either by using a suitable solvent or by ashing in an oxygen containing plasma, depositing a second-level aluminum-copper alloy film over the dielectric layer having a pattern of via holes for connection with the first-level metal lines, coating a photoresist layer over the second-level aluminum-copper film, exposing the photoresist through appropriate mask having desired pattern of metal lines, developing the photoresist to open up the negative image of the interconnection pattern, reactively etching the second-level aluminum-copper film through the photoresist openings in a plasma containing ions of chlorine and compounds of chlorides, dipping the semiconductor substrate wafer in a dilute NH 4 OH solution immediately after the reactive ion etching, and rinsing the wafer with deionized water, and stripping the photoresist either by using a solvent or by ashing in an oxygen-containing plasma, rinsing with deionized water, rinsing with a solvent, and rinsing with deionized water again.
Claim 14
Dependent Claim
11 words
The method of claim 11 wherein said semiconductor substrate is silicon.
Claim 15
Dependent Claim
14 words
The method of claim 11 wherein said dielectric layer is thermally grown silicon dioxide.
Claim 16
Dependent Claim
27 words
The method of claim 11 wherein said dielectric layer is a composite of a thermally grown silicon dioxide film and a chemically vapor deposited silicon dioxide film.
Claim 17
Dependent Claim
27 words
The method of claim 11 wherein said dielectric layer is a composite of a thermally grown silicon dioxide film and a chemically vapor deposited silicon nitride film.
Claim 18
Dependent Claim
14 words
The method of claim 11 wherein said second level dielectric layer is silicon dioxide.
Claim 19
Dependent Claim
15 words
The method of claim 11 wherein said second level dielectric layer is formed by sputtering.
Claim 20
Dependent Claim
17 words
The method of claim 11 wherein said second level dielectric layer is formed by chemical vapor deposition.
Claim 21
Dependent Claim
19 words
The method of claim 11 wherein said second level aluminum-copper alloy layer is in the form of a film.
Claim 22
Dependent Claim
15 words
The method of claim 11 wherein said second level aluminum-copper alloy is formed by sputtering.
Claim 23
Dependent Claim
15 words
The method of claim 11 wherein said second level aluminum-copper alloy includes a silicon component.
Claim 24
Dependent Claim
18 words
The method of claim 11 wherein said second level aluminum-copper alloy contains no more than 4% of copper.
Claim 25
Dependent Claim
21 words
The method of claim 11 wherein the said NH 4 OH solution has a pH valve of about 8 to 11.
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